FR2884080B1 - Ensemble de circuits electroniques protege contre des perturbations transitoires - Google Patents
Ensemble de circuits electroniques protege contre des perturbations transitoiresInfo
- Publication number
- FR2884080B1 FR2884080B1 FR0503368A FR0503368A FR2884080B1 FR 2884080 B1 FR2884080 B1 FR 2884080B1 FR 0503368 A FR0503368 A FR 0503368A FR 0503368 A FR0503368 A FR 0503368A FR 2884080 B1 FR2884080 B1 FR 2884080B1
- Authority
- FR
- France
- Prior art keywords
- electronic circuit
- circuit assembly
- transient disturbances
- assembly protects
- protects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000001052 transient effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/013—Modifications of generator to prevent operation by noise or interference
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
- H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0503368A FR2884080B1 (fr) | 2005-04-05 | 2005-04-05 | Ensemble de circuits electroniques protege contre des perturbations transitoires |
US11/376,320 US7274235B2 (en) | 2005-04-05 | 2006-03-16 | Electronic circuitry protected against transient disturbances and method for simulating disturbances |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0503368A FR2884080B1 (fr) | 2005-04-05 | 2005-04-05 | Ensemble de circuits electroniques protege contre des perturbations transitoires |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2884080A1 FR2884080A1 (fr) | 2006-10-06 |
FR2884080B1 true FR2884080B1 (fr) | 2007-05-25 |
Family
ID=35385850
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0503368A Active FR2884080B1 (fr) | 2005-04-05 | 2005-04-05 | Ensemble de circuits electroniques protege contre des perturbations transitoires |
Country Status (2)
Country | Link |
---|---|
US (1) | US7274235B2 (fr) |
FR (1) | FR2884080B1 (fr) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7236009B1 (en) | 2004-12-01 | 2007-06-26 | Andre Rohe | Operational time extension |
US7428721B2 (en) | 2004-12-01 | 2008-09-23 | Tabula, Inc. | Operational cycle assignment in a configurable IC |
US7496879B2 (en) * | 2004-12-01 | 2009-02-24 | Tabula, Inc. | Concurrent optimization of physical design and operational cycle assignment |
US7945829B2 (en) * | 2005-01-19 | 2011-05-17 | National University Corporation Chiba University | Semiconductor integrated circuit |
US7788478B2 (en) | 2005-07-15 | 2010-08-31 | Tabula, Inc. | Accessing multiple user states concurrently in a configurable IC |
US7372297B1 (en) | 2005-11-07 | 2008-05-13 | Tabula Inc. | Hybrid interconnect/logic circuits enabling efficient replication of a function in several sub-cycles to save logic and routing resources |
US7679401B1 (en) | 2005-12-01 | 2010-03-16 | Tabula, Inc. | User registers implemented with routing circuits in a configurable IC |
US7525344B2 (en) | 2007-03-20 | 2009-04-28 | Tabula, Inc. | Configurable IC having a routing fabric with storage elements |
GB2479090B (en) * | 2007-04-03 | 2011-11-16 | Advanced Risc Mach Ltd | Error recovery following erroneous execution with an instruction processing pipeline |
GB2448118B (en) * | 2007-04-03 | 2011-08-24 | Advanced Risc Mach Ltd | Error recovery following erroneous execution with an instruction processing pipeline |
US8069425B2 (en) | 2007-06-27 | 2011-11-29 | Tabula, Inc. | Translating a user design in a configurable IC for debugging the user design |
US7827454B2 (en) * | 2007-07-17 | 2010-11-02 | Renesas Electronics Corporation | Semiconductor device |
