FR2350694B1 - - Google Patents

Info

Publication number
FR2350694B1
FR2350694B1 FR7712982A FR7712982A FR2350694B1 FR 2350694 B1 FR2350694 B1 FR 2350694B1 FR 7712982 A FR7712982 A FR 7712982A FR 7712982 A FR7712982 A FR 7712982A FR 2350694 B1 FR2350694 B1 FR 2350694B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7712982A
Other languages
French (fr)
Other versions
FR2350694A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of FR2350694A1 publication Critical patent/FR2350694A1/fr
Application granted granted Critical
Publication of FR2350694B1 publication Critical patent/FR2350694B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D48/00Individual devices not covered by groups H10D1/00 - H10D44/00
    • H10D48/387Devices controllable only by the variation of applied heat
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/213Channel regions of field-effect devices
    • H10D62/221Channel regions of field-effect devices of FETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/213Channel regions of field-effect devices
    • H10D62/221Channel regions of field-effect devices of FETs
    • H10D62/235Channel regions of field-effect devices of FETs of IGFETs
    • H10D62/314Channel regions of field-effect devices of FETs of IGFETs having vertical doping variations 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • H10D62/834Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
    • H10D62/854Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs further characterised by the dopants
FR7712982A 1976-05-04 1977-04-29 Transistor a effet de champ a canal superficiel Granted FR2350694A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2619663A DE2619663C3 (de) 1976-05-04 1976-05-04 Feldeffekttransistor, Verfahren zu seinem Betrieb und Verwendung als schneller Schalter sowie in einer integrierten Schaltung

Publications (2)

Publication Number Publication Date
FR2350694A1 FR2350694A1 (fr) 1977-12-02
FR2350694B1 true FR2350694B1 (OSRAM) 1982-02-05

Family

ID=5977037

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7712982A Granted FR2350694A1 (fr) 1976-05-04 1977-04-29 Transistor a effet de champ a canal superficiel

Country Status (8)

