FR2754904B1 - Production d'impulsions dans le canal analogique d'un appareil de test automatique - Google Patents
Production d'impulsions dans le canal analogique d'un appareil de test automatiqueInfo
- Publication number
- FR2754904B1 FR2754904B1 FR9712233A FR9712233A FR2754904B1 FR 2754904 B1 FR2754904 B1 FR 2754904B1 FR 9712233 A FR9712233 A FR 9712233A FR 9712233 A FR9712233 A FR 9712233A FR 2754904 B1 FR2754904 B1 FR 2754904B1
- Authority
- FR
- France
- Prior art keywords
- test apparatus
- pulse generation
- automatic test
- analog channel
- analog
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/734,994 US5918198A (en) | 1996-10-22 | 1996-10-22 | Generating pulses in analog channel of ATE tester |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2754904A1 FR2754904A1 (fr) | 1998-04-24 |
FR2754904B1 true FR2754904B1 (fr) | 1999-02-12 |
Family
ID=24953907
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9712233A Expired - Fee Related FR2754904B1 (fr) | 1996-10-22 | 1997-10-01 | Production d'impulsions dans le canal analogique d'un appareil de test automatique |
Country Status (5)
Country | Link |
---|---|
US (1) | US5918198A (fr) |
JP (1) | JPH10170610A (fr) |
KR (1) | KR100492231B1 (fr) |
FR (1) | FR2754904B1 (fr) |
TW (1) | TW338797B (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6449741B1 (en) | 1998-10-30 | 2002-09-10 | Ltx Corporation | Single platform electronic tester |
US7092837B1 (en) | 1998-10-30 | 2006-08-15 | Ltx Corporation | Single platform electronic tester |
US6512989B1 (en) * | 1999-03-26 | 2003-01-28 | Ltx Corporation | Generating and controlling analog and digital signals on a mixed signal test system |
US6504395B1 (en) * | 2001-08-30 | 2003-01-07 | Teradyne, Inc. | Method and apparatus for calibration and validation of high performance DUT power supplies |
US20040145507A1 (en) * | 2003-01-29 | 2004-07-29 | Geraghty Donal P. | Integrated circuit signal generator and a method for generating an analog output signal representative of a waveform |
US7493434B1 (en) * | 2005-05-25 | 2009-02-17 | Dafca, Inc. | Determining the value of internal signals in a malfunctioning integrated circuit |
US8098178B2 (en) * | 2008-05-09 | 2012-01-17 | Mediatek Inc. | Chip and system utilizing the same |
CN111272252A (zh) * | 2020-03-09 | 2020-06-12 | 苏州长光华医生物医学工程有限公司 | 一种用于底物液液量探测的自动校准方法、系统和装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5140613A (en) * | 1990-05-25 | 1992-08-18 | Hewlett-Packard Company | Baseband modulation system with improved ROM-based digital filter |
US5065370A (en) * | 1990-11-28 | 1991-11-12 | The United States Of America As Represented By The Secretary Of The Navy | Programmable pulse shaper for sonobouy apparatus |
US5230008A (en) * | 1991-01-18 | 1993-07-20 | Motorola, Inc. | Multi-amplitude sample generating apparatus and method |
US5309514A (en) * | 1992-06-01 | 1994-05-03 | Scientific-Atlanta, Inc. | Pulse generator including a memory for storing pulses for modulation on a carrier of a television signal |
US5644311A (en) * | 1995-07-07 | 1997-07-01 | Novatel Communications, Ltd. | Pulse width modulation pulse shaper |
US5646521A (en) * | 1995-08-01 | 1997-07-08 | Schlumberger Technologies, Inc. | Analog channel for mixed-signal-VLSI tester |
-
1996
- 1996-10-22 US US08/734,994 patent/US5918198A/en not_active Expired - Lifetime
-
1997
- 1997-07-16 TW TW086110103A patent/TW338797B/zh not_active IP Right Cessation
- 1997-08-25 KR KR1019970040545A patent/KR100492231B1/ko not_active IP Right Cessation
- 1997-10-01 FR FR9712233A patent/FR2754904B1/fr not_active Expired - Fee Related
- 1997-10-22 JP JP9289374A patent/JPH10170610A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US5918198A (en) | 1999-06-29 |
JPH10170610A (ja) | 1998-06-26 |
KR100492231B1 (ko) | 2005-08-25 |
TW338797B (en) | 1998-08-21 |
KR19980032311A (ko) | 1998-07-25 |
FR2754904A1 (fr) | 1998-04-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |