FR2591753B1 - Procede d'auto-etalonnage pour des condensateurs dans un circuit integre monolithique - Google Patents
Procede d'auto-etalonnage pour des condensateurs dans un circuit integre monolithiqueInfo
- Publication number
- FR2591753B1 FR2591753B1 FR868617487A FR8617487A FR2591753B1 FR 2591753 B1 FR2591753 B1 FR 2591753B1 FR 868617487 A FR868617487 A FR 868617487A FR 8617487 A FR8617487 A FR 8617487A FR 2591753 B1 FR2591753 B1 FR 2591753B1
- Authority
- FR
- France
- Prior art keywords
- capacitors
- self
- integrated circuit
- calibration method
- monolithic integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
- H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/809,530 US4709225A (en) | 1985-12-16 | 1985-12-16 | Self-calibration method for capacitors in a monolithic integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2591753A1 FR2591753A1 (fr) | 1987-06-19 |
FR2591753B1 true FR2591753B1 (fr) | 1989-09-15 |
Family
ID=25201542
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR868617487A Expired FR2591753B1 (fr) | 1985-12-16 | 1986-12-15 | Procede d'auto-etalonnage pour des condensateurs dans un circuit integre monolithique |
Country Status (4)
Country | Link |
---|---|
US (1) | US4709225A (fr) |
JP (1) | JPS62145854A (fr) |
DE (1) | DE3642070A1 (fr) |
FR (1) | FR2591753B1 (fr) |
Families Citing this family (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4903024A (en) * | 1987-10-23 | 1990-02-20 | Westinghouse Electric Corp. | A/D converter system with error correction and calibration apparatus and method |
EP0360914B1 (fr) * | 1988-09-30 | 1994-07-27 | Siemens Aktiengesellschaft | Convertisseurs A/N et N/A à auto-étalonnage |
DE3941323C2 (de) * | 1988-12-14 | 1994-04-21 | Fraunhofer Ges Forschung | Halbleiterelement mit einer integrierten Induktivität und Verfahren zu seiner Herstellung |
DE3922977A1 (de) * | 1989-07-12 | 1991-01-24 | Texas Instruments Deutschland | Trimmschaltung und unter verwendung einer solchen trimmschaltung ausfuehrbares abgleichverfahren |
US4989002A (en) * | 1990-02-12 | 1991-01-29 | Texas Instruments Incorporated | Common-mode error self-calibration circuit and method of operation |
US5235335A (en) * | 1992-06-02 | 1993-08-10 | Texas Instruments Incorporated | Circuit and method for tuning capacitor arrays |
US5319370A (en) * | 1992-08-31 | 1994-06-07 | Crystal Semiconductor, Inc. | Analog-to-digital converter with a continuously calibrated voltage reference |
DE4313745A1 (de) * | 1993-04-27 | 1994-11-03 | Bosch Gmbh Robert | Verfahren zur Kompensation von Bauteiletoleranzen in Analog-Digital-Konvertern |
US5446420A (en) * | 1993-08-25 | 1995-08-29 | Motorola, Inc. | Method and apparatus for reducing jitter and improving testability of an oscillator |
US5434569A (en) * | 1993-09-01 | 1995-07-18 | Texas Instruments Incorporated | Methods for adjusting the coupling capacitor of a multi-stage weighted capacitor A/D converter |
US5600322A (en) * | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS analog-to-digital converter |
EP0757861B1 (fr) * | 1994-04-29 | 1998-12-30 | Analog Devices, Inc. | Convertisseur a/n a redistribution de charge et etalonnage du systeme |
US5600275A (en) * | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS comparator with offset cancellation |
US5583501A (en) * | 1994-08-24 | 1996-12-10 | Crystal Semiconductor Corporation | Digital-to-analog converter with digital linearity correction |
US5594439A (en) * | 1994-08-24 | 1997-01-14 | Crystal Semiconductor Corporation | Diagnosing problems in an electrical system by monitoring changes in nonlinear characteristics |
US5594612A (en) * | 1994-08-24 | 1997-01-14 | Crystal Semiconductor Corporation | Analog-to-digital converter with digital linearity correction |
US5621406A (en) * | 1994-09-29 | 1997-04-15 | Rosemount Inc. | System for calibrating analog-to-digital converter |
US5668551A (en) * | 1995-01-18 | 1997-09-16 | Analog Devices, Inc. | Power-up calibration of charge redistribution analog-to-digital converter |
US5621409A (en) * | 1995-02-15 | 1997-04-15 | Analog Devices, Inc. | Analog-to-digital conversion with multiple charge balance conversions |
DE19512495C1 (de) * | 1995-04-04 | 1996-08-14 | Siemens Ag | Verfahren zur Selbstkalibrierung eines A/D- oder D/A-Wandlers |
EP0780851B1 (fr) * | 1995-12-20 | 2003-06-11 | International Business Machines Corporation | Circuit intégré semiconducteur avec des structures de résistance ajustables électriquement |
US5905398A (en) * | 1997-04-08 | 1999-05-18 | Burr-Brown Corporation | Capacitor array having user-adjustable, manufacturer-trimmable capacitance and method |
US6194946B1 (en) | 1998-05-07 | 2001-02-27 | Burr-Brown Corporation | Method and circuit for compensating the non-linearity of capacitors |
DE69915251D1 (de) * | 1999-03-24 | 2004-04-08 | St Microelectronics Srl | Analog-Digital-Wandler mit Eintakteingang |
US6424276B1 (en) * | 1999-09-09 | 2002-07-23 | Cirrus Logic, Inc. | Successive approximation algorithm-based architectures and systems |
US6348885B1 (en) * | 1999-09-09 | 2002-02-19 | Cirrus Logic, Inc. | System and method for digitally calibrating an analog-to-digital converter |
US6448845B2 (en) | 1999-09-30 | 2002-09-10 | Koninklijke Philips Electronics N.V. | Trimmable reference generator |
US6590517B1 (en) | 1999-10-22 | 2003-07-08 | Eric J. Swanson | Analog to digital conversion circuitry including backup conversion circuitry |
US6414619B1 (en) | 1999-10-22 | 2002-07-02 | Eric J. Swanson | Autoranging analog to digital conversion circuitry |
US6369740B1 (en) | 1999-10-22 | 2002-04-09 | Eric J. Swanson | Programmable gain preamplifier coupled to an analog to digital converter |
US6310518B1 (en) | 1999-10-22 | 2001-10-30 | Eric J. Swanson | Programmable gain preamplifier |
US6476751B1 (en) * | 2000-03-29 | 2002-11-05 | Photobit Corporation | Low voltage analog-to-digital converters with internal reference voltage and offset |
US7224300B2 (en) * | 2001-11-30 | 2007-05-29 | Second Sight Medical Products, Inc. | Floating gate digital-to-analog converter |
US6857313B2 (en) * | 2003-03-31 | 2005-02-22 | Rochester Gauges, Inc. | Self-calibrating capacitance gauge |
US6869895B1 (en) | 2003-09-30 | 2005-03-22 | International Business Machines Corporation | Method for adjusting capacitance of an on-chip capacitor |
US7293578B2 (en) | 2004-01-22 | 2007-11-13 | Rochester Gauges, Inc. | Gauge assembly having a stop fill device |
US7921873B2 (en) | 2004-01-22 | 2011-04-12 | Rochester Gauges, Inc. | Service valve assembly having a stop-fill device and a liquid level indicating dial |
US7726334B2 (en) | 2004-01-22 | 2010-06-01 | Rochester Gauges, Inc. | Service valve assembly having a stop-fill device and remote liquid level indicator |
US7340366B2 (en) * | 2004-03-04 | 2008-03-04 | Atmel Corporation | Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means |
WO2007041378A1 (fr) * | 2005-09-30 | 2007-04-12 | Cirrus Logic, Inc. | Etalonnage d'un convertisseur analogique-numerique par approximations successives pour systeme a nombres redondants |
US7690323B2 (en) | 2007-10-31 | 2010-04-06 | Rochester Gauges, Inc. | Gauge head assembly with non-magnetic insert |
