FR2449884A1 - Systeme de detection de defauts - Google Patents

Systeme de detection de defauts

Info

Publication number
FR2449884A1
FR2449884A1 FR8003716A FR8003716A FR2449884A1 FR 2449884 A1 FR2449884 A1 FR 2449884A1 FR 8003716 A FR8003716 A FR 8003716A FR 8003716 A FR8003716 A FR 8003716A FR 2449884 A1 FR2449884 A1 FR 2449884A1
Authority
FR
France
Prior art keywords
signal
provides
detection
detection system
detection circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8003716A
Other languages
English (en)
French (fr)
Other versions
FR2449884B1 (en, 2012
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Publication of FR2449884A1 publication Critical patent/FR2449884A1/fr
Application granted granted Critical
Publication of FR2449884B1 publication Critical patent/FR2449884B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Medical Preparation Storing Or Oral Administration Devices (AREA)
FR8003716A 1979-02-20 1980-02-20 Systeme de detection de defauts Granted FR2449884A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1886879A JPS55110905A (en) 1979-02-20 1979-02-20 Defect detecting device

Publications (2)

Publication Number Publication Date
FR2449884A1 true FR2449884A1 (fr) 1980-09-19
FR2449884B1 FR2449884B1 (en, 2012) 1984-11-02

Family

ID=11983513

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8003716A Granted FR2449884A1 (fr) 1979-02-20 1980-02-20 Systeme de detection de defauts

Country Status (6)

Country Link
US (1) US4302773A (en, 2012)
JP (1) JPS55110905A (en, 2012)
CA (1) CA1126855A (en, 2012)
DE (1) DE3006341A1 (en, 2012)
FR (1) FR2449884A1 (en, 2012)
GB (1) GB2046899B (en, 2012)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU553069B2 (en) * 1981-07-17 1986-07-03 W.R. Grace & Co.-Conn. Radial scan, pulsed light article inspection ccv system 0
US4598420A (en) * 1983-12-08 1986-07-01 Mts Systems Corporation Optical grid analyzer system for automatically determining strain in deformed sheet metal
GB2175396B (en) * 1985-05-22 1989-06-28 Filler Protection Developments Apparatus for examining objects
JPS6219738A (ja) * 1985-07-19 1987-01-28 Tokan Kogyo Co Ltd 使い捨てコツプのカ−ル部不良検査装置
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
US3700909A (en) * 1972-03-09 1972-10-24 Columbia Research Corp Method for detecting pinhole defects in foil material
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
DE2617111C3 (de) * 1976-04-17 1986-02-20 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zum Feststellen einer Bewegung im Überwachungsbereich einer Fernsehkamera
JPS5571937A (en) * 1978-11-24 1980-05-30 Kanebo Ltd Method of and device for inspecting surface

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam
US3700909A (en) * 1972-03-09 1972-10-24 Columbia Research Corp Method for detecting pinhole defects in foil material

Also Published As

Publication number Publication date
GB2046899B (en) 1983-10-26
US4302773A (en) 1981-11-24
GB2046899A (en) 1980-11-19
FR2449884B1 (en, 2012) 1984-11-02
JPH0157283B2 (en, 2012) 1989-12-05
JPS55110905A (en) 1980-08-27
DE3006341A1 (de) 1980-08-28
CA1126855A (en) 1982-06-29
DE3006341C2 (en, 2012) 1990-01-25

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Legal Events

Date Code Title Description
ST Notification of lapse