JPS526035A - Method of testing magnetic bubble domain chip - Google Patents

Method of testing magnetic bubble domain chip

Info

Publication number
JPS526035A
JPS526035A JP51071273A JP7127376A JPS526035A JP S526035 A JPS526035 A JP S526035A JP 51071273 A JP51071273 A JP 51071273A JP 7127376 A JP7127376 A JP 7127376A JP S526035 A JPS526035 A JP S526035A
Authority
JP
Japan
Prior art keywords
magnetic bubble
bubble domain
testing magnetic
domain chip
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP51071273A
Other languages
English (en)
Japanese (ja)
Inventor
Jii Baretsuto Jierarudo
Emu Hoonangu Ruisu
Shii Jiyoonzu Jiyunia Karubin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS526035A publication Critical patent/JPS526035A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/86—Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0808—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure using magnetic domain propagation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0875—Organisation of a plurality of magnetic shift registers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/0875—Organisation of a plurality of magnetic shift registers
    • G11C19/0883—Means for switching magnetic domains from one path into another path, i.e. transfer switches, swap gates or decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
JP51071273A 1975-06-30 1976-06-18 Method of testing magnetic bubble domain chip Pending JPS526035A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/591,421 US4001673A (en) 1975-06-30 1975-06-30 Method of testing and repairing magnetic bubble domain chip

Publications (1)

Publication Number Publication Date
JPS526035A true JPS526035A (en) 1977-01-18

Family

ID=24366418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51071273A Pending JPS526035A (en) 1975-06-30 1976-06-18 Method of testing magnetic bubble domain chip

Country Status (6)

Country Link
US (1) US4001673A (OSRAM)
JP (1) JPS526035A (OSRAM)
DE (1) DE2625763A1 (OSRAM)
FR (1) FR2316699A1 (OSRAM)
GB (1) GB1526474A (OSRAM)
IT (1) IT1063339B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5445543A (en) * 1977-09-19 1979-04-10 Nippon Telegr & Teleph Corp <Ntt> Test method for magnetic bubble memory unit

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2307332A1 (fr) * 1975-04-07 1976-11-05 Sperry Rand Corp Procede de stockage d'information dans une memoire comportant au moins une zone de memorisation defectueuse et dispositif pour l'execution de ce procede
JPS51118341A (en) * 1975-04-11 1976-10-18 Hitachi Ltd Shift register type memory
US4096580A (en) * 1976-07-26 1978-06-20 Rockwell International Corporation Multiple redundancy loop bubble domain memory
US4155121A (en) * 1978-06-30 1979-05-15 International Business Machines Corporation Redundant charge-coupled device and method
DE2839950B1 (de) * 1978-09-14 1979-10-25 Ibm Deutschland Einrichtung zur Feststellung der Laenge beliebiger Schieberegister
US4225941A (en) * 1978-10-30 1980-09-30 Trw Inc. Controller for bubble memories
GB2218690A (en) * 1988-05-19 1989-11-22 Item Products Npd Limited Carrying handles
US5479098A (en) * 1993-03-15 1995-12-26 Trace Mountain Products, Inc. Loop-back circuit for testing a magnetic recording system with simultaneous read and write functions

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3792450A (en) * 1972-05-08 1974-02-12 Singer Co System for overcoming faults in magnetic anisotropic material
JPS552674B2 (OSRAM) * 1972-09-08 1980-01-21
CA1035038A (en) * 1973-12-28 1978-07-18 International Business Machines Corporation Technique for providing defect-tolerant magnetic bubble domain chips

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5445543A (en) * 1977-09-19 1979-04-10 Nippon Telegr & Teleph Corp <Ntt> Test method for magnetic bubble memory unit

Also Published As

Publication number Publication date
GB1526474A (en) 1978-09-27
US4001673A (en) 1977-01-04
FR2316699B1 (OSRAM) 1978-05-19
FR2316699A1 (fr) 1977-01-28
DE2625763A1 (de) 1977-01-27
IT1063339B (it) 1985-02-11

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