FR2331806A1 - Dispositif de concentration de lumiere emanant d'un champ lineaire sur un recepteur - Google Patents

Dispositif de concentration de lumiere emanant d'un champ lineaire sur un recepteur

Info

Publication number
FR2331806A1
FR2331806A1 FR7633983A FR7633983A FR2331806A1 FR 2331806 A1 FR2331806 A1 FR 2331806A1 FR 7633983 A FR7633983 A FR 7633983A FR 7633983 A FR7633983 A FR 7633983A FR 2331806 A1 FR2331806 A1 FR 2331806A1
Authority
FR
France
Prior art keywords
emanting
receiver
concentration device
light concentration
linear field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7633983A
Other languages
English (en)
Other versions
FR2331806B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of FR2331806A1 publication Critical patent/FR2331806A1/fr
Application granted granted Critical
Publication of FR2331806B1 publication Critical patent/FR2331806B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/143—Beam splitting or combining systems operating by reflection only using macroscopically faceted or segmented reflective surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Facsimile Scanning Arrangements (AREA)
FR7633983A 1975-11-12 1976-11-10 Dispositif de concentration de lumiere emanant d'un champ lineaire sur un recepteur Granted FR2331806A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2550815A DE2550815C3 (de) 1975-11-12 1975-11-12 Optisches Abtastsystem

Publications (2)

Publication Number Publication Date
FR2331806A1 true FR2331806A1 (fr) 1977-06-10
FR2331806B1 FR2331806B1 (fr) 1980-08-22

Family

ID=5961562

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7633983A Granted FR2331806A1 (fr) 1975-11-12 1976-11-10 Dispositif de concentration de lumiere emanant d'un champ lineaire sur un recepteur

Country Status (9)

Country Link
US (1) US4116527A (fr)
JP (1) JPS5260641A (fr)
CA (1) CA1080525A (fr)
CH (1) CH609158A5 (fr)
DE (1) DE2550815C3 (fr)
FI (1) FI763194A (fr)
FR (1) FR2331806A1 (fr)
GB (1) GB1543328A (fr)
SE (1) SE411257B (fr)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2727927C3 (de) * 1977-06-21 1980-01-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur getrennten Erfassung von Lichtstrahlen
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
DE2836280C3 (de) * 1978-08-18 1981-04-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Abtastvorrichtung für kontinuierlich fortbewegte Materialbahnen
JPS5574263A (en) * 1978-11-30 1980-06-04 Ricoh Co Ltd Reader for video information
DE2904432A1 (de) * 1979-02-06 1980-08-21 Sick Optik Elektronik Erwin Einen taktmasstab aufweisender lichtvorhang
DE2904435C3 (de) * 1979-02-06 1981-11-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lochsuchgerät für Materialbahnen
US4247160A (en) * 1979-03-26 1981-01-27 Xerox Corporation Scanner with reflective pyramid error compensation
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
SE433783B (sv) * 1982-03-03 1984-06-12 Pharos Ab Optisk svepanordning
US4630276A (en) * 1984-10-09 1986-12-16 Aeronca Electronics, Inc. Compact laser scanning system
US4714310A (en) * 1986-04-21 1987-12-22 Sri International Method and apparatus for dynamic focusing control of a radiant energy beam
DE3707979A1 (de) * 1987-03-12 1988-09-29 Sick Optik Elektronik Erwin Optische abtastvorrichtung mit telezentrischer zeilenkamera
US4997242A (en) * 1988-03-07 1991-03-05 Medical Research Council Achromatic scanning system
DE3923788C1 (fr) * 1989-07-18 1991-01-10 Erwin Sick Gmbh Optik-Elektronik, 8000 Muenchen, De
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
US5357592A (en) * 1993-08-17 1994-10-18 Martin Marietta Corporation Optical energy concentrator/reflector
DE19612710A1 (de) * 1996-03-29 1997-10-02 Sick Ag Lichtfleckerzeugungsvorrichtung

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1251980B (fr) * 1961-05-31
US3062965A (en) * 1959-07-31 1962-11-06 Sick Erwin Photoelectric scanning device
US3609380A (en) * 1968-11-29 1971-09-28 Ppg Industries Inc Radiation sensitive defect scanner for transparent materials
US3675016A (en) * 1970-02-17 1972-07-04 Eastman Kodak Co Flying spot scanning
US3746868A (en) * 1971-03-22 1973-07-17 Zellweger Uster Ag Correction apparatus for optical reading mechanism
DE2211654A1 (de) * 1972-03-10 1973-09-20 Paul Lippke Einrichtung zum pruefen bewegter bahnen aus papier, kunststoff- oder metallfolien und dgl
FR2195801A1 (fr) * 1972-08-10 1974-03-08 Zellweger Uster Ag
US3825351A (en) * 1973-01-19 1974-07-23 Hatachi Electronics Co Ltd Automatic surface inspection device for running object
FR2319127A1 (fr) * 1975-07-21 1977-02-18 Sick Optik Elektronik Erwin Dispositif optique pour determiner l'angle d'emergence d'un rayon lumineux

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB604161A (en) * 1945-10-31 1948-06-29 Henry Steinmark Improvements in or relating to apparatus for effecting the simultaneous rotary adjustment of a plurality of optical lenses
US3758197A (en) * 1971-11-15 1973-09-11 Bucode Light collecting and transmitting apparatus
US3762794A (en) * 1972-04-06 1973-10-02 Bell Telephone Labor Inc Adjustable beam refocuser and redirector
GB1493244A (en) * 1974-04-11 1977-11-30 Secretary Industry Brit Alignment techniques
DE2508366C3 (de) * 1975-02-26 1979-05-17 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung mit einem Lichtvorhang
US4033678A (en) * 1975-05-21 1977-07-05 Rudd Milo O Two-mirror systems for periscopic rearward viewing

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3062965A (en) * 1959-07-31 1962-11-06 Sick Erwin Photoelectric scanning device
DE1251980B (fr) * 1961-05-31
US3609380A (en) * 1968-11-29 1971-09-28 Ppg Industries Inc Radiation sensitive defect scanner for transparent materials
US3675016A (en) * 1970-02-17 1972-07-04 Eastman Kodak Co Flying spot scanning
US3746868A (en) * 1971-03-22 1973-07-17 Zellweger Uster Ag Correction apparatus for optical reading mechanism
DE2211654A1 (de) * 1972-03-10 1973-09-20 Paul Lippke Einrichtung zum pruefen bewegter bahnen aus papier, kunststoff- oder metallfolien und dgl
FR2195801A1 (fr) * 1972-08-10 1974-03-08 Zellweger Uster Ag
US3825351A (en) * 1973-01-19 1974-07-23 Hatachi Electronics Co Ltd Automatic surface inspection device for running object
FR2319127A1 (fr) * 1975-07-21 1977-02-18 Sick Optik Elektronik Erwin Dispositif optique pour determiner l'angle d'emergence d'un rayon lumineux

Also Published As

Publication number Publication date
FI763194A (fr) 1977-05-13
JPS5260641A (en) 1977-05-19
GB1543328A (en) 1979-04-04
DE2550815A1 (de) 1977-05-26
FR2331806B1 (fr) 1980-08-22
DE2550815C3 (de) 1979-05-31
SE7612567L (sv) 1977-05-13
SE411257B (sv) 1979-12-10
CA1080525A (fr) 1980-07-01
CH609158A5 (fr) 1979-02-15
US4116527A (en) 1978-09-26
DE2550815B2 (de) 1978-10-05

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Legal Events

Date Code Title Description
ST Notification of lapse