FR2968452B1 - SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD - Google Patents

SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD

Info

Publication number
FR2968452B1
FR2968452B1 FR1060040A FR1060040A FR2968452B1 FR 2968452 B1 FR2968452 B1 FR 2968452B1 FR 1060040 A FR1060040 A FR 1060040A FR 1060040 A FR1060040 A FR 1060040A FR 2968452 B1 FR2968452 B1 FR 2968452B1
Authority
FR
France
Prior art keywords
susceptibility
integrated circuit
electromagnetic field
circuit facing
facing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1060040A
Other languages
French (fr)
Other versions
FR2968452A1 (en
Inventor
Fabrice Marinet
Mathieu Lisart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Rousset SAS filed Critical STMicroelectronics Rousset SAS
Priority to FR1060040A priority Critical patent/FR2968452B1/en
Publication of FR2968452A1 publication Critical patent/FR2968452A1/en
Application granted granted Critical
Publication of FR2968452B1 publication Critical patent/FR2968452B1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
FR1060040A 2010-12-02 2010-12-02 SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD Expired - Fee Related FR2968452B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1060040A FR2968452B1 (en) 2010-12-02 2010-12-02 SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1060040A FR2968452B1 (en) 2010-12-02 2010-12-02 SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD

Publications (2)

Publication Number Publication Date
FR2968452A1 FR2968452A1 (en) 2012-06-08
FR2968452B1 true FR2968452B1 (en) 2013-08-23

Family

ID=44119550

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1060040A Expired - Fee Related FR2968452B1 (en) 2010-12-02 2010-12-02 SUSCEPTIBILITY OF AN INTEGRATED CIRCUIT FACING AN ELECTROMAGNETIC FIELD

Country Status (1)

Country Link
FR (1) FR2968452B1 (en)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6242925B1 (en) * 1999-03-12 2001-06-05 General Electric Company EMI susceptibility testing apparatus and method
JP3285568B2 (en) * 1999-05-24 2002-05-27 日本電産リード株式会社 Board wiring inspection apparatus and wiring inspection method
DE10358794B4 (en) * 2003-12-12 2012-10-04 Eurocopter Deutschland Gmbh Near-field measurement method for printed circuit boards
US7397266B2 (en) * 2006-10-16 2008-07-08 Amber Precision Instuments, Inc System and method for testing the electromagnetic susceptibility of an electronic display unit
DE102007058999B4 (en) * 2007-12-05 2014-10-30 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Transportable EMC test system, EMC test method and computer program product
US8143903B2 (en) * 2008-05-30 2012-03-27 The Curators Of The University Of Missouri Resonance scanning system and method for testing equipment for electromagnetic resonances
FR2943793B1 (en) * 2009-03-30 2011-04-22 Supelec METHOD FOR CONTROLLING THE DIRECTIVITY AND POLARIZATION OF COHERENT FIELD DISTRIBUTIONS IN A REVERBERANT MEDIUM.

Also Published As

Publication number Publication date
FR2968452A1 (en) 2012-06-08

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150831