FR2326708B1 - - Google Patents
Info
- Publication number
- FR2326708B1 FR2326708B1 FR7629680A FR7629680A FR2326708B1 FR 2326708 B1 FR2326708 B1 FR 2326708B1 FR 7629680 A FR7629680 A FR 7629680A FR 7629680 A FR7629680 A FR 7629680A FR 2326708 B1 FR2326708 B1 FR 2326708B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CS756635A CS202665B1 (cs) | 1975-10-01 | 1975-10-01 | Zařízení pro měření specifického odporu vodivých a polovodivých materiálů |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2326708A1 FR2326708A1 (fr) | 1977-04-29 |
| FR2326708B1 true FR2326708B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1980-12-12 |
Family
ID=5413852
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7629680A Granted FR2326708A1 (fr) | 1975-10-01 | 1976-10-01 | Procede et dispositif de mesure de la resistance electrique specifique de materiaux conducteurs et semi-conducteurs |
Country Status (5)
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2492535A1 (fr) * | 1980-10-17 | 1982-04-23 | Onera (Off Nat Aerospatiale) | Resistivimetre de surface |
| US4842147A (en) * | 1981-12-04 | 1989-06-27 | Gte Products Corporation | Method and apparatus for conductive film detection |
| US4779739A (en) * | 1981-12-04 | 1988-10-25 | Gte Products Corporation | Method and apparatus for conductive film detection |
| DE3706659A1 (de) * | 1987-03-02 | 1988-09-15 | Heidelberger Druckmasch Ag | Einrichtung zum erfassen der wicklungstemperatur eines insbesondere buerstenlosen gleichstrommotors |
| US4922182A (en) * | 1988-08-03 | 1990-05-01 | Monroe Electronics, Inc. | Auto reactance compensated non-contacting resistivity measuring device |
| DE4231392A1 (de) * | 1992-09-19 | 1994-03-24 | Daimler Benz Ag | Verfahren zur Bestimmung der elektronischen Eigenschaften von Halbleiterschichtstrukturen |
| US5432457A (en) * | 1994-01-28 | 1995-07-11 | Northrop Grumman Corporation | Capacitive disk probe |
| CN101315362B (zh) * | 2008-06-26 | 2011-06-22 | 太仓宏大纺织仪器有限公司 | 纤维比电阻仪以及纤维电阻与纤维比电阻测量方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1082671B (de) * | 1958-11-05 | 1960-06-02 | Siemens Ag | Verfahren zur Bestimmung des elektrischen Widerstandes eines Koerpers aus extrem reinem Halbleiter-material fuer elektronische Zwecke |
| US3234461A (en) * | 1960-12-05 | 1966-02-08 | Texas Instruments Inc | Resistivity-measuring device including solid inductive sensor |
| US3151292A (en) * | 1960-11-29 | 1964-09-29 | Shell Oil Co | Method for determining directional inductive anisotropy of materials by measuring q factor |
| US3400331A (en) * | 1965-01-18 | 1968-09-03 | Pratt & Whitney Inc | Gaging device including a probe having a plurality of concentric and coextensive electrodes |
| US3437920A (en) * | 1965-09-14 | 1969-04-08 | Norman J Anderson | Transducer circuits with frequency-amplitude control |
| DE6600158U (de) * | 1966-09-29 | 1969-01-09 | Siemens Ag | Verfahren zum bestimmen des widerstandes eines flachen koerpers, insbesondere einer scheibe aus halbleitermaterial. |
| US3544893A (en) * | 1968-08-05 | 1970-12-01 | Anatoly Ivanovich Savin | Apparatus for noncontact measurement of semiconductor resistivity including a toroidal inductive coil with a gap |
| US4000458A (en) * | 1975-08-21 | 1976-12-28 | Bell Telephone Laboratories, Incorporated | Method for the noncontacting measurement of the electrical conductivity of a lamella |
-
1975
- 1975-10-01 CS CS756635A patent/CS202665B1/cs unknown
-
1976
- 1976-09-15 DD DD7600194794A patent/DD127816A1/xx unknown
- 1976-09-29 DE DE2643914A patent/DE2643914C2/de not_active Expired
- 1976-10-01 FR FR7629680A patent/FR2326708A1/fr active Granted
- 1976-10-01 US US05/728,839 patent/US4075557A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CS202665B1 (cs) | 1981-01-30 |
| FR2326708A1 (fr) | 1977-04-29 |
| DE2643914C2 (de) | 1983-01-13 |
| DE2643914A1 (de) | 1977-04-07 |
| DD127816A1 (de) | 1977-10-12 |
| US4075557A (en) | 1978-02-21 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |