FR3066310B1 - Cellule memoire de type ram resistive - Google Patents

Cellule memoire de type ram resistive Download PDF

Info

Publication number
FR3066310B1
FR3066310B1 FR1754198A FR1754198A FR3066310B1 FR 3066310 B1 FR3066310 B1 FR 3066310B1 FR 1754198 A FR1754198 A FR 1754198A FR 1754198 A FR1754198 A FR 1754198A FR 3066310 B1 FR3066310 B1 FR 3066310B1
Authority
FR
France
Prior art keywords
memory cell
resistive ram
ram memory
selection transistor
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1754198A
Other languages
English (en)
Other versions
FR3066310A1 (fr
Inventor
Philippe Boivin
Simon Jeannot
Olivier Weber
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Priority to FR1754198A priority Critical patent/FR3066310B1/fr
Priority to US15/978,003 priority patent/US10482957B2/en
Publication of FR3066310A1 publication Critical patent/FR3066310A1/fr
Application granted granted Critical
Publication of FR3066310B1 publication Critical patent/FR3066310B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/003Cell access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021Auxiliary circuits
    • G11C13/0023Address circuits or decoders
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B63/00Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H10B63/30Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having three or more electrodes, e.g. transistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20Multistable switching devices, e.g. memristors
    • H10N70/24Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/821Device geometry
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/821Device geometry
    • H10N70/826Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • H10N70/8265Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices on sidewalls of dielectric structures, e.g. mesa or cup type devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/881Switching materials
    • H10N70/883Oxides or nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices without a potential-jump barrier or surface barrier, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801Constructional details of multistable switching devices
    • H10N70/881Switching materials
    • H10N70/883Oxides or nitrides
    • H10N70/8833Binary metal oxides, e.g. TaOx
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2213/00Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70Resistive array aspects
    • G11C2213/79Array wherein the access device being a transistor

Abstract

L'invention concerne une cellule mémoire comprenant un point mémoire (20, 21) de type RAM résistive et un transistor de sélection (22, 23), dans laquelle le point mémoire est disposé sur un flanc du transistor de sélection.
FR1754198A 2017-05-12 2017-05-12 Cellule memoire de type ram resistive Active FR3066310B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1754198A FR3066310B1 (fr) 2017-05-12 2017-05-12 Cellule memoire de type ram resistive
US15/978,003 US10482957B2 (en) 2017-05-12 2018-05-11 Resistive RAM memory cell

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1754198 2017-05-12
FR1754198A FR3066310B1 (fr) 2017-05-12 2017-05-12 Cellule memoire de type ram resistive

Publications (2)

Publication Number Publication Date
FR3066310A1 FR3066310A1 (fr) 2018-11-16
FR3066310B1 true FR3066310B1 (fr) 2020-01-24

Family

ID=59649849

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1754198A Active FR3066310B1 (fr) 2017-05-12 2017-05-12 Cellule memoire de type ram resistive

Country Status (2)

Country Link
US (1) US10482957B2 (fr)
FR (1) FR3066310B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11663455B2 (en) * 2020-02-12 2023-05-30 Ememory Technology Inc. Resistive random-access memory cell and associated cell array structure
US20220199622A1 (en) * 2020-12-18 2022-06-23 Ememory Technology Inc. Resistive memory cell and associated cell array structure

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0982912A (ja) 1995-09-13 1997-03-28 Toshiba Corp 半導体記憶装置及びその製造方法
US7755076B2 (en) * 2007-04-17 2010-07-13 Macronix International Co., Ltd. 4F2 self align side wall active phase change memory
JP2010251529A (ja) * 2009-04-16 2010-11-04 Sony Corp 半導体記憶装置およびその製造方法
US8698118B2 (en) * 2012-02-29 2014-04-15 Globalfoundries Singapore Pte Ltd Compact RRAM device and methods of making same
FR3038132B1 (fr) 2015-06-23 2017-08-11 St Microelectronics Crolles 2 Sas Cellule memoire resistive ayant une structure compacte
FR3038133B1 (fr) * 2015-06-23 2017-08-25 St Microelectronics Crolles 2 Sas Cellule memoire a changement de phase ayant une structure compacte

Also Published As

Publication number Publication date
US20180330780A1 (en) 2018-11-15
FR3066310A1 (fr) 2018-11-16
US10482957B2 (en) 2019-11-19

Similar Documents

Publication Publication Date Title
MY193324A (en) Method for controlling display, storage medium, and electronic device
EP2851787A3 (fr) Microprocesseur reconfigurable dynamiquement
FR3066310B1 (fr) Cellule memoire de type ram resistive
SG10201805233PA (en) Semiconductor Device Including Gates
FR3053834B1 (fr) Structure de transistor
AR112000A1 (es) Detección no intrusiva de ubicación intravehicular de usuario
FR3041234B1 (fr) Appareil de determination d'un ou plusieurs parametres anatomiques faciaux d'un sujet
FR3048809B1 (fr) Cellule memoire sram comprenant un n-tfet et un p-tfet
EP3289967A3 (fr) Terminal de bande de santé
County Yavapai County
Jones et al. Working memory and interference control in verbal analogy
刘晓敏 A Study on Self and Others in the Japanese History Textbooks of the 1980-90
李楷文 An Analysis Causes of Tess's Tragedy in Tess of the D'Urbervilles
JP2019024644A5 (fr)
方莉 Longman Welcome to English 5A Chapter 6 Part C Learn to read
RU2015100914A (ru) Способ оценки активности генерализованного пародонтита
FR3077701B1 (fr) Architecture de memoire d'un dispositif de communication en champ proche
Al-Nasrawi et al. Modelling the future eco-geomorphological change scenarios of coastal ecosystems in southeastern Australia for sustainability assessment using GIS
Kissoon Can Foreign Direct Investment Aid Industrialization in Developing Countries?
陈柏润 Utterance Meaning Analysis in Movie Translation: A Case Study on Sherlock Holmes
李冠杰 An Analysis on< Almost Transparent Blue> According to the Death Instinct Theory
Ebata Policy interventions and smallholder market linkage: Case study from Nicaragua
PL123753U1 (pl) Długi wahacz
van Nes Interclausal Relations in the Corpus Paulinum
裴亚生 Great buildings

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20181116

PLFP Fee payment

Year of fee payment: 3

PLFP Fee payment

Year of fee payment: 4

PLFP Fee payment

Year of fee payment: 5

PLFP Fee payment

Year of fee payment: 6

PLFP Fee payment

Year of fee payment: 7

PLFP Fee payment

Year of fee payment: 8