FR2295492B1 - - Google Patents

Info

Publication number
FR2295492B1
FR2295492B1 FR7538384A FR7538384A FR2295492B1 FR 2295492 B1 FR2295492 B1 FR 2295492B1 FR 7538384 A FR7538384 A FR 7538384A FR 7538384 A FR7538384 A FR 7538384A FR 2295492 B1 FR2295492 B1 FR 2295492B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7538384A
Other versions
FR2295492A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull HN Information Systems Italia SpA
Bull HN Information Systems Inc
Original Assignee
Honeywell Information Systems Italia SpA
Honeywell Information Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Information Systems Italia SpA, Honeywell Information Systems Inc filed Critical Honeywell Information Systems Italia SpA
Publication of FR2295492A1 publication Critical patent/FR2295492A1/fr
Application granted granted Critical
Publication of FR2295492B1 publication Critical patent/FR2295492B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
FR7538384A 1974-12-17 1975-12-15 Expired FR2295492B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/533,743 US4048481A (en) 1974-12-17 1974-12-17 Diagnostic testing apparatus and method

Publications (2)

Publication Number Publication Date
FR2295492A1 FR2295492A1 (fr) 1976-07-16
FR2295492B1 true FR2295492B1 (fr) 1982-02-05

Family

ID=24127277

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7538384A Expired FR2295492B1 (fr) 1974-12-17 1975-12-15

Country Status (6)

Country Link
US (1) US4048481A (fr)
JP (1) JPS5852259B2 (fr)
CA (1) CA1065052A (fr)
DE (1) DE2555658A1 (fr)
FR (1) FR2295492B1 (fr)
GB (1) GB1534710A (fr)

