FR3082932B1 - Procede de mesure profilometrique - Google Patents

Procede de mesure profilometrique Download PDF

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Publication number
FR3082932B1
FR3082932B1 FR1855658A FR1855658A FR3082932B1 FR 3082932 B1 FR3082932 B1 FR 3082932B1 FR 1855658 A FR1855658 A FR 1855658A FR 1855658 A FR1855658 A FR 1855658A FR 3082932 B1 FR3082932 B1 FR 3082932B1
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FR
France
Prior art keywords
measuring
point cloud
junction
measurement process
identifying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1855658A
Other languages
English (en)
Other versions
FR3082932A1 (fr
Inventor
Morgan Ferrari
Daniel Chauveau
Antoine Bastien
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut de Soudure
Original Assignee
Institut de Soudure
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut de Soudure filed Critical Institut de Soudure
Priority to FR1855658A priority Critical patent/FR3082932B1/fr
Publication of FR3082932A1 publication Critical patent/FR3082932A1/fr
Application granted granted Critical
Publication of FR3082932B1 publication Critical patent/FR3082932B1/fr
Active legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
    • B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
    • B23K31/125—Weld quality monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Mechanical Engineering (AREA)
  • Quality & Reliability (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Procédé de mesure d'une jonction (23) d'une première et une deuxième surface (21 ; 22), comprenant les étapes de : - définir une ligne de mesure (25) ; - mesurer une distance séparant des points de mesure (26) de la première surface (21) ou de la deuxième surface (22) et un plan de référence (12.1) ; - établir un nuage de points (30) ; - définir un paramètre géométrique de la jonction (23) à mesurer ; - identifier une première extrémité (30.1) du nuage de points (30) ; - identifier une deuxième extrémité (30.2) du nuage de points (30) ; - déterminer le point extremum (33) du nuage de points (30) ; - procéder à une analyse du nuage de points (30) en exploitant les résultats des étapes précédentes de manière à obtenir le paramètre géométrique de la jonction (23) à mesurer. Dispositif de mesure mettant en œuvre le procédé.
FR1855658A 2018-06-25 2018-06-25 Procede de mesure profilometrique Active FR3082932B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1855658A FR3082932B1 (fr) 2018-06-25 2018-06-25 Procede de mesure profilometrique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1855658 2018-06-25
FR1855658A FR3082932B1 (fr) 2018-06-25 2018-06-25 Procede de mesure profilometrique

Publications (2)

Publication Number Publication Date
FR3082932A1 FR3082932A1 (fr) 2019-12-27
FR3082932B1 true FR3082932B1 (fr) 2020-11-20

Family

ID=65494177

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1855658A Active FR3082932B1 (fr) 2018-06-25 2018-06-25 Procede de mesure profilometrique

Country Status (1)

Country Link
FR (1) FR3082932B1 (fr)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3123146B2 (ja) * 1991-09-11 2001-01-09 トヨタ自動車株式会社 溶接ビードの品質検査装置
JP3573222B2 (ja) * 1994-10-11 2004-10-06 株式会社小松製作所 突き合わせ溶接のワーク突き合わせ位置検出方法
JP5365504B2 (ja) * 2009-03-30 2013-12-11 トヨタ自動車株式会社 溶接ビードの検査装置、検査方法、及び、検査用プログラム
JP5578005B2 (ja) * 2010-10-08 2014-08-27 トヨタ自動車株式会社 溶接ビードの検査装置、検査方法、及び、検査用プログラム
JP2012184996A (ja) * 2011-03-04 2012-09-27 Mitsui Eng & Shipbuild Co Ltd 溶接形状評価装置及びその評価方法

Also Published As

Publication number Publication date
FR3082932A1 (fr) 2019-12-27

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