FR2914481B1 - Dispositif de memoire avec prise en compte des courants de fuite pour l'activation des amplificateurs de lecture - Google Patents
Dispositif de memoire avec prise en compte des courants de fuite pour l'activation des amplificateurs de lectureInfo
- Publication number
- FR2914481B1 FR2914481B1 FR0702413A FR0702413A FR2914481B1 FR 2914481 B1 FR2914481 B1 FR 2914481B1 FR 0702413 A FR0702413 A FR 0702413A FR 0702413 A FR0702413 A FR 0702413A FR 2914481 B1 FR2914481 B1 FR 2914481B1
- Authority
- FR
- France
- Prior art keywords
- activation
- account
- memory device
- leakage currents
- reading amplifiers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/14—Dummy cell management; Sense reference voltage generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/08—Control thereof
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0702413A FR2914481B1 (fr) | 2007-04-02 | 2007-04-02 | Dispositif de memoire avec prise en compte des courants de fuite pour l'activation des amplificateurs de lecture |
US12/061,238 US7995413B2 (en) | 2007-04-02 | 2008-04-02 | Memory device that takes leakage currents into account in activating the read amplifiers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0702413A FR2914481B1 (fr) | 2007-04-02 | 2007-04-02 | Dispositif de memoire avec prise en compte des courants de fuite pour l'activation des amplificateurs de lecture |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2914481A1 FR2914481A1 (fr) | 2008-10-03 |
FR2914481B1 true FR2914481B1 (fr) | 2009-06-05 |
Family
ID=38658515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0702413A Expired - Fee Related FR2914481B1 (fr) | 2007-04-02 | 2007-04-02 | Dispositif de memoire avec prise en compte des courants de fuite pour l'activation des amplificateurs de lecture |
Country Status (2)
Country | Link |
---|---|
US (1) | US7995413B2 (fr) |
FR (1) | FR2914481B1 (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2805329A1 (fr) * | 2012-01-17 | 2014-11-26 | Marvell World Trade Ltd. | Système et procédé pour la modification d'activation d'un amplificateur de détection |
US9324412B2 (en) * | 2012-10-31 | 2016-04-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory architecture |
US9276083B2 (en) * | 2012-12-14 | 2016-03-01 | Altera Corporation | Memory elements with stacked pull-up devices |
GB2520740A (en) * | 2013-11-29 | 2015-06-03 | St Microelectronics Res & Dev | Low power die |
US10181358B2 (en) * | 2016-10-26 | 2019-01-15 | Mediatek Inc. | Sense amplifier |
US10333510B2 (en) * | 2017-07-07 | 2019-06-25 | Infineon Tehcnologies Ag | System and method for biasing an RF switch |
CN113892137A (zh) | 2021-03-30 | 2022-01-04 | 长江存储科技有限责任公司 | 存储器器件及其操作方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0805454A1 (fr) * | 1996-04-30 | 1997-11-05 | STMicroelectronics S.r.l. | Circuit de détection pour lecture et vérification du contenu d'une cellule de mémoire |
TW523977B (en) * | 2001-09-26 | 2003-03-11 | Macronix Int Co Ltd | Circuit and method for stability and speed enhancement for a sense amplifier |
ITTO20030132A1 (it) * | 2003-02-25 | 2004-08-26 | Atmel Corp | Amplificatore di rilevamento rapido a specchio, di tipo configurabile e procedimento per configurare un tale amplificatore. |
FR2857149B1 (fr) * | 2003-07-01 | 2005-12-16 | St Microelectronics Sa | Procede de commande des amplificateurs de lecture d'une memoire et circuit integre de memoire correspondant |
FR2857091A1 (fr) * | 2003-07-01 | 2005-01-07 | St Microelectronics Sa | Procede de detection de la temperature d'un circuit integre, et circuit integre correspondant |
US7020036B2 (en) * | 2004-08-26 | 2006-03-28 | Ememory Technology Inc. | Memory unit with sensing current stabilization |
JP4477456B2 (ja) * | 2004-09-06 | 2010-06-09 | 富士通マイクロエレクトロニクス株式会社 | 半導体メモリ |
JP4517786B2 (ja) * | 2004-09-06 | 2010-08-04 | 富士通セミコンダクター株式会社 | 半導体記憶装置及びセンスアンプの活性化信号の生成方法 |
US7417469B2 (en) * | 2006-11-13 | 2008-08-26 | International Business Machines Corporation | Compensation for leakage current from dynamic storage node variation by the utilization of an automatic self-adaptive keeper |
US7746716B2 (en) * | 2007-02-22 | 2010-06-29 | Freescale Semiconductor, Inc. | Memory having a dummy bitline for timing control |
-
2007
- 2007-04-02 FR FR0702413A patent/FR2914481B1/fr not_active Expired - Fee Related
-
2008
- 2008-04-02 US US12/061,238 patent/US7995413B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20080247251A1 (en) | 2008-10-09 |
FR2914481A1 (fr) | 2008-10-03 |
US7995413B2 (en) | 2011-08-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20131231 |