GB0114507D0 - An apparatus and method to transport, inspect and measure objects and surface details at high speeds - Google Patents

An apparatus and method to transport, inspect and measure objects and surface details at high speeds

Info

Publication number
GB0114507D0
GB0114507D0 GBGB0114507.7A GB0114507A GB0114507D0 GB 0114507 D0 GB0114507 D0 GB 0114507D0 GB 0114507 A GB0114507 A GB 0114507A GB 0114507 D0 GB0114507 D0 GB 0114507D0
Authority
GB
United Kingdom
Prior art keywords
inspect
transport
high speeds
surface details
measure objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB0114507.7A
Other versions
GB2361313A (en
GB2361313B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rahmonic Resources Pte Ltd
Original Assignee
Rahmonic Resources Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rahmonic Resources Pte Ltd filed Critical Rahmonic Resources Pte Ltd
Publication of GB0114507D0 publication Critical patent/GB0114507D0/en
Publication of GB2361313A publication Critical patent/GB2361313A/en
Application granted granted Critical
Publication of GB2361313B publication Critical patent/GB2361313B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GB0114507A 1998-11-30 1999-11-30 An apparatus and method to transport, inspect and measure objects and surface details at high speeds Expired - Fee Related GB2361313B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG1998004084A SG76564A1 (en) 1998-11-30 1998-11-30 An apparatus and method to transport inspect and measure objects and surface details at high speeds
PCT/SG1999/000130 WO2000033027A1 (en) 1998-11-30 1999-11-30 An apparatus and method to transport, inspect and measure objects and surface details at high speeds

Publications (3)

Publication Number Publication Date
GB0114507D0 true GB0114507D0 (en) 2001-08-08
GB2361313A GB2361313A (en) 2001-10-17
GB2361313B GB2361313B (en) 2003-06-11

Family

ID=20430138

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0114507A Expired - Fee Related GB2361313B (en) 1998-11-30 1999-11-30 An apparatus and method to transport, inspect and measure objects and surface details at high speeds

Country Status (5)

Country Link
CN (1) CN1367872A (en)
AU (1) AU2019300A (en)
GB (1) GB2361313B (en)
SG (1) SG76564A1 (en)
WO (1) WO2000033027A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111965215A (en) * 2020-08-13 2020-11-20 长江存储科技有限责任公司 Packaged chip defect detection device and method thereof

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6532063B1 (en) * 2000-11-10 2003-03-11 Semiconductor Technologies & Instruments 3-D lead inspection
JP4228778B2 (en) * 2003-05-21 2009-02-25 ウシオ電機株式会社 Pattern inspection device
JP2004361329A (en) * 2003-06-06 2004-12-24 Ushio Inc Method and device for inspecting pattern
WO2004113823A2 (en) * 2003-06-18 2004-12-29 Amfit, Inc. Method and system for capturing and supporting 3-d contour
US7289646B2 (en) * 2003-06-30 2007-10-30 Weyerhaeuser Company Method and system for simultaneously imaging multiple views of a plant embryo
CN100554952C (en) * 2005-08-03 2009-10-28 鸿劲科技股份有限公司 Integrated circuit detector
CN101936916A (en) * 2009-07-02 2011-01-05 法国圣-戈班玻璃公司 Equipment for detecting defects of separated low-rigidity transparent or translucent body and method thereof
US9485473B2 (en) * 2012-09-13 2016-11-01 Alstom Technology Ltd Method and system for determining quality of tubes

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06265323A (en) * 1993-03-16 1994-09-20 Hitachi Ltd Outer shape inspection device
JPH085568A (en) * 1994-06-15 1996-01-12 Hitachi Ltd Lead inspection apparatus
JPH10153413A (en) * 1996-11-21 1998-06-09 M C Electron Kk Appearance and dimension inspection device for ic lead

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111965215A (en) * 2020-08-13 2020-11-20 长江存储科技有限责任公司 Packaged chip defect detection device and method thereof

Also Published As

Publication number Publication date
WO2000033027A9 (en) 2001-11-08
GB2361313A (en) 2001-10-17
AU2019300A (en) 2000-06-19
CN1367872A (en) 2002-09-04
WO2000033027A1 (en) 2000-06-08
SG76564A1 (en) 2000-11-21
GB2361313B (en) 2003-06-11

Similar Documents

Publication Publication Date Title
GB2362006B (en) Method and apparatus for analyzing measurements
GB9805861D0 (en) A method and an apparatus for inspecting articles
EP1078247A4 (en) Improved apparatus and methods for carrying out electrochemiluminescence test measurements
GB2359720B (en) An apparatus and method for detecting impermissible articles in luggage
EP1081490A4 (en) Method and apparatus for electrochemical measurement using statistical technique
EP1014437B8 (en) In-situ measurement method and apparatus for semiconductor processing
IL142407A0 (en) Method and apparatus for testing web transactions
EP1133741A4 (en) Method and apparatus for fast and comprehensive dbms analysis
EP0634649A3 (en) Method and apparatus for thermal conductivity measurements.
GB0002178D0 (en) Method and apparatus for measuring particle-size distrbution
IL140145A (en) Non-contact test method and apparatus
EP1068506A4 (en) Apparatus and method for testing lubricity
HU9900844D0 (en) Method and apparatus for high speed article processing
IL146869A0 (en) Workpiece inspection apparatus and inspection method
GB2361313B (en) An apparatus and method to transport, inspect and measure objects and surface details at high speeds
GB2333156B (en) Apparatus and method for detecting an interface
SG65050A1 (en) Apparatus and method for surface inspection
HUP0002014A3 (en) Method for level measurement of containers and an apparatus for carrying out the method
GB0100248D0 (en) Method and apparatus for inspecting an object
IL125228A0 (en) Method and apparatus for measuring dimensions of objects
GB9820915D0 (en) Contents measuring apparatus and method
GB0024678D0 (en) Method and apparatus for measuring opposite surfaces
GB2346449B (en) Method and apparatus for measuring engine speed
AU5749699A (en) Method and apparatus for measuring
GB2321708B (en) Apparatus and method for measuring pedalling efficiency

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20031130