WO2009039462A1 (fr) * | 2007-09-19 | 2009-03-26 | Tabula, Inc. | Procédé et système pour faire état d'une structure de circuit primaire d'un circuit intégré (ic) en utilisant une structure de circuit secondaire de l'ic |
JP2009147221A (ja) * | 2007-12-17 | 2009-07-02 | Renesas Technology Corp | 半導体装置 |
US8863067B1 (en) | 2008-02-06 | 2014-10-14 | Tabula, Inc. | Sequential delay analysis by placement engines |
US20110191646A1 (en) * | 2008-04-04 | 2011-08-04 | Arizona Board of Regents, a body Corporate of the State of Arizona, Acting for and | Fault-and Variation-Tolerant Energy - and Area-Efficient Links for Network-on-Chips |
US8166435B2 (en) | 2008-06-26 | 2012-04-24 | Tabula, Inc. | Timing operations in an IC with configurable circuits |
US8525548B2 (en) | 2008-08-04 | 2013-09-03 | Tabula, Inc. | Trigger circuits and event counters for an IC |
WO2010033263A1 (fr) | 2008-09-17 | 2010-03-25 | Tabula, Inc. | Éléments de stockage contrôlables pour un circuit intégré |
DE102009029784A1 (de) * | 2009-06-18 | 2010-12-30 | Atmel Automotive Gmbh | Integrierter Schaltkreis und Standardzelle eines integrierten Schaltkreises |
US9378077B2 (en) * | 2009-08-07 | 2016-06-28 | Stmicroelectronics S.R.L. | System for detecting operating errors in integrated circuits |
US8941409B2 (en) | 2011-07-01 | 2015-01-27 | Tabula, Inc. | Configurable storage elements |
US9148151B2 (en) | 2011-07-13 | 2015-09-29 | Altera Corporation | Configurable storage elements |
US8589841B2 (en) * | 2012-04-05 | 2013-11-19 | International Business Machines Corporation | Automatic parity checking identification |
US9436565B2 (en) | 2013-07-04 | 2016-09-06 | Altera Corporation | Non-intrusive monitoring and control of integrated circuits |
US20170184664A1 (en) * | 2015-12-28 | 2017-06-29 | Michel Nicolaidis | Highly efficient double-sampling architectures |
WO2019106225A1 (fr) * | 2017-12-01 | 2019-06-06 | Minima Processor Oy | Procédé et agencement pour assurer des données valides au niveau d'un second étage d'un circuit de registre numérique |
US11022649B2 (en) * | 2018-11-30 | 2021-06-01 | Arm Limited | Stabilised failure estimate in circuits |
WO2020115352A1 (fr) * | 2018-12-05 | 2020-06-11 | Minima Processor Oy | Circuit de registre avec détection d'événements de données, et procédé de détection d'événements de données dans un circuit de registre |
US10890622B2 (en) * | 2019-04-29 | 2021-01-12 | International Business Machines Corporation | Integrated circuit control latch protection |
US11686769B1 (en) * | 2022-01-05 | 2023-06-27 | Nxp B.V. | Signal toggling detection and correction circuit |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4525635A (en) * | 1982-12-15 | 1985-06-25 | Rca Corporation | Transient signal suppression circuit |
US5525921A (en) * | 1994-04-07 | 1996-06-11 | Vlsi Technology, Inc. | Logic suppression of input and ground spikes for synchronized inputs |
FR2790887B1 (fr) * | 1999-03-09 | 2003-01-03 | Univ Joseph Fourier | Circuit logique protege contre des perturbations transitoires |
US6353341B1 (en) * | 1999-11-12 | 2002-03-05 | Xilinx, Inc. | Method and apparatus for discriminating against signal interference |
US7278080B2 (en) | 2003-03-20 | 2007-10-02 | Arm Limited | Error detection and recovery within processing stages of an integrated circuit |
-
2005
- 2005-04-05 FR FR0503368A patent/FR2884080B1/fr active Active
-
2006
- 2006-03-16 US US11/376,320 patent/US7274235B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
FR2884080A1 (fr) | 2006-10-06 |
US7274235B2 (en) | 2007-09-25 |
US20060220716A1 (en) | 2006-10-05 |
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