FR2792773B1 - Source ionique pour spectrometre de masse a temps de vol analysant des echantillons gazeux - Google Patents
Source ionique pour spectrometre de masse a temps de vol analysant des echantillons gazeuxInfo
- Publication number
- FR2792773B1 FR2792773B1 FR9905088A FR9905088A FR2792773B1 FR 2792773 B1 FR2792773 B1 FR 2792773B1 FR 9905088 A FR9905088 A FR 9905088A FR 9905088 A FR9905088 A FR 9905088A FR 2792773 B1 FR2792773 B1 FR 2792773B1
- Authority
- FR
- France
- Prior art keywords
- ion source
- mass spectrometer
- time
- flight mass
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/04—Ion sources; Ion guns using reflex discharge, e.g. Penning ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/08—Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/18—Electrode arrangements using essentially more than one dynode
- H01J43/24—Dynodes having potential gradient along their surfaces
- H01J43/246—Microchannel plates [MCP]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Combustion & Propulsion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9905088A FR2792773B1 (fr) | 1999-04-22 | 1999-04-22 | Source ionique pour spectrometre de masse a temps de vol analysant des echantillons gazeux |
AT00401028T ATE279783T1 (de) | 1999-04-22 | 2000-04-13 | Flugzeitmassenspektrometerionenquelle zur analyse von gasproben |
EP00401028A EP1052672B1 (fr) | 1999-04-22 | 2000-04-13 | Source ionique pour spectromètre de masse à temps de vol analysant des echantillons gazeux |
DE60014758T DE60014758T2 (de) | 1999-04-22 | 2000-04-13 | Flugzeitmassenspektrometerionenquelle zur Analyse von Gasproben |
US09/550,171 US6545269B1 (en) | 1999-04-22 | 2000-04-14 | Ion source for time-of-flight mass spectrometers for analyzing gas samples |
JP2000116162A JP4395584B2 (ja) | 1999-04-22 | 2000-04-18 | ガスサンプル分析用の飛行時間型質量分析計用のイオン源 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9905088A FR2792773B1 (fr) | 1999-04-22 | 1999-04-22 | Source ionique pour spectrometre de masse a temps de vol analysant des echantillons gazeux |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2792773A1 FR2792773A1 (fr) | 2000-10-27 |
FR2792773B1 true FR2792773B1 (fr) | 2001-07-27 |
Family
ID=9544732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9905088A Expired - Fee Related FR2792773B1 (fr) | 1999-04-22 | 1999-04-22 | Source ionique pour spectrometre de masse a temps de vol analysant des echantillons gazeux |
Country Status (6)
Country | Link |
---|---|
US (1) | US6545269B1 (fr) |
EP (1) | EP1052672B1 (fr) |
JP (1) | JP4395584B2 (fr) |
AT (1) | ATE279783T1 (fr) |
DE (1) | DE60014758T2 (fr) |
FR (1) | FR2792773B1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6806467B1 (en) * | 2003-07-24 | 2004-10-19 | The Regents Of The University Of California | Continuous time-of-flight ion mass spectrometer |
US7420472B2 (en) * | 2005-10-16 | 2008-09-02 | Bao Tran | Patient monitoring apparatus |
US9224569B2 (en) | 2012-06-29 | 2015-12-29 | Fei Company | Multi species ion source |
KR101786950B1 (ko) * | 2014-12-30 | 2017-10-19 | 한국기초과학지원연구원 | 비행시간 질량분석기 |
US9899181B1 (en) | 2017-01-12 | 2018-02-20 | Fei Company | Collision ionization ion source |
US9941094B1 (en) | 2017-02-01 | 2018-04-10 | Fei Company | Innovative source assembly for ion beam production |
CN109461642B (zh) * | 2018-12-07 | 2024-04-02 | 中国烟草总公司郑州烟草研究院 | 一种离子引发电子轰击电离源 |
US11854777B2 (en) * | 2019-07-29 | 2023-12-26 | Thermo Finnigan Llc | Ion-to-electron conversion dynode for ion imaging applications |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3852595A (en) * | 1972-09-21 | 1974-12-03 | Stanford Research Inst | Multipoint field ionization source |
US3819941A (en) * | 1973-10-15 | 1974-06-25 | Bendix Corp | Mass dependent ion microscope having an array of small mass filters |
FR2294539A1 (fr) * | 1974-12-13 | 1976-07-09 | Labo Electronique Physique | Dispositif ioniseur incluant une galette de microcanaux a emission electronique secondaire |
US5659170A (en) * | 1994-12-16 | 1997-08-19 | The Texas A&M University System | Ion source for compact mass spectrometer and method of mass analyzing a sample |
JP3778664B2 (ja) * | 1997-07-24 | 2006-05-24 | 浜松ホトニクス株式会社 | マイクロチャネルプレートを用いたイオン源 |
-
1999
- 1999-04-22 FR FR9905088A patent/FR2792773B1/fr not_active Expired - Fee Related
-
2000
- 2000-04-13 EP EP00401028A patent/EP1052672B1/fr not_active Expired - Lifetime
- 2000-04-13 DE DE60014758T patent/DE60014758T2/de not_active Expired - Fee Related
- 2000-04-13 AT AT00401028T patent/ATE279783T1/de not_active IP Right Cessation
- 2000-04-14 US US09/550,171 patent/US6545269B1/en not_active Expired - Fee Related
- 2000-04-18 JP JP2000116162A patent/JP4395584B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE60014758T2 (de) | 2006-03-09 |
EP1052672A1 (fr) | 2000-11-15 |
FR2792773A1 (fr) | 2000-10-27 |
DE60014758D1 (de) | 2004-11-18 |
US6545269B1 (en) | 2003-04-08 |
JP2000348665A (ja) | 2000-12-15 |
US20030057378A1 (en) | 2003-03-27 |
ATE279783T1 (de) | 2004-10-15 |
EP1052672B1 (fr) | 2004-10-13 |
JP4395584B2 (ja) | 2010-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20061230 |