FR2382091B1 - - Google Patents

Info

Publication number
FR2382091B1
FR2382091B1 FR7800742A FR7800742A FR2382091B1 FR 2382091 B1 FR2382091 B1 FR 2382091B1 FR 7800742 A FR7800742 A FR 7800742A FR 7800742 A FR7800742 A FR 7800742A FR 2382091 B1 FR2382091 B1 FR 2382091B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7800742A
Other languages
French (fr)
Other versions
FR2382091A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2382091A1 publication Critical patent/FR2382091A1/en
Application granted granted Critical
Publication of FR2382091B1 publication Critical patent/FR2382091B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3007Electron or ion-optical systems
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
FR7800742A 1977-02-23 1978-01-05 METHOD AND DEVICE FOR FORMING AN ELECTRONIC HARNESS OF VARIABLE SIZE Granted FR2382091A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US77123577A 1977-02-23 1977-02-23

Publications (2)

Publication Number Publication Date
FR2382091A1 FR2382091A1 (en) 1978-09-22
FR2382091B1 true FR2382091B1 (en) 1982-04-09

Family

ID=25091155

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7800742A Granted FR2382091A1 (en) 1977-02-23 1978-01-05 METHOD AND DEVICE FOR FORMING AN ELECTRONIC HARNESS OF VARIABLE SIZE

Country Status (9)

Country Link
JP (1) JPS53124078A (en)
BR (1) BR7801031A (en)
CA (1) CA1166766A (en)
DE (1) DE2805371C2 (en)
FR (1) FR2382091A1 (en)
GB (1) GB1587852A (en)
IT (1) IT1158434B (en)
NL (1) NL7802010A (en)
SE (1) SE437441B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS543476A (en) * 1977-06-09 1979-01-11 Jeol Ltd Electron beam exposure device
GB1598219A (en) * 1977-08-10 1981-09-16 Ibm Electron beam system
JPS5679429A (en) * 1979-12-03 1981-06-30 Chiyou Lsi Gijutsu Kenkyu Kumiai Electron beam exposure process
DE3169257D1 (en) * 1980-11-28 1985-04-18 Ibm Electron beam system and method
US4423305A (en) * 1981-07-30 1983-12-27 International Business Machines Corporation Method and apparatus for controlling alignment of an electron beam of a variable shape
JPS5928336A (en) * 1982-08-09 1984-02-15 Nippon Telegr & Teleph Corp <Ntt> Pattern forming method
CN116441562B (en) * 2023-06-16 2023-08-15 西安赛隆增材技术股份有限公司 Device and method for calibrating beam spot of electron beam

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL6807439A (en) * 1968-05-27 1969-12-01
US3644700A (en) * 1969-12-15 1972-02-22 Ibm Method and apparatus for controlling an electron beam
US3801792A (en) * 1973-05-23 1974-04-02 Bell Telephone Labor Inc Electron beam apparatus
JPS5251871A (en) * 1975-10-23 1977-04-26 Rikagaku Kenkyusho Projecting method for charge particle beams
JPS5283177A (en) * 1975-12-31 1977-07-11 Fujitsu Ltd Electron beam exposure device
GB1557924A (en) * 1976-02-05 1979-12-19 Western Electric Co Irradiation apparatus and methods
NL177578C (en) * 1976-05-14 1985-10-16 Thomson Csf DEVICE FOR DESCRIBING AN OBJECT WITH A PARTICULAR BUNDLE.
FR2351497A1 (en) * 1976-05-14 1977-12-09 Thomson Csf Corpuscular optics lens arrangement - projects image onto object by subsequent programmed drawing of picture elements onto object (NL 16.11.77)
DE2627632A1 (en) * 1976-06-19 1977-12-22 Jenoptik Jena Gmbh Nonthermic electron beam machining - has radiation control by pulse impact point and beam cross section corresp. to specific section to be machined
JPS5320391A (en) * 1976-08-09 1978-02-24 Becton Dickinson Co Blood inspection apparatus

Also Published As

Publication number Publication date
FR2382091A1 (en) 1978-09-22
BR7801031A (en) 1978-12-12
IT7820143A0 (en) 1978-02-10
JPS53124078A (en) 1978-10-30
NL7802010A (en) 1978-08-25
JPS5424833B2 (en) 1979-08-23
SE437441B (en) 1985-02-25
DE2805371A1 (en) 1978-08-24
CA1166766A (en) 1984-05-01
DE2805371C2 (en) 1984-02-16
GB1587852A (en) 1981-04-08
IT1158434B (en) 1987-02-18
SE7801728L (en) 1978-08-24

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Legal Events

Date Code Title Description
ST Notification of lapse