FR3013122B1 - Procede et dispositif d'extraction d'une forme d'onde a basse frequence d'un composant electro-optique - Google Patents
Procede et dispositif d'extraction d'une forme d'onde a basse frequence d'un composant electro-optiqueInfo
- Publication number
- FR3013122B1 FR3013122B1 FR1361015A FR1361015A FR3013122B1 FR 3013122 B1 FR3013122 B1 FR 3013122B1 FR 1361015 A FR1361015 A FR 1361015A FR 1361015 A FR1361015 A FR 1361015A FR 3013122 B1 FR3013122 B1 FR 3013122B1
- Authority
- FR
- France
- Prior art keywords
- frequency
- electro
- extracting
- fopt
- activity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
- G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31728—Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
L'invention concerne procédé et un dispositif d'extraction d'une forme d'onde d'une activité se produisant dans un composant (11) électro-optique dans une bande de fréquence Δf0 au moins pour partie inférieure à la bande passante Δf1 du traitement électrique traitant un rayonnement (23) optique réfléchi par ce composant. Le rayonnement optique réfléchi est formé d'un rayonnement de porteuse, d'intensité périodique sur une fréquence fopt, modulé par des variations induites par ladite activité. Chaque signal (24) électrique de détection comprend une porteuse périodique de fréquence f1 correspondant à fopt, modulée par un signal de modulation représentatif de ladite activité, fopt étant choisie de sorte que l'une au moins des bandes de fréquence f1 - Δf0 et f1+Δf0 soit contenue dans Afl. Une démodulation du signal (24) électrique de détection fournit un signal représentatif de la forme d'onde.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1361015A FR3013122B1 (fr) | 2013-11-12 | 2013-11-12 | Procede et dispositif d'extraction d'une forme d'onde a basse frequence d'un composant electro-optique |
PCT/FR2014/052864 WO2015071582A1 (fr) | 2013-11-12 | 2014-11-07 | Procédé et dispositif d'extraction d'une forme d'onde à basse fréquence d'un composant électro-optique |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1361015A FR3013122B1 (fr) | 2013-11-12 | 2013-11-12 | Procede et dispositif d'extraction d'une forme d'onde a basse frequence d'un composant electro-optique |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3013122A1 FR3013122A1 (fr) | 2015-05-15 |
FR3013122B1 true FR3013122B1 (fr) | 2017-12-08 |
Family
ID=50489169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1361015A Active FR3013122B1 (fr) | 2013-11-12 | 2013-11-12 | Procede et dispositif d'extraction d'une forme d'onde a basse frequence d'un composant electro-optique |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR3013122B1 (fr) |
WO (1) | WO2015071582A1 (fr) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5164664A (en) * | 1990-10-09 | 1992-11-17 | Siemens Aktiengesellschaft | Method for the optical measurement of electrical potentials |
JP3500216B2 (ja) * | 1995-02-07 | 2004-02-23 | 浜松ホトニクス株式会社 | 電圧測定装置 |
US5905577A (en) | 1997-03-15 | 1999-05-18 | Schlumberger Technologies, Inc. | Dual-laser voltage probing of IC's |
JPH11316245A (ja) | 1998-05-01 | 1999-11-16 | Ando Electric Co Ltd | 電気光学サンプリングオシロスコープ |
JP3680678B2 (ja) * | 2000-02-15 | 2005-08-10 | スズキ株式会社 | 振動測定方法及び振動数測定装置 |
JP3660997B2 (ja) * | 2002-11-26 | 2005-06-15 | 独立行政法人情報通信研究機構 | 3次元電界分布測定方法および3次元電界分布測定装置 |
US7450245B2 (en) * | 2005-06-29 | 2008-11-11 | Dcg Systems, Inc. | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
US7755752B1 (en) * | 2008-04-07 | 2010-07-13 | Kla-Tencor Corporation | Combined modulated optical reflectance and photoreflectance system |
US20100117667A1 (en) * | 2008-11-07 | 2010-05-13 | Lo William K | Method and means for optical detection of internal-node signals in an integrated circuit device |
CN102472786B (zh) * | 2009-07-10 | 2014-09-03 | 日本电气株式会社 | 电磁场测量设备和电磁场测量方法 |
-
2013
- 2013-11-12 FR FR1361015A patent/FR3013122B1/fr active Active
-
2014
- 2014-11-07 WO PCT/FR2014/052864 patent/WO2015071582A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
FR3013122A1 (fr) | 2015-05-15 |
WO2015071582A1 (fr) | 2015-05-21 |
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