US7609184B2 (en) * | 2007-11-08 | 2009-10-27 | Advantest Corporation | D-A convert apparatus and A-D convert apparatus |
US7855610B2 (en) * | 2008-05-07 | 2010-12-21 | Qualcomm Incorporated | VCO capacitor bank trimming and calibration |
TWI367634B (en) * | 2009-02-09 | 2012-07-01 | Prolific Technology Inc | Self-calibration circuit and method for capacitors |
US8253614B1 (en) * | 2009-09-01 | 2012-08-28 | Marvell International Ltd. | Analog-to-digital conversion methods and systems |
US8688393B2 (en) | 2010-07-29 | 2014-04-01 | Medtronic, Inc. | Techniques for approximating a difference between two capacitances |
US9086450B2 (en) * | 2010-10-04 | 2015-07-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for measuring capacitances of capacitors |
US8933712B2 (en) | 2012-01-31 | 2015-01-13 | Medtronic, Inc. | Servo techniques for approximation of differential capacitance of a sensor |
US8810443B2 (en) | 2012-04-20 | 2014-08-19 | Linear Technology Corporation | Analog-to-digital converter system and method |
US9041569B2 (en) | 2013-06-28 | 2015-05-26 | Silicon Laboratories Inc. | Method and apparatus for calibration of successive approximation register analog-to-digital converters |
EP2903009A1 (fr) | 2014-02-04 | 2015-08-05 | Telefonaktiebolaget L M Ericsson (publ) | Dispositif électronique, circuit et procédé permettant d'ajuster des composants électroniques |
US10141870B2 (en) * | 2014-03-21 | 2018-11-27 | Mjg Innovations, Llc | Automated verification testing for a motor capacitor |
EP3288183B1 (fr) * | 2016-08-24 | 2021-01-13 | NXP USA, Inc. | Transistor de puissance avec commande d'harmonique |
TWI664826B (zh) | 2018-02-23 | 2019-07-01 | 立積電子股份有限公司 | 電容調整方法及電容調整裝置 |
US10673455B2 (en) * | 2018-05-11 | 2020-06-02 | Texas Instruments Incorporated | Sample and hold circuit with indefinite holding time |
US11431348B2 (en) * | 2020-02-21 | 2022-08-30 | Semiconductor Components Industries, Llc | Two-capacitor digital-to-analog converter |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4028694A (en) * | 1975-06-10 | 1977-06-07 | International Business Machines Corporation | A/D and D/A converter using C-2C ladder network |
GB1526196A (en) * | 1975-11-24 | 1978-09-27 | Plessey Co Ltd | Capacitors |
JPS5935527B2 (ja) * | 1978-04-10 | 1984-08-29 | 日本電信電話株式会社 | デイジタル・アナログ間変換器 |
JPS5797682A (en) * | 1980-12-10 | 1982-06-17 | Clarion Co Ltd | Variable capacitance device |
US4399426A (en) * | 1981-05-04 | 1983-08-16 | Tan Khen Sang | On board self-calibration of analog-to-digital and digital-to-analog converters |
DE3279857D1 (en) * | 1981-11-03 | 1989-09-07 | Texas Instruments Inc | Analog-to-digital converter |
JPS5885627A (ja) * | 1981-11-03 | 1983-05-23 | テキサス・インスツルメンツ・インコ−ポレイテツド | アナログ/デジタル変換回路 |
US4568917A (en) * | 1983-06-27 | 1986-02-04 | Motorola, Inc. | Capacitive digital to analog converter which can be trimmed up and down |
FR2574606B1 (fr) * | 1984-12-11 | 1990-05-11 | Efcis | Convertisseur numerique analogique a redistribution de charges capacitives avec autocalibration |
-
1985
- 1985-12-16 US US06/809,530 patent/US4709225A/en not_active Expired - Lifetime
-
1986
- 1986-12-09 DE DE19863642070 patent/DE3642070A1/de active Granted
- 1986-12-15 FR FR868617487A patent/FR2591753B1/fr not_active Expired
- 1986-12-15 JP JP61299798A patent/JPS62145854A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS62145854A (ja) | 1987-06-29 |
FR2591753A1 (fr) | 1987-06-19 |
US4709225A (en) | 1987-11-24 |
DE3642070A1 (de) | 1987-06-19 |
DE3642070C2 (fr) | 1990-10-04 |
JPH0350421B2 (fr) | 1991-08-01 |
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