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JPH0789328B2 (ja) * 1988-05-31 1995-09-27 日本電気株式会社 データ処理装置
US5547682A (en) * 1989-12-22 1996-08-20 Bioquest, Incorporated Preparation and use of novel injectable RES avoiding inorganic particles for medical application
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JP2842004B2 (ja) * 1992-02-03 1998-12-24 日本電気株式会社 回路のテスト方式
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US5717850A (en) * 1996-03-12 1998-02-10 International Business Machines Corporation Efficient system for predicting and processing storage subsystem failure
EP0821307B1 (fr) * 1996-07-23 2003-05-02 Hewlett-Packard Company, A Delaware Corporation Indication d'erreurs pour un système de stockage avec des unités de stockage échangeables
US6311298B1 (en) 1999-02-17 2001-10-30 Rise Technology Company Mechanism to simplify built-in self test of a control store unit
DE10041137A1 (de) * 2000-08-21 2002-03-21 Philips Corp Intellectual Pty Anordnung zum Testen von integrierten Schaltkreisen
US8552709B2 (en) * 2004-02-18 2013-10-08 Tasco Inc. Systems and methods for locating a circuit
WO2005117421A1 (fr) * 2004-05-28 2005-12-08 Matsushita Electric Industrial Co., Ltd. Substrat de silicium pour support magnétique d'enregistrement, procédé de fabrication de celui-ci et support magnétique d'enregistrement
DE102006001873B4 (de) * 2006-01-13 2009-12-24 Infineon Technologies Ag Vorrichtung und Verfahren zum Überprüfen einer Fehlererkennungsfunktionalität einer Speicherschaltung
DE102006001872B4 (de) * 2006-01-13 2013-08-22 Infineon Technologies Ag Vorrichtung und Verfahren zum Überprüfen einer Fehlererkennungsfunktionalität einer Datenverarbeitungseinrichtung auf Angriffe
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US8935466B2 (en) 2011-03-28 2015-01-13 SMART Storage Systems, Inc. Data storage system with non-volatile memory and method of operation thereof
US8908485B2 (en) * 2011-05-31 2014-12-09 International Business Machines Corporation Extended diagnostic overlay control for tape storage devices
US9098399B2 (en) 2011-08-31 2015-08-04 SMART Storage Systems, Inc. Electronic system with storage management mechanism and method of operation thereof
US9063844B2 (en) 2011-09-02 2015-06-23 SMART Storage Systems, Inc. Non-volatile memory management system with time measure mechanism and method of operation thereof
US9021231B2 (en) 2011-09-02 2015-04-28 SMART Storage Systems, Inc. Storage control system with write amplification control mechanism and method of operation thereof
US9021319B2 (en) 2011-09-02 2015-04-28 SMART Storage Systems, Inc. Non-volatile memory management system with load leveling and method of operation thereof
RU2475821C1 (ru) * 2011-09-19 2013-02-20 Открытое акционерное общество "Авангард" Способ предварительной оценки качества диагностических тестов
US9239781B2 (en) 2012-02-07 2016-01-19 SMART Storage Systems, Inc. Storage control system with erase block mechanism and method of operation thereof
US9298252B2 (en) 2012-04-17 2016-03-29 SMART Storage Systems, Inc. Storage control system with power down mechanism and method of operation thereof
US8949689B2 (en) * 2012-06-11 2015-02-03 SMART Storage Systems, Inc. Storage control system with data management mechanism and method of operation thereof
US9671962B2 (en) 2012-11-30 2017-06-06 Sandisk Technologies Llc Storage control system with data management mechanism of parity and method of operation thereof
US9123445B2 (en) 2013-01-22 2015-09-01 SMART Storage Systems, Inc. Storage control system with data management mechanism and method of operation thereof
US9329928B2 (en) 2013-02-20 2016-05-03 Sandisk Enterprise IP LLC. Bandwidth optimization in a non-volatile memory system
US9214965B2 (en) 2013-02-20 2015-12-15 Sandisk Enterprise Ip Llc Method and system for improving data integrity in non-volatile storage
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US9170941B2 (en) 2013-04-05 2015-10-27 Sandisk Enterprises IP LLC Data hardening in a storage system
US10049037B2 (en) 2013-04-05 2018-08-14 Sandisk Enterprise Ip Llc Data management in a storage system
US9543025B2 (en) 2013-04-11 2017-01-10 Sandisk Technologies Llc Storage control system with power-off time estimation mechanism and method of operation thereof
US10546648B2 (en) 2013-04-12 2020-01-28 Sandisk Technologies Llc Storage control system with data management mechanism and method of operation thereof
US9898056B2 (en) 2013-06-19 2018-02-20 Sandisk Technologies Llc Electronic assembly with thermal channel and method of manufacture thereof
US9313874B2 (en) 2013-06-19 2016-04-12 SMART Storage Systems, Inc. Electronic system with heat extraction and method of manufacture thereof
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US9448946B2 (en) 2013-08-07 2016-09-20 Sandisk Technologies Llc Data storage system with stale data mechanism and method of operation thereof
US9152555B2 (en) 2013-11-15 2015-10-06 Sandisk Enterprise IP LLC. Data management with modular erase in a data storage system
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CN110333975B (zh) * 2019-04-18 2023-05-02 深圳市德明利技术股份有限公司 一种存储设备的测试方法和装置以及设备
CN112104489B (zh) * 2020-09-02 2023-03-14 中国航空工业集团公司西安飞行自动控制研究所 一种对通讯无干扰的高速实时数据捕获方法
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US3831148A (en) * 1973-01-02 1974-08-20 Honeywell Inf Systems Nonexecute test apparatus
US3838260A (en) * 1973-01-22 1974-09-24 Xerox Corp Microprogrammable control memory diagnostic system
US3873819A (en) * 1973-12-10 1975-03-25 Honeywell Inf Systems Apparatus and method for fault-condition signal processing

Also Published As

Publication number Publication date
AU8689775A (en) 1977-06-02
GB1534710A (en) 1978-12-06
FR2295492A1 (fr) 1976-07-16
US4048481A (en) 1977-09-13
CA1065052A (fr) 1979-10-23
JPS5852259B2 (ja) 1983-11-21
JPS5183744A (en) 1976-07-22
DE2555658A1 (de) 1976-07-01

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Legal Events

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ST Notification of lapse