Country Link
US (1) US4219829A (OSRAM)
JP (1) JPS52134382A (OSRAM)
BE (1) BE854267A (OSRAM)
DE (1) DE2619663C3 (OSRAM)
FR (1) FR2350694A1 (OSRAM)
GB (1) GB1511637A (OSRAM)
IT (1) IT1076036B (OSRAM)
NL (1) NL7704867A (OSRAM)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4163986A (en) * 1978-05-03 1979-08-07 International Business Machines Corporation Twin channel Lorentz coupled depletion width modulation effect magnetic field sensor
US4472727A (en) * 1983-08-12 1984-09-18 At&T Bell Laboratories Carrier freezeout field-effect device
IT1214805B (it) * 1984-08-21 1990-01-18 Ates Componenti Elettron Spositivi a semiconduttore con giunprocesso per la fabbricazione di dizioni planari a concentrazione di carica variabile e ad altissima tensione di breakdown
US4697198A (en) * 1984-08-22 1987-09-29 Hitachi, Ltd. MOSFET which reduces the short-channel effect
US5162877A (en) * 1987-01-27 1992-11-10 Fujitsu Limited Semiconductor integrated circuit device and method of producing same
US6784492B1 (en) * 1991-03-18 2004-08-31 Canon Kabushiki Kaisha Semiconductor device including a gate-insulated transistor
US5739569A (en) * 1991-05-15 1998-04-14 Texas Instruments Incorporated Non-volatile memory cell with oxide and nitride tunneling layers
US5708398A (en) * 1996-07-01 1998-01-13 Motorola Dual voltage controlled oscillator using integrated transistor and negative differential resistance diode
KR100262457B1 (ko) * 1998-05-04 2000-08-01 윤종용 반도체 장치의 오픈 드레인 입출력단 구조 및 그 제조방법
US6512274B1 (en) 2000-06-22 2003-01-28 Progressant Technologies, Inc. CMOS-process compatible, tunable NDR (negative differential resistance) device and method of operating same
US6593612B2 (en) 2000-12-05 2003-07-15 Infineon Technologies Ag Structure and method for forming a body contact for vertical transistor cells
US7071811B2 (en) * 2003-09-23 2006-07-04 Lsi Logic Corporation High performance voltage control diffusion resistor
US7855128B2 (en) * 2008-05-28 2010-12-21 Sarnoff Corporation Back-illuminated imager using ultra-thin silicon on insulator substrates
CN103094478B (zh) * 2013-01-21 2015-01-21 中国科学技术大学 基于硅-分子复合体系单分子负微分电阻器件及制备方法
US10777566B2 (en) 2017-11-10 2020-09-15 Macronix International Co., Ltd. 3D array arranged for memory and in-memory sum-of-products operations
US10719296B2 (en) 2018-01-17 2020-07-21 Macronix International Co., Ltd. Sum-of-products accelerator array
US10957392B2 (en) 2018-01-17 2021-03-23 Macronix International Co., Ltd. 2D and 3D sum-of-products array for neuromorphic computing system
US10242737B1 (en) 2018-02-13 2019-03-26 Macronix International Co., Ltd. Device structure for neuromorphic computing system
US10635398B2 (en) 2018-03-15 2020-04-28 Macronix International Co., Ltd. Voltage sensing type of matrix multiplication method for neuromorphic computing system
US10664746B2 (en) 2018-07-17 2020-05-26 Macronix International Co., Ltd. Neural network system
US11138497B2 (en) 2018-07-17 2021-10-05 Macronix International Co., Ltd In-memory computing devices for neural networks
US11636325B2 (en) 2018-10-24 2023-04-25 Macronix International Co., Ltd. In-memory data pooling for machine learning
US11562229B2 (en) 2018-11-30 2023-01-24 Macronix International Co., Ltd. Convolution accelerator using in-memory computation
US10672469B1 (en) 2018-11-30 2020-06-02 Macronix International Co., Ltd. In-memory convolution for machine learning
US11934480B2 (en) 2018-12-18 2024-03-19 Macronix International Co., Ltd. NAND block architecture for in-memory multiply-and-accumulate operations
US11119674B2 (en) 2019-02-19 2021-09-14 Macronix International Co., Ltd. Memory devices and methods for operating the same
US10783963B1 (en) 2019-03-08 2020-09-22 Macronix International Co., Ltd. In-memory computation device with inter-page and intra-page data circuits
US11132176B2 (en) 2019-03-20 2021-09-28 Macronix International Co., Ltd. Non-volatile computing method in flash memory
US10910393B2 (en) 2019-04-25 2021-02-02 Macronix International Co., Ltd. 3D NOR memory having vertical source and drain structures
US11737274B2 (en) 2021-02-08 2023-08-22 Macronix International Co., Ltd. Curved channel 3D memory device
US11916011B2 (en) 2021-04-14 2024-02-27 Macronix International Co., Ltd. 3D virtual ground memory and manufacturing methods for same
US11710519B2 (en) 2021-07-06 2023-07-25 Macronix International Co., Ltd. High density memory with reference memory using grouped cells and corresponding operations
US12299597B2 (en) 2021-08-27 2025-05-13 Macronix International Co., Ltd. Reconfigurable AI system
US12321603B2 (en) 2023-02-22 2025-06-03 Macronix International Co., Ltd. High bandwidth non-volatile memory for AI inference system
US12536404B2 (en) 2023-02-22 2026-01-27 Macronix International Co., Ltd. Data optimization for high bandwidth (HBW) NVM AI inference system
US20240370715A1 (en) * 2023-05-04 2024-11-07 Macronix International Co., Ltd. 3D Hybrid Bonding 3D Memory Devices with NPU/CPU for AI Inference Application
US12417170B2 (en) 2023-05-10 2025-09-16 Macronix International Co., Ltd. Computing system and method of operation thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053915A (en) * 1976-03-22 1977-10-11 Motorola, Inc. Temperature compensated constant current source device
US4078947A (en) * 1976-08-05 1978-03-14 International Business Machines Corporation Method for forming a narrow channel length MOS field effect transistor
US4145233A (en) * 1978-05-26 1979-03-20 Ncr Corporation Method for making narrow channel FET by masking and ion-implantation

Also Published As

Publication number Publication date
DE2619663B2 (de) 1981-11-26
GB1511637A (en) 1978-05-24
JPS52134382A (en) 1977-11-10
US4219829A (en) 1980-08-26
NL7704867A (nl) 1977-11-08
IT1076036B (it) 1985-04-22
FR2350694A1 (fr) 1977-12-02
BE854267A (fr) 1977-09-01
DE2619663C3 (de) 1982-07-22
DE2619663A1 (de) 1977-11-10

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Legal Events

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