FR2399660A1 - Dispositif pour l'analyse d'echantillons - Google Patents

Dispositif pour l'analyse d'echantillons

Info

Publication number
FR2399660A1
FR2399660A1 FR7823012A FR7823012A FR2399660A1 FR 2399660 A1 FR2399660 A1 FR 2399660A1 FR 7823012 A FR7823012 A FR 7823012A FR 7823012 A FR7823012 A FR 7823012A FR 2399660 A1 FR2399660 A1 FR 2399660A1
Authority
FR
France
Prior art keywords
analysis
samples
ion optic
illuminating
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7823012A
Other languages
English (en)
Other versions
FR2399660B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balzers und Leybold Deutschland Holding AG
Original Assignee
Leybold Heraeus GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19772734918 external-priority patent/DE2734918A1/de
Priority claimed from DE2739828A external-priority patent/DE2739828C2/de
Application filed by Leybold Heraeus GmbH filed Critical Leybold Heraeus GmbH
Publication of FR2399660A1 publication Critical patent/FR2399660A1/fr
Application granted granted Critical
Publication of FR2399660B1 publication Critical patent/FR2399660B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Dispositif pour l'analyse d'échantillons par bombardement électromagnétique, puis analyse de masse des ions produits, comportant un microscope, un spectromètre de masse et des moyens d'éclairage de l'échantillon. Une optique ionique 8, 9, 10 est placée en amont du spectromètre de masse. L'optique ionique et une partie au moins des moyens 18, 19 d'éclairage de l'échantillon 6 coulissent ou pivotent perpendiculairement à l'axe de l'optique ionique.
FR7823012A 1977-08-03 1978-08-03 Dispositif pour l'analyse d'echantillons Granted FR2399660A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19772734918 DE2734918A1 (de) 1977-08-03 1977-08-03 Einrichtung zur analyse von proben
DE2739828A DE2739828C2 (de) 1977-09-03 1977-09-03 Einrichtung zur Analyse von Proben

Publications (2)

Publication Number Publication Date
FR2399660A1 true FR2399660A1 (fr) 1979-03-02
FR2399660B1 FR2399660B1 (fr) 1983-10-07

Family

ID=25772453

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7823012A Granted FR2399660A1 (fr) 1977-08-03 1978-08-03 Dispositif pour l'analyse d'echantillons

Country Status (2)

Country Link
FR (1) FR2399660A1 (fr)
GB (1) GB2002169B (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2582149A1 (fr) * 1984-07-26 1986-11-21 Japan Res Dev Corp Appareil pour la croissance d'un cristal semiconducteur
WO1999058939A1 (fr) * 1998-05-09 1999-11-18 Renishaw Plc Microscope electronique et systeme de spectroscopie
US6885445B2 (en) 1998-05-09 2005-04-26 Renishaw Plc Electron microscope and spectroscopy system

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8707516D0 (en) * 1987-03-30 1987-05-07 Vg Instr Group Surface analysis
JP2006032109A (ja) * 2004-07-15 2006-02-02 Jeol Ltd 垂直加速型飛行時間型質量分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2141387A1 (de) * 1971-08-18 1973-02-22 Ernst Dr Remy Verfahren zur auf mikrobereiche beschraenkten verdampfung, zerstoerung, anregung und/oder ionisierung von probenmaterial sowie anordnung zur durchfuehrung des verfahrens

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2141387A1 (de) * 1971-08-18 1973-02-22 Ernst Dr Remy Verfahren zur auf mikrobereiche beschraenkten verdampfung, zerstoerung, anregung und/oder ionisierung von probenmaterial sowie anordnung zur durchfuehrung des verfahrens

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/75 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2582149A1 (fr) * 1984-07-26 1986-11-21 Japan Res Dev Corp Appareil pour la croissance d'un cristal semiconducteur
WO1999058939A1 (fr) * 1998-05-09 1999-11-18 Renishaw Plc Microscope electronique et systeme de spectroscopie
US6885445B2 (en) 1998-05-09 2005-04-26 Renishaw Plc Electron microscope and spectroscopy system

Also Published As

Publication number Publication date
GB2002169B (en) 1982-01-06
GB2002169A (en) 1979-02-14
FR2399660B1 (fr) 1983-10-07

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse