FR2242754B1 - - Google Patents

Info

Publication number
FR2242754B1
FR2242754B1 FR7424585*A FR7424585A FR2242754B1 FR 2242754 B1 FR2242754 B1 FR 2242754B1 FR 7424585 A FR7424585 A FR 7424585A FR 2242754 B1 FR2242754 B1 FR 2242754B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7424585*A
Other versions
FR2242754A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2242754A1 publication Critical patent/FR2242754A1/fr
Application granted granted Critical
Publication of FR2242754B1 publication Critical patent/FR2242754B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1471—Arrangements for directing or deflecting the discharge along a desired path for centering, aligning or positioning of ray or beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H01J37/3045—Object or beam position registration
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2446—Position sensitive detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
FR7424585*A 1973-08-31 1974-06-28 Expired FR2242754B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US393365A US3894271A (en) 1973-08-31 1973-08-31 Method and apparatus for aligning electron beams

Publications (2)

Publication Number Publication Date
FR2242754A1 FR2242754A1 (fr) 1975-03-28
FR2242754B1 true FR2242754B1 (fr) 1976-10-22

Family

ID=23554399

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7424585*A Expired FR2242754B1 (fr) 1973-08-31 1974-06-28

Country Status (4)

Country Link
US (1) US3894271A (fr)
JP (1) JPS5055270A (fr)
DE (1) DE2441421A1 (fr)
FR (1) FR2242754B1 (fr)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2294489A1 (fr) * 1974-12-13 1976-07-09 Thomson Csf Dispositif pour le trace programme de dessins par bombardement de particules
JPS524328A (en) * 1975-06-27 1977-01-13 Fujitsu Ltd Device for making figures
JPS5398781A (en) * 1976-11-25 1978-08-29 Jeol Ltd Electron ray exposure unit
JPS5365668A (en) * 1976-11-25 1978-06-12 Jeol Ltd Electron beam exposure device
US4117339A (en) * 1977-07-01 1978-09-26 Burroughs Corporation Double deflection electron beam generator for employment in the fabrication of semiconductor and other devices
DE2739502C3 (de) * 1977-09-02 1980-07-03 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren zur Belichtung durch Korpuskularstrahlen-Schattenwurf und Vorrichtung zur Durchführung des Verfahrens
US4213053A (en) * 1978-11-13 1980-07-15 International Business Machines Corporation Electron beam system with character projection capability
US4243866A (en) * 1979-01-11 1981-01-06 International Business Machines Corporation Method and apparatus for forming a variable size electron beam
JPS55146931A (en) * 1979-05-04 1980-11-15 Hitachi Ltd Depicting method by electronic beam
DE2937136A1 (de) * 1979-09-13 1981-04-02 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur schnellen ablenkung eines korpuskularstrahls
JPS5740927A (en) * 1980-08-26 1982-03-06 Fujitsu Ltd Exposing method of electron beam
US4376249A (en) * 1980-11-06 1983-03-08 International Business Machines Corporation Variable axis electron beam projection system
JPS57204125A (en) * 1981-06-10 1982-12-14 Hitachi Ltd Electron-ray drawing device
JPS57209786A (en) * 1981-06-17 1982-12-23 Hitachi Ltd Electron beam machining device
US4423305A (en) * 1981-07-30 1983-12-27 International Business Machines Corporation Method and apparatus for controlling alignment of an electron beam of a variable shape
JPS58152354A (ja) * 1982-03-05 1983-09-09 Hitachi Ltd 電子顕微鏡の軸調整装置
US4568861A (en) * 1983-06-27 1986-02-04 International Business Machines Corporation Method and apparatus for controlling alignment and brightness of an electron beam
FR2559695B1 (fr) * 1984-02-20 1995-04-21 Mitsubishi Electric Corp Procede et appareil pour detecter et reguler la position d'un faisceau electronique de soudage
JPS60201626A (ja) * 1984-03-27 1985-10-12 Canon Inc 位置合わせ装置
JPS6132422A (ja) * 1984-07-24 1986-02-15 Hitachi Ltd 電子線描画装置
DE4024084A1 (de) * 1989-11-29 1991-06-06 Daimler Benz Ag Verfahren zum herstellen von hohlen gaswechselventilen fuer hubkolbenmaschinen
US5546319A (en) * 1994-01-28 1996-08-13 Fujitsu Limited Method of and system for charged particle beam exposure
JP3455005B2 (ja) * 1996-03-25 2003-10-06 株式会社東芝 荷電ビーム露光装置
US6246190B1 (en) * 1999-07-30 2001-06-12 Etec Systems, Inc. Integrated electron gun and electronics module
US6090528A (en) * 1999-10-27 2000-07-18 Gordon; Michael S. Spot-to-spot stitching in electron beam lithography utilizing square aperture with serrated edge
US7102979B2 (en) * 2001-11-07 2006-09-05 Hewlett-Packard Development Company, Lp. Systems and methods for controlling the voltage on the lens of electron emitter devices
JP4520426B2 (ja) * 2005-07-04 2010-08-04 株式会社ニューフレアテクノロジー 電子ビームのビームドリフト補正方法及び電子ビームの描画方法
US7209055B1 (en) * 2005-10-03 2007-04-24 Applied Materials, Inc. Electrostatic particle beam deflector
US7476880B2 (en) * 2005-10-03 2009-01-13 Applied Materials, Inc. Writing a circuit design pattern with shaped particle beam flashes
US7427765B2 (en) * 2005-10-03 2008-09-23 Jeol, Ltd. Electron beam column for writing shaped electron beams
JP5977550B2 (ja) * 2012-03-22 2016-08-24 株式会社ニューフレアテクノロジー マルチ荷電粒子ビーム描画装置
JP5927067B2 (ja) * 2012-07-06 2016-05-25 株式会社日立ハイテクノロジーズ 計測検査装置、及び計測検査方法
JP6665809B2 (ja) * 2017-02-24 2020-03-13 株式会社ニューフレアテクノロジー マルチ荷電粒子ビーム描画装置及びその調整方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2627589A (en) * 1950-10-30 1953-02-03 Rca Corp Focusing of electron optical apparatus
US3644700A (en) * 1969-12-15 1972-02-22 Ibm Method and apparatus for controlling an electron beam
US3699304A (en) * 1969-12-15 1972-10-17 Ibm Electron beam deflection control method and apparatus
US3745358A (en) * 1971-05-10 1973-07-10 Radiant Energy Systems Alignment method and apparatus for electron projection systems

Also Published As

Publication number Publication date
DE2441421A1 (de) 1975-03-13
US3894271A (en) 1975-07-08
JPS5055270A (fr) 1975-05-15
FR2242754A1 (fr) 1975-03-28

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Legal Events

Date Code Title Description
ST Notification of lapse