FR2316835A1 - Outillage de verification - Google Patents

Outillage de verification

Info

Publication number
FR2316835A1
FR2316835A1 FR7616132A FR7616132A FR2316835A1 FR 2316835 A1 FR2316835 A1 FR 2316835A1 FR 7616132 A FR7616132 A FR 7616132A FR 7616132 A FR7616132 A FR 7616132A FR 2316835 A1 FR2316835 A1 FR 2316835A1
Authority
FR
France
Prior art keywords
verification tools
verification
tools
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7616132A
Other languages
English (en)
Other versions
FR2316835B1 (fr
Inventor
James G Belleson
Kendall Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2316835A1 publication Critical patent/FR2316835A1/fr
Application granted granted Critical
Publication of FR2316835B1 publication Critical patent/FR2316835B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing
    • G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FR7616132A 1975-06-30 1976-05-21 Outillage de verification Granted FR2316835A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/592,154 US4065212A (en) 1975-06-30 1975-06-30 Inspection tool

Publications (2)

Publication Number Publication Date
FR2316835A1 true FR2316835A1 (fr) 1977-01-28
FR2316835B1 FR2316835B1 (fr) 1979-04-06

Family

ID=24369531

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7616132A Granted FR2316835A1 (fr) 1975-06-30 1976-05-21 Outillage de verification

Country Status (5)

Country Link
US (1) US4065212A (fr)
JP (1) JPS6041460B2 (fr)
DE (1) DE2629097C2 (fr)
FR (1) FR2316835A1 (fr)
GB (3) GB1542123A (fr)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4240750A (en) * 1978-10-02 1980-12-23 Hurd William A Automatic circuit board tester
JPS5588347A (en) * 1978-12-27 1980-07-04 Fujitsu Ltd Automatic aligning system
DE2929846A1 (de) * 1979-07-23 1981-03-12 Siemens AG, 1000 Berlin und 8000 München Opto-elektronisches pruefsystem zur automatischen beschaffenheitspruefung von leiterplatten, deren zwischenprodukte und druckwerkzeuge
JPS57198627A (en) * 1981-06-01 1982-12-06 Fujitsu Ltd Reticle
US4509075A (en) * 1981-06-15 1985-04-02 Oxbridge, Inc. Automatic optical inspection apparatus
EP0081295A1 (fr) * 1981-11-12 1983-06-15 Hughes Aircraft Company Sonde intelligente pour essayer le noeud interne d'un microcircuit rapide
JPS59135408U (ja) * 1983-02-28 1984-09-10 京セラミタ株式会社 記録装置
DE3446354A1 (de) * 1984-12-19 1986-06-26 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronische vergleichsvorrichtung fuer strukturen auf ebenen oberflaechen oder fuer flaechige strukturen
US4837588A (en) * 1987-05-08 1989-06-06 Ricoh Company, Ltd. Synchronizing signal generating system for laser scanner
JPH0748513B2 (ja) * 1990-06-22 1995-05-24 株式会社東芝 接合部の検査方法
JPH07117498B2 (ja) * 1991-12-11 1995-12-18 インターナショナル・ビジネス・マシーンズ・コーポレイション 検査システム
JPH07226426A (ja) * 1994-02-10 1995-08-22 Toshiba Corp 電子ビ−ムテスタ及び電子ビ−ムテスタを使用したテスト方法
AU5925300A (en) * 1999-07-10 2001-01-30 Tay Bok Her Post-seal inspection system and method
US6791592B2 (en) 2000-04-18 2004-09-14 Laserink Printing a code on a product
US6605807B2 (en) 2000-06-05 2003-08-12 The Boeing Company Infrared crack detection apparatus and method
US6831736B2 (en) * 2002-10-07 2004-12-14 Applied Materials Israel, Ltd. Method of and apparatus for line alignment to compensate for static and dynamic inaccuracies in scanning
US7046267B2 (en) 2003-12-19 2006-05-16 Markem Corporation Striping and clipping correction
US20050255406A1 (en) * 2004-05-11 2005-11-17 Shlomo Assa Marking on a thin film
US7345772B2 (en) * 2004-08-06 2008-03-18 Voith Paper Patent Gmbh Optical triangulation device and method of measuring a variable of a web using the device
US7394479B2 (en) 2005-03-02 2008-07-01 Marken Corporation Pulsed laser printing
JPWO2006118152A1 (ja) * 2005-04-27 2008-12-18 オリンパス株式会社 外観検査装置及び外観検査方法並びに外観検査装置に装着可能な周縁部検査ユニット
DE102007006274A1 (de) * 2007-02-08 2008-08-14 Polyic Gmbh & Co. Kg Messvorrichtung mit einem Messrad
US7956513B2 (en) * 2007-04-20 2011-06-07 Mitsumi Electric Co., Ltd. Method of driving a driving device
US8537416B2 (en) * 2009-03-06 2013-09-17 Micronic Laser Systems Ab Rotor optics imaging method and system with variable dose during sweep
CN103438923B (zh) * 2013-08-21 2016-04-27 广东电子工业研究院有限公司 一种人机结合的产品质量检测系统及其检测方法
CN107792150A (zh) * 2017-09-27 2018-03-13 西安科技大学 一种建筑施工用智能运料车
US10583668B2 (en) 2018-08-07 2020-03-10 Markem-Imaje Corporation Symbol grouping and striping for wide field matrix laser marking
CN111465188B (zh) * 2019-01-18 2023-06-06 东莞市欧特自动化技术有限公司 异形电路板及元器件插件方法及装置
JP2023521529A (ja) * 2020-02-06 2023-05-25 インスペクト，エー．エム．ブイ リミテッド 反射する物体を撮像するためのシステムおよび方法
JP2022090541A (ja) 2020-12-07 2022-06-17 株式会社ユーシン精機 成形品取出機の制御装置
KR20240034696A (ko) * 2021-07-21 2024-03-14 오르보테크 엘티디. 렌즈를 통한 높이 측정
CN114501863B (zh) * 2022-03-03 2023-12-15 芯体素(杭州)科技发展有限公司 一种刮涂对位校准的装置及方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596060A (en) * 1967-05-04 1971-07-27 Alexander Inc Optical scanning unit for mark sensing
US3835249A (en) * 1972-12-26 1974-09-10 Ibm Scanning light synchronization system
US3871773A (en) * 1973-04-24 1975-03-18 Ppg Industries Inc Method of and apparatus for detecting defects and the position thereof in transparent articles

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3060319A (en) * 1960-12-08 1962-10-23 United Aircraft Corp Optical synchronizer
GB1382807A (en) * 1971-03-05 1975-02-05 Cranfield Inst Of Tech Measuring and counting systems
GB1400253A (en) * 1972-03-17 1975-07-16 Ti Group Services Ltd Gauging dimensions
US3809806A (en) * 1972-10-18 1974-05-07 Columbia Broadcasting Syst Inc Banding correction system for film recording apparatus
US3856412A (en) * 1973-06-08 1974-12-24 Zygo Corp Optical noncontacting gauge

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596060A (en) * 1967-05-04 1971-07-27 Alexander Inc Optical scanning unit for mark sensing
US3835249A (en) * 1972-12-26 1974-09-10 Ibm Scanning light synchronization system
US3871773A (en) * 1973-04-24 1975-03-18 Ppg Industries Inc Method of and apparatus for detecting defects and the position thereof in transparent articles

Also Published As

Publication number Publication date
GB1542122A (en) 1979-03-14
GB1542121A (en) 1979-03-14
DE2629097A1 (de) 1977-02-03
US4065212A (en) 1977-12-27
DE2629097C2 (de) 1986-09-11
JPS6041460B2 (ja) 1985-09-17
JPS526555A (en) 1977-01-19
FR2316835B1 (fr) 1979-04-06
GB1542123A (en) 1979-03-14

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Legal Events

Date Code Title Description
ST Notification of lapse