FR2300414A2 - Dispositif pour le controle de la p - Google Patents

Dispositif pour le controle de la p

Info

Publication number
FR2300414A2
FR2300414A2 FR7503798A FR7503798A FR2300414A2 FR 2300414 A2 FR2300414 A2 FR 2300414A2 FR 7503798 A FR7503798 A FR 7503798A FR 7503798 A FR7503798 A FR 7503798A FR 2300414 A2 FR2300414 A2 FR 2300414A2
Authority
FR
France
Prior art keywords
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7503798A
Other languages
English (en)
Other versions
FR2300414B2 (fr
Inventor
Rene Boux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CGR MEV SA
Original Assignee
CGR MEV SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CGR MEV SA filed Critical CGR MEV SA
Priority to FR7503798A priority Critical patent/FR2300414A2/fr
Priority to GB445776A priority patent/GB1558601A/en
Priority to NL7601175A priority patent/NL7601175A/xx
Priority to CA245,763A priority patent/CA1067624A/fr
Priority to DE19762604672 priority patent/DE2604672C2/de
Priority to CH149276A priority patent/CH588086A5/xx
Priority to JP1186076A priority patent/JPS5823704B2/ja
Publication of FR2300414A2 publication Critical patent/FR2300414A2/fr
Priority to US05/964,139 priority patent/US4206355A/en
Application granted granted Critical
Publication of FR2300414B2 publication Critical patent/FR2300414B2/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24455—Transmitted particle detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2446—Position sensitive detectors
    • H01J2237/24465—Sectored detectors, e.g. quadrants
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24571—Measurements of non-electric or non-magnetic variables
    • H01J2237/24578—Spatial variables, e.g. position, distance

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
FR7503798A 1975-02-07 1975-02-07 Dispositif pour le controle de la p Granted FR2300414A2 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR7503798A FR2300414A2 (fr) 1975-02-07 1975-02-07 Dispositif pour le controle de la p
GB445776A GB1558601A (en) 1975-02-07 1976-02-04 Device for monitoring the centring intensity and uniformity of a beam of ionizing radiation
NL7601175A NL7601175A (nl) 1975-02-07 1976-02-05 Inrichting voor het controleren van de positie, de intensiteit de homogeniteit en de gerichtheid van een bundel ioniserende stralen.
DE19762604672 DE2604672C2 (de) 1975-02-07 1976-02-06 Vorrichtung zur Kontrolle der Homogenität der radialen Intensitätsverteilung eines ionisierenden Strahlungsbündels
CA245,763A CA1067624A (fr) 1975-02-07 1976-02-06 Systeme de controle de la position, de l'intensite, de l'uniformite et de la directivite d'un faisceau de radiation ionisante
CH149276A CH588086A5 (fr) 1975-02-07 1976-02-06
JP1186076A JPS5823704B2 (ja) 1975-02-07 1976-02-07 電離性放射線ビ−ムの位置、強度、一様性および指向性の監視装置
US05/964,139 US4206355A (en) 1975-02-07 1978-11-28 System for monitoring the position intensity uniformity and directivity of a beam of ionizing radiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7503798A FR2300414A2 (fr) 1975-02-07 1975-02-07 Dispositif pour le controle de la p

Publications (2)

Publication Number Publication Date
FR2300414A2 true FR2300414A2 (fr) 1976-09-03
FR2300414B2 FR2300414B2 (fr) 1978-12-01

Family

ID=9150889

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7503798A Granted FR2300414A2 (fr) 1975-02-07 1975-02-07 Dispositif pour le controle de la p

Country Status (7)

Country Link
JP (1) JPS5823704B2 (fr)
CA (1) CA1067624A (fr)
CH (1) CH588086A5 (fr)
DE (1) DE2604672C2 (fr)
FR (1) FR2300414A2 (fr)
GB (1) GB1558601A (fr)
NL (1) NL7601175A (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2423860A1 (fr) * 1978-04-17 1979-11-16 Philips Nv Microscope electronique pour la formation d'une image de phase qui n'est pas deduite d'images de difference
EP0040751A2 (fr) * 1980-05-22 1981-12-02 Siemens Aktiengesellschaft Système d'enclenchement de l'alimentation d'un accélérateur linéaire
EP0168983A1 (fr) * 1984-06-20 1986-01-22 Ibt-Dubilier Limited Microscope à balayage optique

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0610001U (ja) * 1992-07-14 1994-02-08 正雄 宮前 台 車

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2133318A5 (fr) * 1971-04-16 1972-11-24 Thomson Csf
FR2215701A1 (fr) * 1973-01-26 1974-08-23 Cgr Mev

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2133318A5 (fr) * 1971-04-16 1972-11-24 Thomson Csf
FR2215701A1 (fr) * 1973-01-26 1974-08-23 Cgr Mev

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2423860A1 (fr) * 1978-04-17 1979-11-16 Philips Nv Microscope electronique pour la formation d'une image de phase qui n'est pas deduite d'images de difference
EP0040751A2 (fr) * 1980-05-22 1981-12-02 Siemens Aktiengesellschaft Système d'enclenchement de l'alimentation d'un accélérateur linéaire
EP0040751A3 (en) * 1980-05-22 1983-06-08 Siemens Aktiengesellschaft Energy interlock system for a linear accelerator
EP0168983A1 (fr) * 1984-06-20 1986-01-22 Ibt-Dubilier Limited Microscope à balayage optique

Also Published As

Publication number Publication date
DE2604672A1 (de) 1976-08-19
JPS51102800A (ja) 1976-09-10
JPS5823704B2 (ja) 1983-05-17
FR2300414B2 (fr) 1978-12-01
CA1067624A (fr) 1979-12-04
CH588086A5 (fr) 1977-05-31
NL7601175A (nl) 1976-08-10
GB1558601A (en) 1980-01-09
DE2604672C2 (de) 1984-09-27

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