FR2581231B1 - Memoire morte programmable electriquement - Google Patents

Memoire morte programmable electriquement

Info

Publication number
FR2581231B1
FR2581231B1 FR8506445A FR8506445A FR2581231B1 FR 2581231 B1 FR2581231 B1 FR 2581231B1 FR 8506445 A FR8506445 A FR 8506445A FR 8506445 A FR8506445 A FR 8506445A FR 2581231 B1 FR2581231 B1 FR 2581231B1
Authority
FR
France
Prior art keywords
electrically programmable
dead memory
programmable dead
memory
electrically
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR8506445A
Other languages
English (en)
Other versions
FR2581231A1 (fr
Inventor
Serge Fruhauf
Jean-Marie Gaultier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eurotechnique SA
Original Assignee
Eurotechnique SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eurotechnique SA filed Critical Eurotechnique SA
Priority to FR8506445A priority Critical patent/FR2581231B1/fr
Publication of FR2581231A1 publication Critical patent/FR2581231A1/fr
Application granted granted Critical
Publication of FR2581231B1 publication Critical patent/FR2581231B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C29/50008—Marginal testing, e.g. race, voltage or current testing of impedance
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
FR8506445A 1985-04-26 1985-04-26 Memoire morte programmable electriquement Expired - Lifetime FR2581231B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8506445A FR2581231B1 (fr) 1985-04-26 1985-04-26 Memoire morte programmable electriquement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8506445A FR2581231B1 (fr) 1985-04-26 1985-04-26 Memoire morte programmable electriquement

Publications (2)

Publication Number Publication Date
FR2581231A1 FR2581231A1 (fr) 1986-10-31
FR2581231B1 true FR2581231B1 (fr) 1991-05-03

Family

ID=9318750

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8506445A Expired - Lifetime FR2581231B1 (fr) 1985-04-26 1985-04-26 Memoire morte programmable electriquement

Country Status (1)

Country Link
FR (1) FR2581231B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01113999A (ja) * 1987-10-28 1989-05-02 Toshiba Corp 不揮発性メモリのストレステスト回路
FR2632110B1 (fr) * 1988-05-27 1990-10-12 Bendix Electronics Sa Procede et dispositif de programmation d'une memoire du type prom et memoire en faisant application

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3176810D1 (en) * 1980-12-23 1988-08-18 Fujitsu Ltd Electrically programmable non-volatile semiconductor memory device
JPS5873097A (ja) * 1981-10-27 1983-05-02 Nec Corp デコ−ダ−回路
DE3232215A1 (de) * 1982-08-30 1984-03-01 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte digitale halbleiterschaltung

Also Published As

Publication number Publication date
FR2581231A1 (fr) 1986-10-31

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Legal Events

Date Code Title Description
ST Notification of lapse