FR2962273B1 - Convertisseur analogique-numerique sigma-delta muni d'un circuit de test - Google Patents

Convertisseur analogique-numerique sigma-delta muni d'un circuit de test

Info

Publication number
FR2962273B1
FR2962273B1 FR1002741A FR1002741A FR2962273B1 FR 2962273 B1 FR2962273 B1 FR 2962273B1 FR 1002741 A FR1002741 A FR 1002741A FR 1002741 A FR1002741 A FR 1002741A FR 2962273 B1 FR2962273 B1 FR 2962273B1
Authority
FR
France
Prior art keywords
sigma
digital converter
testing circuit
delta analog
delta
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1002741A
Other languages
English (en)
Other versions
FR2962273A1 (fr
Inventor
Salvador Mir
Charalampos Stratigopoulos
Matthieu Dubois
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics International NV Switzerland
Original Assignee
Centre National de la Recherche Scientifique CNRS
Institut Polytechnique de Grenoble
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Institut Polytechnique de Grenoble filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1002741A priority Critical patent/FR2962273B1/fr
Priority to EP11727990.1A priority patent/EP2589153B1/fr
Priority to US13/807,632 priority patent/US8830098B2/en
Priority to PCT/EP2011/060863 priority patent/WO2012001019A1/fr
Priority to CN201180041389.9A priority patent/CN103201956B/zh
Publication of FR2962273A1 publication Critical patent/FR2962273A1/fr
Application granted granted Critical
Publication of FR2962273B1 publication Critical patent/FR2962273B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/378—Testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step
FR1002741A 2010-06-30 2010-06-30 Convertisseur analogique-numerique sigma-delta muni d'un circuit de test Expired - Fee Related FR2962273B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1002741A FR2962273B1 (fr) 2010-06-30 2010-06-30 Convertisseur analogique-numerique sigma-delta muni d'un circuit de test
EP11727990.1A EP2589153B1 (fr) 2010-06-30 2011-06-28 Can sigma-delta doté d'un ensemble de circuits d'essai
US13/807,632 US8830098B2 (en) 2010-06-30 2011-06-28 Sigma-delta ADC with test circuitry
PCT/EP2011/060863 WO2012001019A1 (fr) 2010-06-30 2011-06-28 Can sigma-delta doté d'un ensemble de circuits d'essai
CN201180041389.9A CN103201956B (zh) 2010-06-30 2011-06-28 具有测试电路的σ-δadc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1002741A FR2962273B1 (fr) 2010-06-30 2010-06-30 Convertisseur analogique-numerique sigma-delta muni d'un circuit de test

Publications (2)

Publication Number Publication Date
FR2962273A1 FR2962273A1 (fr) 2012-01-06
FR2962273B1 true FR2962273B1 (fr) 2012-07-27

Family

ID=43536652

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1002741A Expired - Fee Related FR2962273B1 (fr) 2010-06-30 2010-06-30 Convertisseur analogique-numerique sigma-delta muni d'un circuit de test

Country Status (5)

Country Link
US (1) US8830098B2 (fr)
EP (1) EP2589153B1 (fr)
CN (1) CN103201956B (fr)
FR (1) FR2962273B1 (fr)
WO (1) WO2012001019A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012111586B4 (de) * 2012-11-29 2014-10-30 Infineon Technologies Ag Verfahren und Vorrichtungen zum Testen von Analog-Digital-Wandlern
CN103995169B (zh) * 2014-04-25 2016-07-20 嘉兴泰鼎光电集成电路有限公司 芯片内部节点电压的测试电路
US9401728B2 (en) * 2014-12-16 2016-07-26 Freescale Semiconductor, Inc. Test signal generator for sigma-delta ADC
US9350381B1 (en) 2014-12-16 2016-05-24 Freescale Semiconductor Inc. Circuit generating an analog signal using a part of a sigma-delta ADC
CN104963676A (zh) * 2015-06-25 2015-10-07 中国石油天然气股份有限公司 一种钻井防碰预警装置及方法
US11106705B2 (en) 2016-04-20 2021-08-31 Zestfinance, Inc. Systems and methods for parsing opaque data
CN107544020B (zh) * 2016-06-29 2021-02-05 恩智浦美国有限公司 用于∑-△调制器的内建自测试电路
US9780803B1 (en) * 2016-09-15 2017-10-03 Stmicroelectronics International N.V. Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit
US20190170813A1 (en) * 2017-12-04 2019-06-06 Aktiebolaget Skf Self-test circuit and a method of checking the integrity of a signal through a signal path
US10461771B2 (en) * 2018-03-20 2019-10-29 Texas Instruments Incorporated Sigma-delta analog-to-digital converter with multiple counters
CN112737584B (zh) * 2020-12-31 2023-08-01 中国电子科技集团公司第十四研究所 一种片内全集成电容失配校准电路
CN112630626B (zh) * 2021-03-05 2021-10-22 光梓信息科技（上海）有限公司 片上自测试系统及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2349756B (en) * 1999-05-06 2003-05-14 Sony Uk Ltd Signal processors
US6907374B1 (en) * 2003-03-19 2005-06-14 Zilog, Inc. Self-calibrating sigma-delta analog-to-digital converter
KR100513384B1 (ko) * 2003-08-04 2005-09-07 삼성전자주식회사 신호 처리장치의 테스트 장치 및 테스트 방법
US7062401B1 (en) * 2005-01-11 2006-06-13 Lsi Logic Corporation Low circuit overhead built in self test for oversampled ADC's
TWI270254B (en) * 2005-09-16 2007-01-01 Univ Nat Chiao Tung Reprogrammable switched-capacitor input circuit for receiving digital test stimulus signal in analog test
US7773020B2 (en) * 2007-02-15 2010-08-10 Analog Devices, Inc. Analog to digital converter
US7495589B1 (en) * 2007-09-17 2009-02-24 Texas Instruments Incorporated Circuit and method for gain error correction in ADC
US7741981B1 (en) * 2008-12-30 2010-06-22 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Dual-use comparator/op amp for use as both a successive-approximation ADC and DAC

Also Published As

Publication number Publication date
US20130201046A1 (en) 2013-08-08
EP2589153B1 (fr) 2016-06-15
CN103201956A (zh) 2013-07-10
FR2962273A1 (fr) 2012-01-06
EP2589153A1 (fr) 2013-05-08
US8830098B2 (en) 2014-09-09
WO2012001019A1 (fr) 2012-01-05
CN103201956B (zh) 2016-04-27

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Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 6

TP Transmission of property

Owner name: STMICROELECTRONICS INTERNATIONAL NV, CH

Effective date: 20151215

PLFP Fee payment

Year of fee payment: 7

ST Notification of lapse

Effective date: 20180228