FR2410815A1 - OPTICAL MEASURING DEVICE USING A SEMICONDUCTOR LASER - Google Patents

OPTICAL MEASURING DEVICE USING A SEMICONDUCTOR LASER

Info

Publication number
FR2410815A1
FR2410815A1 FR7833786A FR7833786A FR2410815A1 FR 2410815 A1 FR2410815 A1 FR 2410815A1 FR 7833786 A FR7833786 A FR 7833786A FR 7833786 A FR7833786 A FR 7833786A FR 2410815 A1 FR2410815 A1 FR 2410815A1
Authority
FR
France
Prior art keywords
optical
semiconductor laser
transmissible
modulated
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7833786A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of FR2410815A1 publication Critical patent/FR2410815A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Semiconductor Lasers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Abstract

POUR DETECTER UNE INFORMATION COMME LE POINT DE RUPTURE DANS UNE FIBRE OPTIQUE, LA PRESENTE INVENTION UTILISE UN PHENOMENE PARTICULIER D'UN LASER SEMI-CONDUCTEUR, A SAVOIR QUE LE RAYON OPTIQUE DU LASER EST MODULE PAR UNE ONDE REFLECHIE DANS UN SUPPORT TRANSMISSIBLE ET LA FREQUENCE MODULEE A UNE RELATION PREDETERMINEE AVEC LE POINT DE REFLEXION. LE SYSTEME DE MESURE OPTIQUE SUIVANT LA PRESENTE INVENTION EST CONSTRUIT D'UN LASER SEMI-CONDUCTEUR, D'UN SUPPORT TRANSMISSIBLE OPTIQUE, D'UN SYSTEME DE CONNEXION RELIANT DE FACON OPTIQUE LE LASER AU SUPPORT TRANSMISSIBLE OPTIQUE ET D'UN ANALYSEUR DE FREQUENCE QUI DETECTE LA FREQUENCE MODULEE.TO DETECT AN INFORMATION SUCH AS THE BREAK POINT IN AN OPTICAL FIBER, THE PRESENT INVENTION USES A PARTICULAR PHENOMENON OF A SEMICONDUCTOR LASER, KNOWING THAT THE OPTICAL RADIUS OF THE LASER IS MODULATED BY A WAVE REFLECTED IN A TRANSMISSIBLE SUPPORT AND THE FREQUENCY MODULATED TO A PREDETERMINED RELATIONSHIP WITH THE REFLECTION POINT. THE OPTICAL MEASURING SYSTEM FOLLOWING THE PRESENT INVENTION IS CONSTRUCTED OF A SEMICONDUCTOR LASER, OF AN OPTICAL TRANSMISSIBLE SUPPORT, A CONNECTION SYSTEM OPTICALLY CONNECTING THE LASER TO THE TRANSMISSIBLE OPTICAL SUPPORT AND OF A FREQUENCY ANALYZER WHICH DETECTS MODULATED FREQUENCY.

FR7833786A 1977-12-05 1978-11-30 OPTICAL MEASURING DEVICE USING A SEMICONDUCTOR LASER Withdrawn FR2410815A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14496777A JPS5478156A (en) 1977-12-05 1977-12-05 Detector of break point of optical fibers

Publications (1)

Publication Number Publication Date
FR2410815A1 true FR2410815A1 (en) 1979-06-29

Family

ID=15374346

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7833786A Withdrawn FR2410815A1 (en) 1977-12-05 1978-11-30 OPTICAL MEASURING DEVICE USING A SEMICONDUCTOR LASER

Country Status (5)

Country Link
JP (1) JPS5478156A (en)
DE (1) DE2852614B2 (en)
FR (1) FR2410815A1 (en)
GB (1) GB2011751A (en)
NL (1) NL7811878A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2756053A1 (en) * 1996-11-21 1998-05-22 Quantel DEVICE FOR DETECTING DAMAGE IN AN OPTICAL FIBER

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5743486A (en) * 1980-08-13 1982-03-11 Agency Of Ind Science & Technol Semiconductor ring laser device
JPS5779425A (en) * 1980-11-04 1982-05-18 Nippon Telegr & Teleph Corp <Ntt> Light base band oscillator using semiconductor laser
DE3126356A1 (en) * 1981-07-03 1983-01-20 Siemens AG, 1000 Berlin und 8000 München PROCESS FOR CHECKING OBJECTS
JPS6071934A (en) * 1983-09-29 1985-04-23 Sumitomo Electric Ind Ltd Spot size measuring method of single mode fiber
JPS6086438A (en) * 1983-10-18 1985-05-16 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus for testing optical fiber
US4564756A (en) * 1984-01-06 1986-01-14 International Business Machines Corporation Proximity sensor with a light-emitting diode which simultaneously emits and detects light
IT1179209B (en) * 1984-06-13 1987-09-16 Bordoni Ugo Fondazione METHOD FOR THE DETECTION OF BREAKS IN A FIBER OPTIC CABLE
JPH04274724A (en) * 1991-03-02 1992-09-30 Fujikura Ltd Otdr apparatus
FR2769091B1 (en) * 1997-09-30 1999-12-17 Univ Joseph Fourier ACTIVE OPTICAL DETECTOR
EP1632766A1 (en) * 2004-09-03 2006-03-08 Alcatel Procedure for testing an optical transmission line by reflectometry, optical device and optical transmission and receiving device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2293709A1 (en) * 1974-12-07 1976-07-02 Licentia Gmbh METHOD OF LOCATING FAULTS IN FIBERGLASS LIGHT GUIDES

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2293709A1 (en) * 1974-12-07 1976-07-02 Licentia Gmbh METHOD OF LOCATING FAULTS IN FIBERGLASS LIGHT GUIDES

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
EXBK/72 *
EXBK/73 *
EXBK/76 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2756053A1 (en) * 1996-11-21 1998-05-22 Quantel DEVICE FOR DETECTING DAMAGE IN AN OPTICAL FIBER
EP0844472A1 (en) * 1996-11-21 1998-05-27 Quantel Device for detecting damage in an optical fibre

Also Published As

Publication number Publication date
DE2852614B2 (en) 1980-01-31
DE2852614A1 (en) 1979-06-07
JPS5478156A (en) 1979-06-22
NL7811878A (en) 1979-06-07
GB2011751A (en) 1979-07-11

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Legal Events

Date Code Title Description
ST Notification of lapse