FR2353134A1 - Dispositifs semi-conducteurs a thyristors ayant une protection contre la rupture - Google Patents

Dispositifs semi-conducteurs a thyristors ayant une protection contre la rupture

Info

Publication number
FR2353134A1
FR2353134A1 FR7716378A FR7716378A FR2353134A1 FR 2353134 A1 FR2353134 A1 FR 2353134A1 FR 7716378 A FR7716378 A FR 7716378A FR 7716378 A FR7716378 A FR 7716378A FR 2353134 A1 FR2353134 A1 FR 2353134A1
Authority
FR
France
Prior art keywords
thyristor devices
rupture protection
semiconductor thyristor
semiconductor
rupture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7716378A
Other languages
English (en)
Other versions
FR2353134B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of FR2353134A1 publication Critical patent/FR2353134A1/fr
Application granted granted Critical
Publication of FR2353134B1 publication Critical patent/FR2353134B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/083Anode or cathode regions of thyristors or gated bipolar-mode devices
    • H01L29/0839Cathode regions of thyristors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/083Anode or cathode regions of thyristors or gated bipolar-mode devices
    • H01L29/0834Anode regions of thyristors or gated bipolar-mode devices, e.g. supplementary regions surrounding anode regions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1012Base regions of thyristors
    • H01L29/102Cathode base regions of thyristors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/74Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/747Bidirectional devices, e.g. triacs

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)
FR7716378A 1976-05-28 1977-05-27 Dispositifs semi-conducteurs a thyristors ayant une protection contre la rupture Granted FR2353134A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/690,902 US4063277A (en) 1976-05-28 1976-05-28 Semiconductor thyristor devices having breakover protection

Publications (2)

Publication Number Publication Date
FR2353134A1 true FR2353134A1 (fr) 1977-12-23
FR2353134B1 FR2353134B1 (fr) 1982-11-19

Family

ID=24774436

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7716378A Granted FR2353134A1 (fr) 1976-05-28 1977-05-27 Dispositifs semi-conducteurs a thyristors ayant une protection contre la rupture

Country Status (6)

Country Link
US (1) US4063277A (fr)
JP (1) JPS52146572A (fr)
DE (1) DE2723272A1 (fr)
FR (1) FR2353134A1 (fr)
IT (1) IT1074801B (fr)
SE (1) SE7705994L (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4214255A (en) * 1977-02-07 1980-07-22 Rca Corporation Gate turn-off triac with dual low conductivity regions contacting central gate region
US4380114A (en) * 1979-04-11 1983-04-19 Teccor Electronics, Inc. Method of making a semiconductor switching device
US5083185A (en) * 1985-02-15 1992-01-21 Agency Of Industrial Science & Technology, Ministry Of International Trade & Industry Surge absorption device
US4757025A (en) * 1985-03-25 1988-07-12 Motorola Inc. Method of making gate turn off switch with anode short and buried base
US4914045A (en) * 1985-12-19 1990-04-03 Teccor Electronics, Inc. Method of fabricating packaged TRIAC and trigger switch
JPH0656885B2 (ja) * 1990-11-28 1994-07-27 工業技術院長 サージ防護デバイス
JPH077837B2 (ja) * 1990-11-29 1995-01-30 工業技術院長 サージ防護デバイス
DE19721365A1 (de) * 1997-05-22 1998-11-26 Asea Brown Boveri Beidseitig steuerbarer Thyristor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1565551A (fr) * 1967-03-08 1969-05-02
FR2043541A7 (fr) * 1969-05-20 1971-02-19 Bbc Brown Boveri & Cie
FR2248611A1 (en) * 1973-10-19 1975-05-16 Ckd Praha Impurity concentration profile for semiconductor - low resistance base has low and high impurity concentration layers

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US333778A (en) * 1886-01-05 Washing-machine
US3792320A (en) * 1972-05-22 1974-02-12 J Hutson Semiconductor switch devices having improved shorted emitter configurations
US3855611A (en) * 1973-04-11 1974-12-17 Rca Corp Thyristor devices
JPS5527470B2 (fr) * 1974-05-15 1980-07-21

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1565551A (fr) * 1967-03-08 1969-05-02
FR2043541A7 (fr) * 1969-05-20 1971-02-19 Bbc Brown Boveri & Cie
FR2248611A1 (en) * 1973-10-19 1975-05-16 Ckd Praha Impurity concentration profile for semiconductor - low resistance base has low and high impurity concentration layers

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/76 *

Also Published As

Publication number Publication date
US4063277A (en) 1977-12-13
JPS52146572A (en) 1977-12-06
DE2723272A1 (de) 1977-12-08
SE7705994L (sv) 1977-11-29
FR2353134B1 (fr) 1982-11-19
IT1074801B (it) 1985-04-20

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Legal Events

Date Code Title Description
ST Notification of lapse