FR2627594B1 - Procede et systeme pour tester et depanner des systemes electroniques a base de microprocesseurs - Google Patents

Procede et systeme pour tester et depanner des systemes electroniques a base de microprocesseurs

Info

Publication number
FR2627594B1
FR2627594B1 FR898902016A FR8902016A FR2627594B1 FR 2627594 B1 FR2627594 B1 FR 2627594B1 FR 898902016 A FR898902016 A FR 898902016A FR 8902016 A FR8902016 A FR 8902016A FR 2627594 B1 FR2627594 B1 FR 2627594B1
Authority
FR
France
Prior art keywords
microprocessors
testing
systems based
electronic systems
troubleshooting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR898902016A
Other languages
English (en)
Other versions
FR2627594A1 (fr
Inventor
Marshall H Scott
Robert E Cuckler
John D Polstra
Anthony R Vannelli
W Douglas Hazelton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Publication of FR2627594A1 publication Critical patent/FR2627594A1/fr
Application granted granted Critical
Publication of FR2627594B1 publication Critical patent/FR2627594B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
FR898902016A 1988-02-19 1989-02-16 Procede et systeme pour tester et depanner des systemes electroniques a base de microprocesseurs Expired - Fee Related FR2627594B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/158,223 US4868822A (en) 1988-02-19 1988-02-19 Memory emulation method and system for testing and troubleshooting microprocessor-based electronic systems

Publications (2)

Publication Number Publication Date
FR2627594A1 FR2627594A1 (fr) 1989-08-25
FR2627594B1 true FR2627594B1 (fr) 1993-01-15

Family

ID=22567169

Family Applications (1)

Application Number Title Priority Date Filing Date
FR898902016A Expired - Fee Related FR2627594B1 (fr) 1988-02-19 1989-02-16 Procede et systeme pour tester et depanner des systemes electroniques a base de microprocesseurs

Country Status (6)

Country Link
US (1) US4868822A (fr)
JP (1) JPH01251141A (fr)
CN (1) CN1018097B (fr)
DE (1) DE3903835A1 (fr)
FR (1) FR2627594B1 (fr)
GB (1) GB2216300B (fr)

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US4956766A (en) * 1985-07-25 1990-09-11 International Business Machines Corp. Systems for inhibiting errors caused by memory cartridge insertion/removal using an idle loop
NL8602849A (nl) * 1986-11-11 1988-06-01 Philips Nv Inrichting voor het emuleren van een microcontroller, middels gebruik maken van een moedermicrocontroller en een dochtermicrocontroller, moedermicrocontroller, respektievelijk dochtermicrocontroller voor gebruik in zo een inrichting, geintegreerde schakeling voor gebruik in zo een dochtermicrocontroller en microcontroller bevattende zo een geintegreerde schakeling.
US5093784A (en) * 1987-02-27 1992-03-03 Nec Corporation Data processor with efficient transfer between subroutines and main program
US5226122A (en) * 1987-08-21 1993-07-06 Compaq Computer Corp. Programmable logic system for filtering commands to a microprocessor
DE3820728A1 (de) * 1988-06-18 1989-12-21 Philips Patentverwaltung Verfahren zum pruefen eines festwertspeichers und anordnung zur durchfuehrung des verfahrens
JPH0278330A (ja) * 1988-09-14 1990-03-19 Marantz Japan Inc Ｍｃａ無線機用ｉｄ・ｒｏｍエミュレータ
CN1045655A (zh) * 1988-11-23 1990-09-26 约翰弗兰克制造公司 系统自动诊断的内核测试接口和方法
US4989207A (en) * 1988-11-23 1991-01-29 John Fluke Mfg. Co., Inc. Automatic verification of kernel circuitry based on analysis of memory accesses
CN1043020A (zh) * 1988-11-23 1990-06-13 约翰弗兰克制造公司 提高存储器仿真法性能的增强型硬件
IE80813B1 (en) * 1989-05-16 1999-03-10 Formia Limited Electronic test systems
US5210864A (en) * 1989-06-01 1993-05-11 Mitsubishi Denki Kabushiki Kaisha Pipelined microprocessor with instruction execution control unit which receives instructions from separate path in test mode for testing instruction execution pipeline
US5185882A (en) * 1990-04-27 1993-02-09 Westinghouse Electric Corp. Bit-slice microprocessor test system
US5581695A (en) * 1990-05-09 1996-12-03 Applied Microsystems Corporation Source-level run-time software code debugging instrument
EP0462328A1 (fr) * 1990-06-18 1991-12-27 ALCATEL BELL Naamloze Vennootschap Dispositif de test pour une puce électronique
US5594903A (en) * 1991-02-26 1997-01-14 Lynx Real-Time Systems, Inc. Operating System architecture with reserved memory space resident program code identified in file system name space
EP0504515A3 (en) * 1991-03-22 1993-05-26 John Fluke Mfg. Co., Inc. Memory emulation test system in which undesirable microprocessor reset is precluded
US5325365A (en) * 1991-10-04 1994-06-28 John Fluke Mfg. Co., Inc. In a memory emulation test apparatus, a method of and system for fast functional testing of memories in microprocessor-based units
DE4142161C2 (de) * 1991-12-20 1994-05-11 Nikolaus Dr Techn Tichawa Busemulationsvorrichtung
US5313618A (en) * 1992-09-03 1994-05-17 Metalink Corp. Shared bus in-circuit emulator system and method
JPH0798692A (ja) * 1993-05-31 1995-04-11 Mitsubishi Electric Corp マイクロコンピュータ
US5572665A (en) * 1994-04-21 1996-11-05 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit for developing a system using a microprocessor
US5551013A (en) * 1994-06-03 1996-08-27 International Business Machines Corporation Multiprocessor for hardware emulation
GB2293254B (en) * 1994-07-12 1999-05-19 David Brian Doo A new, fast method of debugging embedded software for almost any microprocessor
US5819065A (en) * 1995-06-28 1998-10-06 Quickturn Design Systems, Inc. System and method for emulating memory
US5787270A (en) * 1995-11-15 1998-07-28 Advanced Micro Devices Method and apparatus for intrusive testing of the performance-enhancing features of an advanced microprocessor
US7421066B1 (en) * 1996-06-12 2008-09-02 Estech Systems, Inc. Telephone call/voice processing system
US5881224A (en) * 1996-09-10 1999-03-09 Hewlett-Packard Company Apparatus and method for tracking events in a microprocessor that can retire more than one instruction during a clock cycle
US5887003A (en) * 1996-09-10 1999-03-23 Hewlett-Packard Company Apparatus and method for comparing a group of binary fields with an expected pattern to generate match results
US5867644A (en) * 1996-09-10 1999-02-02 Hewlett Packard Company System and method for on-chip debug support and performance monitoring in a microprocessor
US6003107A (en) * 1996-09-10 1999-12-14 Hewlett-Packard Company Circuitry for providing external access to signals that are internal to an integrated circuit chip package
US5956476A (en) * 1996-10-31 1999-09-21 Hewlett Packard Company Circuitry and method for detecting signal patterns on a bus using dynamically changing expected patterns
US5956477A (en) * 1996-11-25 1999-09-21 Hewlett-Packard Company Method for processing information in a microprocessor to facilitate debug and performance monitoring
US6009539A (en) * 1996-11-27 1999-12-28 Hewlett-Packard Company Cross-triggering CPUs for enhanced test operations in a multi-CPU computer system
US5881217A (en) * 1996-11-27 1999-03-09 Hewlett-Packard Company Input comparison circuitry and method for a programmable state machine
US5937154A (en) * 1997-03-05 1999-08-10 Hewlett-Packard Company Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port
US5968188A (en) 1998-03-10 1999-10-19 Grammar Engine System for providing real-time code coverage
US6374370B1 (en) 1998-10-30 2002-04-16 Hewlett-Packard Company Method and system for flexible control of BIST registers based upon on-chip events
JP3943277B2 (ja) * 1999-03-23 2007-07-11 セイコーエプソン株式会社 マイクロコンピュータ及び電子機器
JP2001184225A (ja) * 1999-12-27 2001-07-06 Toshiba Microelectronics Corp エミュレータ及びエミュレート方法
US20020038433A1 (en) * 2000-06-28 2002-03-28 Z-World, Inc. System and method for utilizing programmed multi-speed operation with a microprocessor to reduce power consumption
US6629048B1 (en) * 2000-11-20 2003-09-30 Tektronix, Inc. Measurement test instrument and associated voltage management system for accessory device
TW490637B (en) * 2001-01-16 2002-06-11 Ind Tech Res Inst Memory emulator for simulating memory components of different interface specification and not restrained to memory space
TWI220192B (en) * 2001-11-06 2004-08-11 Mediatek Inc Memory access method and apparatus in ICE system
US7076711B1 (en) 2002-06-10 2006-07-11 Cisco Technology, Inc. Automatic testing of microprocessor bus integrity
US7096322B1 (en) * 2003-10-10 2006-08-22 Unisys Corporation Instruction processor write buffer emulation using embedded emulation control instructions
TWI270803B (en) * 2004-10-08 2007-01-11 Via Tech Inc Adapter for memory simulator
TWI254855B (en) * 2004-10-08 2006-05-11 Via Tech Inc Memory simulation device and method thereof
CN100384159C (zh) * 2005-04-02 2008-04-23 华为技术有限公司 评估系统处理能力的仿真方法
US7532492B2 (en) * 2005-12-20 2009-05-12 Tektronix, Inc. Host controlled voltage input system for an accessory device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4192451A (en) * 1978-05-30 1980-03-11 Tektronix, Inc. Digital diagnostic system employing signature analysis
US4277827A (en) * 1979-01-02 1981-07-07 Texas Instruments Incorporated Microprocessor based system for the development and emulation of programmable calculator control read only memory software
US4455654B1 (en) * 1981-06-05 1991-04-30 Test apparatus for electronic assemblies employing a microprocessor
US4554630A (en) * 1981-08-24 1985-11-19 Genrad, Inc. Control apparatus for back-driving computer memory and forcing execution of idle loop program in external memory
US4740895A (en) * 1981-08-24 1988-04-26 Genrad, Inc. Method of and apparatus for external control of computer program flow
GB8413933D0 (en) * 1984-05-31 1984-07-04 Columbia Automation Ltd Emulating timing characteristics of microprocessor
US4691316A (en) * 1985-02-14 1987-09-01 Support Technologies, Inc. ROM emulator for diagnostic tester
JPS61229133A (ja) * 1985-04-03 1986-10-13 Nec Corp シングルチツプマイクロコンピユ−タ用エミユレ−タ
US4674089A (en) * 1985-04-16 1987-06-16 Intel Corporation In-circuit emulator

Also Published As

Publication number Publication date
US4868822A (en) 1989-09-19
GB8902789D0 (en) 1989-03-30
DE3903835C2 (fr) 1992-11-26
CN1035191A (zh) 1989-08-30
GB2216300A (en) 1989-10-04
CN1018097B (zh) 1992-09-02
JPH01251141A (ja) 1989-10-06
DE3903835A1 (de) 1989-08-31
GB2216300B (en) 1992-07-08
FR2627594A1 (fr) 1989-08-25

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