FR3118268B1 - Mémoire sécurisée - Google Patents
Mémoire sécurisée Download PDFInfo
- Publication number
- FR3118268B1 FR3118268B1 FR2014086A FR2014086A FR3118268B1 FR 3118268 B1 FR3118268 B1 FR 3118268B1 FR 2014086 A FR2014086 A FR 2014086A FR 2014086 A FR2014086 A FR 2014086A FR 3118268 B1 FR3118268 B1 FR 3118268B1
- Authority
- FR
- France
- Prior art keywords
- column
- binary data
- bit
- memory cells
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/78—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data
- G06F21/79—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data in semiconductor storage media, e.g. directly-addressable memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/106—Data output latches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
- G11C7/1087—Data input latches
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Software Systems (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Static Random-Access Memory (AREA)
- Storage Device Security (AREA)
Abstract
Mémoire sécurisée La présente description concerne une mémoire (40) comprenant des cellules mémoire (14) agencées en rangées et en colonnes, au moins une ligne de bits (20, 22), pour chaque colonne, reliée aux cellules mémoire de la colonne, et un circuit de lecture/écriture (24), reliés aux lignes de bits, configuré pour recevoir, pour chaque colonne, une donnée binaire (Di) à mémoriser dans l'une des cellules mémoire de la colonne, le circuit de lecture/écriture comprenant, pour chaque colonne, un verrou (46) configuré pour stocker un bit d'une clé, et un circuit de cryptage configuré pour crypter la donnée binaire reçue avec le bit de la clé pour fournir une donnée binaire crypté, le circuit de lecture/écriture étant configuré pour commander la ligne de bits pour mémoriser la donnée binaire cryptée. Figure pour l'abrégé : Fig. 4
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2014086A FR3118268B1 (fr) | 2020-12-23 | 2020-12-23 | Mémoire sécurisée |
US17/556,039 US11978530B2 (en) | 2020-12-23 | 2021-12-20 | Secure memory |
CN202111590551.4A CN114664341A (zh) | 2020-12-23 | 2021-12-23 | 安全存储器 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2014086 | 2020-12-23 | ||
FR2014086A FR3118268B1 (fr) | 2020-12-23 | 2020-12-23 | Mémoire sécurisée |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3118268A1 FR3118268A1 (fr) | 2022-06-24 |
FR3118268B1 true FR3118268B1 (fr) | 2024-01-12 |
Family
ID=76034674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR2014086A Active FR3118268B1 (fr) | 2020-12-23 | 2020-12-23 | Mémoire sécurisée |
Country Status (3)
Country | Link |
---|---|
US (1) | US11978530B2 (fr) |
CN (1) | CN114664341A (fr) |
FR (1) | FR3118268B1 (fr) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100201396B1 (ko) * | 1996-07-20 | 1999-06-15 | 구본준 | 이피롬의 비화코드 해독 방지회로 |
DE10121837C1 (de) * | 2001-05-04 | 2002-12-05 | Infineon Technologies Ag | Speicherschaltung mit mehreren Speicherbereichen |
US6996692B2 (en) * | 2002-04-17 | 2006-02-07 | Matsushita Electric Industrial Co., Ltd. | Nonvolatile semiconductor memory device and method for providing security for the same |
KR20140020057A (ko) * | 2012-08-07 | 2014-02-18 | 삼성전자주식회사 | 키 제어 로직을 포함하는 플래시 메모리 장치 및 그것의 암호화 키 저장 방법 |
US9116796B2 (en) * | 2012-11-09 | 2015-08-25 | Sandisk Technologies Inc. | Key-value addressed storage drive using NAND flash based content addressable memory |
JP7109992B2 (ja) * | 2018-05-22 | 2022-08-01 | キオクシア株式会社 | メモリシステムおよび制御方法 |
KR102124064B1 (ko) * | 2018-07-17 | 2020-06-17 | 한국과학기술연구원 | 플래시 메모리 시스템 및 그것의 양자화 신호 생성 방법 |
US11514174B2 (en) * | 2019-01-23 | 2022-11-29 | Micron Technology, Inc. | Memory devices with cryptographic components |
US11081168B2 (en) * | 2019-05-23 | 2021-08-03 | Hefei Reliance Memory Limited | Mixed digital-analog memory devices and circuits for secure storage and computing |
DE112019007421T5 (de) * | 2019-05-31 | 2022-02-24 | Micron Technology, Inc. | Speichergerät mit sicherer testmoduseingabe |
-
2020
- 2020-12-23 FR FR2014086A patent/FR3118268B1/fr active Active
-
2021
- 2021-12-20 US US17/556,039 patent/US11978530B2/en active Active
- 2021-12-23 CN CN202111590551.4A patent/CN114664341A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
CN114664341A (zh) | 2022-06-24 |
US20220199133A1 (en) | 2022-06-23 |
US11978530B2 (en) | 2024-05-07 |
FR3118268A1 (fr) | 2022-06-24 |
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Owner name: STMICROELECTRONICS FRANCE, FR Effective date: 20240708 |
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