FR2325943A3 - Radiation dose rate measurement - using an organic scintillator covered with a layer of inorganic scintillation material - Google Patents
Radiation dose rate measurement - using an organic scintillator covered with a layer of inorganic scintillation materialInfo
- Publication number
- FR2325943A3 FR2325943A3 FR7530569A FR7530569A FR2325943A3 FR 2325943 A3 FR2325943 A3 FR 2325943A3 FR 7530569 A FR7530569 A FR 7530569A FR 7530569 A FR7530569 A FR 7530569A FR 2325943 A3 FR2325943 A3 FR 2325943A3
- Authority
- FR
- France
- Prior art keywords
- layer
- inorganic
- organic
- radiation dose
- organic scintillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
An appts. for measuring radiation dose-rate by scintillation, independent of the X or gamma-radiations used, incorporates an organic scintillator covered with a layer of inorganic material. The thickness of the inorganic layer is such that the loss of radiation, corresp. to the X or gamma-rays of energy below 100 KeV in the organic scintillator, is compensated by the radiation generated in the inorganic scintillator. Typically, the inorganic and organic scintillators are zinc sulphide and monocrystal of anthracene respectively. It is possible to use organic monocrystals of great sensitivity. This allows very sensitive instruments to be obtd. with a small detection vol. It is possible to use larger scintillators of high sensitivities because the compensation of energy by soft radiations is not effected inside the scintillation system, but on the surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7530569A FR2325943A3 (en) | 1975-09-29 | 1975-09-29 | Radiation dose rate measurement - using an organic scintillator covered with a layer of inorganic scintillation material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7530569A FR2325943A3 (en) | 1975-09-29 | 1975-09-29 | Radiation dose rate measurement - using an organic scintillator covered with a layer of inorganic scintillation material |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2325943A3 true FR2325943A3 (en) | 1977-04-22 |
FR2325943B3 FR2325943B3 (en) | 1980-01-11 |
Family
ID=9160866
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7530569A Granted FR2325943A3 (en) | 1975-09-29 | 1975-09-29 | Radiation dose rate measurement - using an organic scintillator covered with a layer of inorganic scintillation material |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2325943A3 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3783393A1 (en) * | 2019-08-19 | 2021-02-24 | The Boeing Company | X-ray backscattering detector |
-
1975
- 1975-09-29 FR FR7530569A patent/FR2325943A3/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3783393A1 (en) * | 2019-08-19 | 2021-02-24 | The Boeing Company | X-ray backscattering detector |
US11061149B2 (en) | 2019-08-19 | 2021-07-13 | The Boeing Company | X-ray backscattering detector |
Also Published As
Publication number | Publication date |
---|---|
FR2325943B3 (en) | 1980-01-11 |
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