FR3004582B1 - Systeme et procede d'inspection optique de circuits electroniques - Google Patents
Systeme et procede d'inspection optique de circuits electroniquesInfo
- Publication number
- FR3004582B1 FR3004582B1 FR1353275A FR1353275A FR3004582B1 FR 3004582 B1 FR3004582 B1 FR 3004582B1 FR 1353275 A FR1353275 A FR 1353275A FR 1353275 A FR1353275 A FR 1353275A FR 3004582 B1 FR3004582 B1 FR 3004582B1
- Authority
- FR
- France
- Prior art keywords
- electronic circuits
- optically inspecting
- inspecting electronic
- optically
- circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Operations Research (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1353275A FR3004582B1 (fr) | 2013-04-11 | 2013-04-11 | Systeme et procede d'inspection optique de circuits electroniques |
PCT/FR2014/050853 WO2014167248A1 (fr) | 2013-04-11 | 2014-04-09 | Systeme et procede d'inspection optique de circuits electroniques |
EP14720669.2A EP2984913A1 (fr) | 2013-04-11 | 2014-04-09 | Systeme et procede d'inspection optique de circuits electroniques |
KR1020157030835A KR20150140704A (ko) | 2013-04-11 | 2014-04-09 | 전자 회로의 광학 검사 시스템 및 방법 |
US14/783,491 US20160054237A1 (en) | 2013-04-11 | 2014-04-09 | System and method for optical inspection of electronic circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1353275A FR3004582B1 (fr) | 2013-04-11 | 2013-04-11 | Systeme et procede d'inspection optique de circuits electroniques |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3004582A1 FR3004582A1 (fr) | 2014-10-17 |
FR3004582B1 true FR3004582B1 (fr) | 2015-04-10 |
Family
ID=48856819
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1353275A Active FR3004582B1 (fr) | 2013-04-11 | 2013-04-11 | Systeme et procede d'inspection optique de circuits electroniques |
Country Status (5)
Country | Link |
---|---|
US (1) | US20160054237A1 (fr) |
EP (1) | EP2984913A1 (fr) |
KR (1) | KR20150140704A (fr) |
FR (1) | FR3004582B1 (fr) |
WO (1) | WO2014167248A1 (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3041111B1 (fr) * | 2015-09-15 | 2017-09-15 | Vit | Mire d'etalonnage ou de test |
CN105509663B (zh) * | 2016-02-17 | 2019-12-27 | 京东方光科技有限公司 | 一种背光源平整度检测系统及检测方法 |
FR3059423B1 (fr) * | 2016-11-29 | 2020-05-29 | Vit | Systeme et procede de positionnement et d'inspection optique d'un objet |
KR102693683B1 (ko) * | 2020-10-05 | 2024-08-12 | 야마하하쓰도키 가부시키가이샤 | 기판 작업 장치 |
DE202021100731U1 (de) * | 2021-02-15 | 2022-05-17 | QUISS Qualitäts-Inspektionssysteme und Service GmbH | Vorrichtung und System zur kontrastreichen Erfassung eines Prüfzeichens auf Dosen mittels Wärmestrahlung |
CN113075232A (zh) * | 2021-03-31 | 2021-07-06 | 深圳中科飞测科技股份有限公司 | 一种检测设备及检测方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1353275A (fr) | 1963-04-01 | 1964-02-21 | Nuclear Power Plant Co Ltd | Caisson étanche en béton |
JP2001153640A (ja) * | 1999-11-29 | 2001-06-08 | Anritsu Corp | プリント基板検査装置 |
JP3729156B2 (ja) * | 2002-06-07 | 2005-12-21 | 株式会社日立製作所 | パターン欠陥検出方法およびその装置 |
JP4224268B2 (ja) * | 2002-08-29 | 2009-02-12 | 富士機械製造株式会社 | 電子回路部品装着機、ならびにそれの装着位置精度検査方法および装置 |
WO2005107354A1 (fr) * | 2004-04-30 | 2005-11-10 | Fuji Machine Mfg. Co., Ltd. | Dispositif supportant une carte à circuit imprimé |
JP4654022B2 (ja) * | 2004-12-24 | 2011-03-16 | 株式会社サキコーポレーション | 基板の外観検査装置 |
JP2007311711A (ja) * | 2006-05-22 | 2007-11-29 | Anritsu Corp | 基板バックアップ装置、該装置を備えた印刷半田検査装置及び方法 |
EP2060907A1 (fr) * | 2006-08-28 | 2009-05-20 | I-Pulse Kabushiki Kaisha | Dispositif et procédé d'inspection de l'apparence d'une planche |
FR2963144B1 (fr) * | 2010-07-26 | 2012-12-07 | Vit | Installation d'inspection optique de circuits electroniques |
-
2013
- 2013-04-11 FR FR1353275A patent/FR3004582B1/fr active Active
-
2014
- 2014-04-09 WO PCT/FR2014/050853 patent/WO2014167248A1/fr active Application Filing
- 2014-04-09 EP EP14720669.2A patent/EP2984913A1/fr not_active Withdrawn
- 2014-04-09 KR KR1020157030835A patent/KR20150140704A/ko not_active Application Discontinuation
- 2014-04-09 US US14/783,491 patent/US20160054237A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
KR20150140704A (ko) | 2015-12-16 |
FR3004582A1 (fr) | 2014-10-17 |
EP2984913A1 (fr) | 2016-02-17 |
WO2014167248A1 (fr) | 2014-10-16 |
US20160054237A1 (en) | 2016-02-25 |
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