FR2771181B1 - Procede et systeme de test d'un circuit integre a fonctionnement sans contact - Google Patents

Procede et systeme de test d'un circuit integre a fonctionnement sans contact

Info

Publication number
FR2771181B1
FR2771181B1 FR9714685A FR9714685A FR2771181B1 FR 2771181 B1 FR2771181 B1 FR 2771181B1 FR 9714685 A FR9714685 A FR 9714685A FR 9714685 A FR9714685 A FR 9714685A FR 2771181 B1 FR2771181 B1 FR 2771181B1
Authority
FR
France
Prior art keywords
testing
integrated circuit
contact operation
contact
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9714685A
Other languages
English (en)
Other versions
FR2771181A1 (fr
Inventor
Jean Pierre Enguent
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9714685A priority Critical patent/FR2771181B1/fr
Priority to FR9805986A priority patent/FR2771182B1/fr
Priority to US09/193,768 priority patent/US6181152B1/en
Priority to DE69805039T priority patent/DE69805039T2/de
Priority to EP98121544A priority patent/EP0916957B1/fr
Publication of FR2771181A1 publication Critical patent/FR2771181A1/fr
Application granted granted Critical
Publication of FR2771181B1 publication Critical patent/FR2771181B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR9714685A 1997-11-18 1997-11-18 Procede et systeme de test d'un circuit integre a fonctionnement sans contact Expired - Fee Related FR2771181B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR9714685A FR2771181B1 (fr) 1997-11-18 1997-11-18 Procede et systeme de test d'un circuit integre a fonctionnement sans contact
FR9805986A FR2771182B1 (fr) 1997-11-18 1998-05-06 Procede et systeme de test d'un circuit integre a fonctionnement sans contact, et d'une capacite d'entree d'un tel circuit integre
US09/193,768 US6181152B1 (en) 1997-11-18 1998-11-17 Method and system for testing an integrated circuit input capacitance, particularly for a contactless operating integrated circuit
DE69805039T DE69805039T2 (de) 1997-11-18 1998-11-17 Verfahren und System zum Testen eines kontaktlos arbeitenden integrierten Schaltkreises und einer Eingangskapazität eines solchen integrierten Schaltkreises
EP98121544A EP0916957B1 (fr) 1997-11-18 1998-11-17 Procédé et système de test d'un circuit intégré à fonctionnement sans contact, et d'une capacité d'entrée d'un tel circuit intégré

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9714685A FR2771181B1 (fr) 1997-11-18 1997-11-18 Procede et systeme de test d'un circuit integre a fonctionnement sans contact

Publications (2)

Publication Number Publication Date
FR2771181A1 FR2771181A1 (fr) 1999-05-21
FR2771181B1 true FR2771181B1 (fr) 2000-01-28

Family

ID=9513677

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9714685A Expired - Fee Related FR2771181B1 (fr) 1997-11-18 1997-11-18 Procede et systeme de test d'un circuit integre a fonctionnement sans contact

Country Status (1)

Country Link
FR (1) FR2771181B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230136914A1 (en) * 2021-10-29 2023-05-04 Keysight Technologies, Inc. Sensor device for detecting electrical defects based on resonance frequency

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2111222B (en) * 1981-10-02 1986-01-15 Bonar Instr Limited Series-resonant test-voltage source
DE4215957C2 (de) * 1992-05-14 1994-05-19 Siemens Ag Einrichtung zur Informationsübertragung mit einem stationären Teil und einer tragbaren Datenträgeranordnung
JP3819958B2 (ja) * 1996-03-19 2006-09-13 株式会社ルネサステクノロジ 非接触型ｉｃカード及びその内蔵ｉｃのテスト方法

Also Published As

Publication number Publication date
FR2771181A1 (fr) 1999-05-21

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Legal Events

Date Code Title Description
ST Notification of lapse