FR2426242A1 - Procede et appareil pour mesurer la largeur et/ou l'epaisseur d'une piece - Google Patents

Procede et appareil pour mesurer la largeur et/ou l'epaisseur d'une piece

Info

Publication number
FR2426242A1
FR2426242A1 FR7912557A FR7912557A FR2426242A1 FR 2426242 A1 FR2426242 A1 FR 2426242A1 FR 7912557 A FR7912557 A FR 7912557A FR 7912557 A FR7912557 A FR 7912557A FR 2426242 A1 FR2426242 A1 FR 2426242A1
Authority
FR
France
Prior art keywords
locations
thickness
width
measuring
location
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7912557A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
British Steel Corp
Original Assignee
British Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by British Steel Corp filed Critical British Steel Corp
Publication of FR2426242A1 publication Critical patent/FR2426242A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Suivant ce procédé, on forme une image d'un plan de la pièce en deux emplacements décalés verticalement au-dessus d'un emplacement, de référence on produit des signaux indicatifs de l'angle sous-tendu par la pièce par rapport aux emplacements des images et représentatifs des largeurs d'images apparentes en ces emplacements, on combine les signaux pour fournir des composantes de produits et de différences, et l'on calcule à partir de ces composantes la largeur réelle de la pièce lorsqu'elle se trouve à l'emplacement de référence, et/ou l'épaisseur de la pièce.
FR7912557A 1978-05-17 1979-05-17 Procede et appareil pour mesurer la largeur et/ou l'epaisseur d'une piece Withdrawn FR2426242A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2020078 1978-05-17

Publications (1)

Publication Number Publication Date
FR2426242A1 true FR2426242A1 (fr) 1979-12-14

Family

ID=10142088

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7912557A Withdrawn FR2426242A1 (fr) 1978-05-17 1979-05-17 Procede et appareil pour mesurer la largeur et/ou l'epaisseur d'une piece

Country Status (4)

Country Link
US (1) US4271477A (fr)
JP (1) JPS554587A (fr)
DE (1) DE2919858A1 (fr)
FR (1) FR2426242A1 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4402053A (en) * 1980-09-25 1983-08-30 Board Of Regents For Education For The State Of Rhode Island Estimating workpiece pose using the feature points method
US4392204A (en) * 1980-12-01 1983-07-05 Prim David F Lumber marking system
DE3135272C2 (de) * 1981-09-05 1986-10-09 Trützschler GmbH & Co KG, 4050 Mönchengladbach Verfahren und Vorrichtung zur Ermittlung der Höhe von Textilfaserballen
US4589082A (en) * 1983-01-17 1986-05-13 Westinghouse Electric Corp. Nuclear fuel rod straightness measuring system and method
US4528651A (en) * 1983-02-04 1985-07-09 Weyerhaeuser Company Method and apparatus for measurement of length and height of objects
KR910004158B1 (en) * 1983-08-15 1991-06-22 Sinagawa Sirotenga Co Ltd Thermal deformation measuring system of ceranics and the like
US5350899A (en) * 1992-04-15 1994-09-27 Hiroichi Ishikawa Semiconductor wafer temperature determination by optical measurement of wafer expansion in processing apparatus chamber
DE3624959A1 (de) * 1986-07-23 1988-01-28 Mannesmann Ag Automatisches verfahren zur beruehrungslosen dreidimensionalen vermessung von objekten grosser ausdehnung
US5099504A (en) * 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
US4787715A (en) * 1987-06-22 1988-11-29 Westinghouse Electric Corp. Fuel assembly grid inspection apparatus
US4865800A (en) * 1987-06-22 1989-09-12 Westinghouse Electric Corp. Fuel assembly grid inspection method
US4823396A (en) * 1987-07-21 1989-04-18 The Boeing Company Automated fastener inspection system
DE3806686A1 (de) * 1988-03-02 1989-09-14 Wegu Messtechnik Mehrkoordinatenmess- und -pruefeinrichtung
CA2067400A1 (fr) * 1992-04-28 1993-10-29 Robert E. Bredberg Dispositif de mesure d'epaisseur au laser
DE19539470A1 (de) * 1995-10-24 1997-04-30 Fraunhofer Ges Forschung Verfahren und Einrichtung zum Vermessen von dreidimensionalen Objekten
US6787724B2 (en) * 2001-08-24 2004-09-07 Attica Automation Sorting machine
US7394915B2 (en) * 2005-09-16 2008-07-01 Pitney Bowes Inc. Method and system for measuring thickness of an item based on imaging
US7383152B1 (en) * 2006-01-10 2008-06-03 Alliant Techsystems Inc. Non-contact deviation measurement system
DE102006024761A1 (de) * 2006-05-27 2007-11-29 Sms Demag Ag Vorrichtung zum Messen der Breite und/oder der Bandlage eines Metallbandes oder einer Bramme
US7903265B2 (en) * 2008-04-04 2011-03-08 Toyota Motor Engineering & Manufacturing North America, Inc. Method for measuring coating uniformity
WO2012171627A1 (fr) * 2011-06-14 2012-12-20 Tata Steel Nederland Technology B.V. Procédé et dispositif pour déterminer une caractéristique de suivi et/ou une largeur de bande d'une bande mobile
GB2513653A (en) * 2013-05-03 2014-11-05 Siemens Plc Hot metal detector

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1009566A (en) * 1963-03-21 1965-11-10 A C Cosser Ltd An electro-optical gauge for linear measurement
US3773422A (en) * 1971-04-07 1973-11-20 Singer Co Calculating linear dimensions from tv images
DE2602865A1 (de) * 1975-01-29 1976-08-05 Centre Rech Metallurgique Verfahren und vorrichtung zum messen der dicke eines produktes

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3565531A (en) * 1969-03-12 1971-02-23 Sanders Associates Inc Electro-optical thickness measurement apparatus
US3671726A (en) * 1969-05-23 1972-06-20 Morvue Inc Electro-optical apparatus for precise on-line measurement of the thickness of moving strip material
FR2082717A5 (fr) * 1970-03-25 1971-12-10 Cellophane Sa
US3802774A (en) * 1971-05-17 1974-04-09 Siemens Ag Method and apparatus for determining the thickness or width of work pieces
JPS5124258A (en) * 1974-08-23 1976-02-27 Shinri Kogyo Kk Idobutsutaino sunhosokuteisochi
US4063820A (en) * 1975-11-10 1977-12-20 Rca Corporation Apparatus for measuring a dimension of an object
US4033697A (en) * 1976-05-17 1977-07-05 Reticon Corporation Automatic exposure control for a luminous object monitor system
US4152767A (en) * 1976-09-27 1979-05-01 Atmospheric Sciences, Inc. Method and apparatus for measuring dimensions
US4173788A (en) * 1976-09-27 1979-11-06 Atmospheric Sciences, Inc. Method and apparatus for measuring dimensions
US4160599A (en) * 1977-12-08 1979-07-10 Universal Technology, Inc. Optical gaging system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1009566A (en) * 1963-03-21 1965-11-10 A C Cosser Ltd An electro-optical gauge for linear measurement
US3773422A (en) * 1971-04-07 1973-11-20 Singer Co Calculating linear dimensions from tv images
DE2602865A1 (de) * 1975-01-29 1976-08-05 Centre Rech Metallurgique Verfahren und vorrichtung zum messen der dicke eines produktes

Also Published As

Publication number Publication date
US4271477A (en) 1981-06-02
DE2919858A1 (de) 1979-11-22
JPS554587A (en) 1980-01-14

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Legal Events

Date Code Title Description
ST Notification of lapse