FR2334115A1 - Procede et dispositif pour la determination de la temperature d'inversion d'elements de resonateurs piezoelectriques en quartz - Google Patents

Procede et dispositif pour la determination de la temperature d'inversion d'elements de resonateurs piezoelectriques en quartz

Info

Publication number
FR2334115A1
FR2334115A1 FR7535792A FR7535792A FR2334115A1 FR 2334115 A1 FR2334115 A1 FR 2334115A1 FR 7535792 A FR7535792 A FR 7535792A FR 7535792 A FR7535792 A FR 7535792A FR 2334115 A1 FR2334115 A1 FR 2334115A1
Authority
FR
France
Prior art keywords
determining
quartz resonator
resonator elements
piezoelectric quartz
reverse temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7535792A
Other languages
English (en)
Other versions
FR2334115B1 (fr
Inventor
Hubert Matthey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SSIH Management Services SA
Original Assignee
SSIH Management Services SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SSIH Management Services SA filed Critical SSIH Management Services SA
Publication of FR2334115A1 publication Critical patent/FR2334115A1/fr
Application granted granted Critical
Publication of FR2334115B1 publication Critical patent/FR2334115B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/22—Measuring piezoelectric properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Electric Clocks (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
FR7535792A 1975-10-27 1975-11-24 Procede et dispositif pour la determination de la temperature d'inversion d'elements de resonateurs piezoelectriques en quartz Granted FR2334115A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1386375A CH591765A5 (fr) 1975-10-27 1975-10-27

Publications (2)

Publication Number Publication Date
FR2334115A1 true FR2334115A1 (fr) 1977-07-01
FR2334115B1 FR2334115B1 (fr) 1978-05-19

Family

ID=4395984

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7535792A Granted FR2334115A1 (fr) 1975-10-27 1975-11-24 Procede et dispositif pour la determination de la temperature d'inversion d'elements de resonateurs piezoelectriques en quartz

Country Status (6)

Country Link
US (1) US4084131A (fr)
JP (1) JPS5254393A (fr)
CH (1) CH591765A5 (fr)
DE (1) DE2648508C3 (fr)
FR (1) FR2334115A1 (fr)
GB (1) GB1518868A (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4412172A (en) * 1981-10-28 1983-10-25 The United States Of America As Represented By The Secretary Of The Army Method of measuring the thermal properties of a resonator
JP2925158B2 (ja) * 1988-07-29 1999-07-28 株式会社東芝 変調器および送信器
JPH0198825A (ja) * 1987-10-08 1989-04-17 Matsushita Electric Ind Co Ltd こんろバーナ
US4918372A (en) * 1988-08-29 1990-04-17 The United States Of America As Represented By The Secretary Of The Army Method of measuring the thermal hysteresis of quartz crystal resonators
US6365859B1 (en) * 2000-06-28 2002-04-02 Advanced Micro Devices Processor IC performance metric
US7113051B2 (en) * 2004-01-07 2006-09-26 Schlumberger Technology Corporation Frequency characterization of quartz crystals

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2178225A (en) * 1936-11-27 1939-10-31 Rca Corp Method of and apparatus for calibrating piezoelectric elements
US2470737A (en) * 1944-08-29 1949-05-17 Premier Crystal Lab Inc Method and means of finishing piezoelectric crystals
US2691111A (en) * 1949-08-05 1954-10-05 Selectronics Inc Readily accessible temperature controlled piezoelectric device test oven
US3530377A (en) * 1968-05-22 1970-09-22 Winslow Tele Tronics Inc Test means for determining the frequency stability of piezoelectric crystals
US3916303A (en) * 1974-02-11 1975-10-28 Vladimir Petrovich Butuzov Method for checking the quality of a piezoelectric material

Also Published As

Publication number Publication date
JPS5254393A (en) 1977-05-02
DE2648508C3 (de) 1979-08-16
DE2648508A1 (de) 1977-04-28
FR2334115B1 (fr) 1978-05-19
CH591765A5 (fr) 1977-09-30
US4084131A (en) 1978-04-11
DE2648508B2 (de) 1978-12-14
GB1518868A (en) 1978-07-26
JPS6118354B2 (fr) 1986-05-12

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Legal Events

Date Code Title Description
ST Notification of lapse