FR2392495A1 - Procede de realisation de dispositifs semi-conducteurs a reseau de conducteurs mono ou multicouche et dispositifs ainsi obtenus - Google Patents
Procede de realisation de dispositifs semi-conducteurs a reseau de conducteurs mono ou multicouche et dispositifs ainsi obtenusInfo
- Publication number
- FR2392495A1 FR2392495A1 FR7715895A FR7715895A FR2392495A1 FR 2392495 A1 FR2392495 A1 FR 2392495A1 FR 7715895 A FR7715895 A FR 7715895A FR 7715895 A FR7715895 A FR 7715895A FR 2392495 A1 FR2392495 A1 FR 2392495A1
- Authority
- FR
- France
- Prior art keywords
- auxiliary layer
- active surface
- recess
- parts
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004020 conductor Substances 0.000 title abstract 4
- 239000004642 Polyimide Substances 0.000 title abstract 3
- 229920001721 polyimide Polymers 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 239000004952 Polyamide Substances 0.000 title abstract 2
- 229920002647 polyamide Polymers 0.000 title abstract 2
- 238000000034 method Methods 0.000 abstract 4
- 238000000151 deposition Methods 0.000 abstract 3
- 239000004962 Polyamide-imide Substances 0.000 abstract 1
- 239000002253 acid Substances 0.000 abstract 1
- 150000007513 acids Chemical class 0.000 abstract 1
- 230000015556 catabolic process Effects 0.000 abstract 1
- 238000006731 degradation reaction Methods 0.000 abstract 1
- 239000003989 dielectric material Substances 0.000 abstract 1
- 238000005530 etching Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 229920002312 polyamide-imide Polymers 0.000 abstract 1
- 230000001681 protective effect Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02118—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/0217—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0272—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers for lift-off processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
- H01L21/7688—Filling of holes, grooves or trenches, e.g. vias, with conductive material by deposition over sacrificial masking layer, e.g. lift-off
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Procédé de réalisation de la configuration des conducteurs assurant les liaisons électriques sur un cristal semi-conducteur. La configuration est créée dans une pellicule conductrice dont des nappes reposant sur une couche auxiliaire sont éliminées lorsqu'on élimine ladite couche auxiliaire, cette couche auxiliaire étant en un corps choisi parmi les polyimides, les polyamides-imides, les polyimides modifiés par un amide, les acides polyamides, les polyamino-imides. Application aux circuits intégrés à configuration de conducteurs multicouche.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7715895A FR2392495A1 (fr) | 1977-05-25 | 1977-05-25 | Procede de realisation de dispositifs semi-conducteurs a reseau de conducteurs mono ou multicouche et dispositifs ainsi obtenus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7715895A FR2392495A1 (fr) | 1977-05-25 | 1977-05-25 | Procede de realisation de dispositifs semi-conducteurs a reseau de conducteurs mono ou multicouche et dispositifs ainsi obtenus |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2392495A1 true FR2392495A1 (fr) | 1978-12-22 |
FR2392495B1 FR2392495B1 (fr) | 1980-01-04 |
Family
ID=9191237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7715895A Granted FR2392495A1 (fr) | 1977-05-25 | 1977-05-25 | Procede de realisation de dispositifs semi-conducteurs a reseau de conducteurs mono ou multicouche et dispositifs ainsi obtenus |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2392495A1 (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0028994A2 (fr) * | 1979-11-09 | 1981-05-20 | Rhone-Poulenc Specialites Chimiques | Compositions et procédé d'encapsulation de composants électroniques à l'aide d'une matière moulable à base d'un prépolymère thermodurcissable |
EP0090612A2 (fr) * | 1982-03-26 | 1983-10-05 | Unisys Corporation | Procédé de fabrication de dispositifs à jonction Josephson |
EP0100735A2 (fr) * | 1982-08-02 | 1984-02-15 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Procédé de "lift-off" pour la fabrication de contacts autoalignés |
EP0261400A2 (fr) * | 1986-08-27 | 1988-03-30 | Hitachi, Ltd. | Procédé de "lift-off" pour la formation d'une configuration métallique sur un substrat |
EP0285245A1 (fr) * | 1987-02-27 | 1988-10-05 | AT&T Corp. | Construction d'un dispositif à l'aide de la planarisation |
EP0805489A2 (fr) * | 1996-04-29 | 1997-11-05 | Applied Materials, Inc. | Remplissage selectif des trous de liaison utilisant une couche sacrificielle |
-
1977
- 1977-05-25 FR FR7715895A patent/FR2392495A1/fr active Granted
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0028994A2 (fr) * | 1979-11-09 | 1981-05-20 | Rhone-Poulenc Specialites Chimiques | Compositions et procédé d'encapsulation de composants électroniques à l'aide d'une matière moulable à base d'un prépolymère thermodurcissable |
FR2469421A1 (fr) * | 1979-11-09 | 1981-05-22 | Rhone Poulenc Ind | Procede d'encapsulation de composants electroniques a l'aide d'une matiere moulable a base d'un prepolymere thermodurcissable |
EP0028994A3 (en) * | 1979-11-09 | 1981-05-27 | Rhone-Poulenc Specialites Chimiques | Process for the encapsulation of electronic components with the aid of a mouldable material based on a thermosetting prepolymer, and articles obtained by this process |
EP0090612A3 (en) * | 1982-03-26 | 1986-10-15 | Sperry Corporation | Method of making josephson junction devices |
EP0090612A2 (fr) * | 1982-03-26 | 1983-10-05 | Unisys Corporation | Procédé de fabrication de dispositifs à jonction Josephson |
EP0100735A2 (fr) * | 1982-08-02 | 1984-02-15 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Procédé de "lift-off" pour la fabrication de contacts autoalignés |
EP0100735A3 (en) * | 1982-08-02 | 1984-10-24 | Fairchild Camera & Instrument Corporation | Lift-off process for fabricating self-aligned contacts |
EP0261400A2 (fr) * | 1986-08-27 | 1988-03-30 | Hitachi, Ltd. | Procédé de "lift-off" pour la formation d'une configuration métallique sur un substrat |
EP0261400A3 (en) * | 1986-08-27 | 1989-05-24 | Hitachi, Ltd. | Lift-off process for forming wiring on a substrate |
US4886573A (en) * | 1986-08-27 | 1989-12-12 | Hitachi, Ltd. | Process for forming wiring on substrate |
EP0285245A1 (fr) * | 1987-02-27 | 1988-10-05 | AT&T Corp. | Construction d'un dispositif à l'aide de la planarisation |
EP0805489A2 (fr) * | 1996-04-29 | 1997-11-05 | Applied Materials, Inc. | Remplissage selectif des trous de liaison utilisant une couche sacrificielle |
EP0805489A3 (fr) * | 1996-04-29 | 1999-02-03 | Applied Materials, Inc. | Remplissage selectif des trous de liaison utilisant une couche sacrificielle |
Also Published As
Publication number | Publication date |
---|---|
FR2392495B1 (fr) | 1980-01-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |