FR2781317B1 - Source de tension de basse impedance - Google Patents
Source de tension de basse impedanceInfo
- Publication number
- FR2781317B1 FR2781317B1 FR9809318A FR9809318A FR2781317B1 FR 2781317 B1 FR2781317 B1 FR 2781317B1 FR 9809318 A FR9809318 A FR 9809318A FR 9809318 A FR9809318 A FR 9809318A FR 2781317 B1 FR2781317 B1 FR 2781317B1
- Authority
- FR
- France
- Prior art keywords
- voltage source
- low impedance
- impedance voltage
- low
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
- G05F3/247—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the supply voltage
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Dram (AREA)
- Logic Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9809318A FR2781317B1 (fr) | 1998-07-17 | 1998-07-17 | Source de tension de basse impedance |
US09/353,345 US20020024379A1 (en) | 1998-07-17 | 1999-07-15 | Low impedance voltage source |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9809318A FR2781317B1 (fr) | 1998-07-17 | 1998-07-17 | Source de tension de basse impedance |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2781317A1 FR2781317A1 (fr) | 2000-01-21 |
FR2781317B1 true FR2781317B1 (fr) | 2005-08-26 |
Family
ID=9528867
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9809318A Expired - Fee Related FR2781317B1 (fr) | 1998-07-17 | 1998-07-17 | Source de tension de basse impedance |
Country Status (2)
Country | Link |
---|---|
US (1) | US20020024379A1 (fr) |
FR (1) | FR2781317B1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2806489B1 (fr) | 2000-03-15 | 2002-06-28 | St Microelectronics Sa | Circuit de fourniture de tension de reference |
US11024373B2 (en) * | 2019-09-12 | 2021-06-01 | Hefei Reliance Memory Limited | Voltage-mode bit line precharge for random-access memory cells |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4663584B1 (en) * | 1985-06-10 | 1996-05-21 | Toshiba Kk | Intermediate potential generation circuit |
JP2509596B2 (ja) * | 1987-01-14 | 1996-06-19 | 株式会社東芝 | 中間電位生成回路 |
JP3114391B2 (ja) * | 1992-10-14 | 2000-12-04 | 三菱電機株式会社 | 中間電圧発生回路 |
JP3038094B2 (ja) * | 1992-12-24 | 2000-05-08 | 三菱電機株式会社 | 半導体集積回路装置の出力回路 |
-
1998
- 1998-07-17 FR FR9809318A patent/FR2781317B1/fr not_active Expired - Fee Related
-
1999
- 1999-07-15 US US09/353,345 patent/US20020024379A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
FR2781317A1 (fr) | 2000-01-21 |
US20020024379A1 (en) | 2002-02-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20080331 |