FR2773652B1 - Circuit de generation d'un signal d'activation commande - Google Patents

Circuit de generation d'un signal d'activation commande

Info

Publication number
FR2773652B1
FR2773652B1 FR9800319A FR9800319A FR2773652B1 FR 2773652 B1 FR2773652 B1 FR 2773652B1 FR 9800319 A FR9800319 A FR 9800319A FR 9800319 A FR9800319 A FR 9800319A FR 2773652 B1 FR2773652 B1 FR 2773652B1
Authority
FR
France
Prior art keywords
generating
circuit
activation signal
control activation
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9800319A
Other languages
English (en)
Other versions
FR2773652A1 (fr
Inventor
Bernadette Laurier
Charles Odinot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9800319A priority Critical patent/FR2773652B1/fr
Priority to US09/229,938 priority patent/US6211711B1/en
Publication of FR2773652A1 publication Critical patent/FR2773652A1/fr
Application granted granted Critical
Publication of FR2773652B1 publication Critical patent/FR2773652B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9800319A 1998-01-14 1998-01-14 Circuit de generation d'un signal d'activation commande Expired - Fee Related FR2773652B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9800319A FR2773652B1 (fr) 1998-01-14 1998-01-14 Circuit de generation d'un signal d'activation commande
US09/229,938 US6211711B1 (en) 1998-01-14 1999-01-13 Activation signal generating circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9800319A FR2773652B1 (fr) 1998-01-14 1998-01-14 Circuit de generation d'un signal d'activation commande

Publications (2)

Publication Number Publication Date
FR2773652A1 FR2773652A1 (fr) 1999-07-16
FR2773652B1 true FR2773652B1 (fr) 2002-10-11

Family

ID=9521762

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9800319A Expired - Fee Related FR2773652B1 (fr) 1998-01-14 1998-01-14 Circuit de generation d'un signal d'activation commande

Country Status (2)

Country Link
US (1) US6211711B1 (fr)
FR (1) FR2773652B1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE523309E (sv) * 2001-06-15 2010-03-02 Replisaurus Technologies Ab Metod, elektrod och apparat för att skapa mikro- och nanostrukturer i ledande material genom mönstring med masterelektrod och elektrolyt
US7427884B2 (en) * 2004-05-21 2008-09-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN104700806B (zh) * 2015-03-26 2017-01-25 京东方科技集团股份有限公司 一种移位寄存器、栅极驱动电路、显示面板及显示装置
KR102465497B1 (ko) 2016-04-28 2022-11-09 삼성전자주식회사 반도체 회로

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855623A (en) * 1987-11-05 1989-08-08 Texas Instruments Incorporated Output buffer having programmable drive current
JP3528413B2 (ja) * 1996-04-19 2004-05-17 ソニー株式会社 関数クロック発生回路並びにそれを用いたイネーブル機能付きｄ型フリップフロップおよび記憶回路
US5625630A (en) * 1996-04-24 1997-04-29 Lucent Technologies Inc. Increasing testability by clock transformation
US6014038A (en) * 1997-03-21 2000-01-11 Lightspeed Semiconductor Corporation Function block architecture for gate array

Also Published As

Publication number Publication date
FR2773652A1 (fr) 1999-07-16
US6211711B1 (en) 2001-04-03

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070930