FR2363882A1 - Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants - Google Patents
Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolantsInfo
- Publication number
- FR2363882A1 FR2363882A1 FR7626376A FR7626376A FR2363882A1 FR 2363882 A1 FR2363882 A1 FR 2363882A1 FR 7626376 A FR7626376 A FR 7626376A FR 7626376 A FR7626376 A FR 7626376A FR 2363882 A1 FR2363882 A1 FR 2363882A1
- Authority
- FR
- France
- Prior art keywords
- electron gun
- gun
- insulators
- examination
- ions produced
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000605 extraction Methods 0.000 title abstract 4
- 239000012212 insulator Substances 0.000 title abstract 2
- 150000002500 ions Chemical group 0.000 title abstract 2
- 238000004458 analytical method Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
- H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7626376A FR2363882A1 (fr) | 1976-09-01 | 1976-09-01 | Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7626376A FR2363882A1 (fr) | 1976-09-01 | 1976-09-01 | Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2363882A1 true FR2363882A1 (fr) | 1978-03-31 |
FR2363882B1 FR2363882B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1979-03-02 |
Family
ID=9177307
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7626376A Granted FR2363882A1 (fr) | 1976-09-01 | 1976-09-01 | Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2363882A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0150326A3 (de) * | 1984-01-31 | 1985-08-28 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zur Kompensation von Aufladungen bei der Sekundärionen-Massenspektrometrie (SIMS) elektrisch schlecht leitender Proben |
EP0200333A3 (en) * | 1985-04-24 | 1987-09-02 | Micrion Limited Partnership | Ion beam processing method and apparatus |
EP0243060A3 (en) * | 1986-04-22 | 1988-07-20 | Kratos Analytical Limited | A charged particle energy analyser |
EP0278736A3 (en) * | 1987-02-10 | 1989-11-29 | FISONS plc | Secondary ion mass spectrometer |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1349302A (fr) * | 1962-11-28 | 1964-01-17 | Centre Nat Rech Scient | Microanalyseur par émission ionique secondaire |
-
1976
- 1976-09-01 FR FR7626376A patent/FR2363882A1/fr active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1349302A (fr) * | 1962-11-28 | 1964-01-17 | Centre Nat Rech Scient | Microanalyseur par émission ionique secondaire |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0150326A3 (de) * | 1984-01-31 | 1985-08-28 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zur Kompensation von Aufladungen bei der Sekundärionen-Massenspektrometrie (SIMS) elektrisch schlecht leitender Proben |
EP0200333A3 (en) * | 1985-04-24 | 1987-09-02 | Micrion Limited Partnership | Ion beam processing method and apparatus |
EP0243060A3 (en) * | 1986-04-22 | 1988-07-20 | Kratos Analytical Limited | A charged particle energy analyser |
EP0278736A3 (en) * | 1987-02-10 | 1989-11-29 | FISONS plc | Secondary ion mass spectrometer |
Also Published As
Publication number | Publication date |
---|---|
FR2363882B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1979-03-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1509697A (en) | Variable energy ion beam source and analytical apparatus incorporating same | |
GB1145107A (en) | Ion beam microanalyser | |
GB1399588A (en) | Instrument for secondary ion mass spectrometry | |
GB1531505A (en) | Method and apparatus for extracting well-formed high current ion beams from a plasma source | |
GB1450498A (en) | Apparatus for determining the energy of charged particles | |
GB1178406A (en) | Electron Gun Including an Ion Trap. | |
FR2363882A1 (fr) | Analyseur ionique a emission secondaire muni d'un canon a electrons pour l'analyse des isolants | |
GB981743A (en) | Improvements in electron guns | |
GB1209520A (en) | Process for the production of pressure-sensitive transfer elements | |
GB976781A (en) | Ultra high vacuum ion gauge | |
GB1500095A (en) | Ion source using a hollow cathode discharge arrangement and a particle accelerator comprising such a source | |
JPS524772A (en) | Field-emission electron gun | |
GB1210218A (en) | Improvements relating to ion probe target analysis | |
GB908590A (en) | Charged particle gun | |
GB1225272A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
JPS5360178A (en) | Target for focusing of electron beam | |
GB928168A (en) | Improvements in or relating to mass filters including an electron impact source of ions | |
GB1038220A (en) | Improvements in ion beam microanalysers | |
GB934153A (en) | Improvements in mass spectrometers | |
GB1242031A (en) | An improved multipole mass filter | |
GB1025279A (en) | A method of and an apparatus for use in detecting ions | |
ES8400633A1 (es) | Un tubo de camara de television. | |
JPS52155959A (en) | Electron gun for cathode ray tube | |
IT1060753B (it) | Convertitore a fascio elettronico | |
FR2354630A1 (fr) | Dispositif convertisseur a faisceau electronique |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |