FR2316699A1 - Procede pour tester et reparer une microplaquette de domaines magnetiques en bulle - Google Patents

Procede pour tester et reparer une microplaquette de domaines magnetiques en bulle

Info

Publication number
FR2316699A1
FR2316699A1 FR7611976A FR7611976A FR2316699A1 FR 2316699 A1 FR2316699 A1 FR 2316699A1 FR 7611976 A FR7611976 A FR 7611976A FR 7611976 A FR7611976 A FR 7611976A FR 2316699 A1 FR2316699 A1 FR 2316699A1
Authority
FR
France
Prior art keywords
microplate
repairing
testing
magnetic domains
bubble magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7611976A
Other languages
English (en)
French (fr)
Other versions
FR2316699B1 (OSRAM
Inventor
Gerald G Barrett
Louis M Hornung
Calvin C Jones Jr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2316699A1 publication Critical patent/FR2316699A1/fr
Application granted granted Critical
Publication of FR2316699B1 publication Critical patent/FR2316699B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/86—Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0808—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure using magnetic domain propagation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0875—Organisation of a plurality of magnetic shift registers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0875—Organisation of a plurality of magnetic shift registers
    • G11C19/0883—Means for switching magnetic domains from one path into another path, i.e. transfer switches, swap gates or decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
FR7611976A 1975-06-30 1976-04-16 Procede pour tester et reparer une microplaquette de domaines magnetiques en bulle Granted FR2316699A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/591,421 US4001673A (en) 1975-06-30 1975-06-30 Method of testing and repairing magnetic bubble domain chip

Publications (2)

Publication Number Publication Date
FR2316699A1 true FR2316699A1 (fr) 1977-01-28
FR2316699B1 FR2316699B1 (OSRAM) 1978-05-19

Family

ID=24366418

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7611976A Granted FR2316699A1 (fr) 1975-06-30 1976-04-16 Procede pour tester et reparer une microplaquette de domaines magnetiques en bulle

Country Status (6)

Country Link
US (1) US4001673A (OSRAM)
JP (1) JPS526035A (OSRAM)
DE (1) DE2625763A1 (OSRAM)
FR (1) FR2316699A1 (OSRAM)
GB (1) GB1526474A (OSRAM)
IT (1) IT1063339B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006470A3 (en) * 1978-06-30 1980-01-23 International Business Machines Corporation Charge coupled memory and method of manufacturing it

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2307332A1 (fr) * 1975-04-07 1976-11-05 Sperry Rand Corp Procede de stockage d'information dans une memoire comportant au moins une zone de memorisation defectueuse et dispositif pour l'execution de ce procede
JPS51118341A (en) * 1975-04-11 1976-10-18 Hitachi Ltd Shift register type memory
US4096580A (en) * 1976-07-26 1978-06-20 Rockwell International Corporation Multiple redundancy loop bubble domain memory
JPS5931151B2 (ja) * 1977-09-19 1984-07-31 日本電信電話株式会社 磁気バブル記憶装置の試験方法
DE2839950B1 (de) * 1978-09-14 1979-10-25 Ibm Deutschland Einrichtung zur Feststellung der Laenge beliebiger Schieberegister
US4225941A (en) * 1978-10-30 1980-09-30 Trw Inc. Controller for bubble memories
GB2218690A (en) * 1988-05-19 1989-11-22 Item Products Npd Limited Carrying handles
US5479098A (en) * 1993-03-15 1995-12-26 Trace Mountain Products, Inc. Loop-back circuit for testing a magnetic recording system with simultaneous read and write functions

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2272464A1 (OSRAM) * 1973-12-28 1975-12-19 Ibm

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3792450A (en) * 1972-05-08 1974-02-12 Singer Co System for overcoming faults in magnetic anisotropic material
JPS552674B2 (OSRAM) * 1972-09-08 1980-01-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2272464A1 (OSRAM) * 1973-12-28 1975-12-19 Ibm

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0006470A3 (en) * 1978-06-30 1980-01-23 International Business Machines Corporation Charge coupled memory and method of manufacturing it

Also Published As

Publication number Publication date
GB1526474A (en) 1978-09-27
US4001673A (en) 1977-01-04
FR2316699B1 (OSRAM) 1978-05-19
JPS526035A (en) 1977-01-18
DE2625763A1 (de) 1977-01-27
IT1063339B (it) 1985-02-11

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Legal Events

Date Code Title Description
ST Notification of lapse