FR2233762B1 - - Google Patents

Info

Publication number
FR2233762B1
FR2233762B1 FR7419675A FR7419675A FR2233762B1 FR 2233762 B1 FR2233762 B1 FR 2233762B1 FR 7419675 A FR7419675 A FR 7419675A FR 7419675 A FR7419675 A FR 7419675A FR 2233762 B1 FR2233762 B1 FR 2233762B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7419675A
Other versions
FR2233762A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems Electronics Ltd
Original Assignee
Marconi Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Co Ltd filed Critical Marconi Co Ltd
Publication of FR2233762A1 publication Critical patent/FR2233762A1/fr
Application granted granted Critical
Publication of FR2233762B1 publication Critical patent/FR2233762B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/31853—Test of registers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/58—Random or pseudo-random number generators
    • G06F7/582—Pseudo-random number generators
    • G06F7/584—Pseudo-random number generators using finite field arithmetic, e.g. using a linear feedback shift register
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2207/00—Indexing scheme relating to methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F2207/58—Indexing scheme relating to groups G06F7/58 - G06F7/588
    • G06F2207/581—Generating an LFSR sequence, e.g. an m-sequence; sequence may be generated without LFSR, e.g. using Galois Field arithmetic
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2207/00—Indexing scheme relating to methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F2207/58—Indexing scheme relating to groups G06F7/58 - G06F7/588
    • G06F2207/583—Serial finite field implementation, i.e. serial implementation of finite field arithmetic, generating one new bit or trit per step, e.g. using an LFSR or several independent LFSRs; also includes PRNGs with parallel operation between LFSR and outputs

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Computational Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Error Detection And Correction (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
FR7419675A 1973-06-15 1974-06-07 Expired FR2233762B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2850673A GB1431218A (en) 1973-06-15 1973-06-15 Pseudorandom binary sequence error counters

Publications (2)

Publication Number Publication Date
FR2233762A1 FR2233762A1 (fr) 1975-01-10
FR2233762B1 true FR2233762B1 (fr) 1976-12-24

Family

ID=10276715

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7419675A Expired FR2233762B1 (fr) 1973-06-15 1974-06-07

Country Status (4)

Country Link
US (1) US3895349A (fr)
DE (1) DE2420440B2 (fr)
FR (1) FR2233762B1 (fr)
GB (1) GB1431218A (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2345017A1 (fr) * 1976-03-17 1977-10-14 Lainey Gilbert Dispositifs de mesure du taux d'erreur sur les elements binaires d'une liaison numerique
FR2345016A1 (fr) * 1976-03-17 1977-10-14 Lainey Gilbert Dispositifs de mesure du taux d'erreur sur les elements binaires d'une liaison numerique
GB1530406A (en) * 1976-05-12 1978-11-01 Post Office Detection of errors in digital signals
US5351301A (en) * 1980-03-03 1994-09-27 The United States Of America As Represented By The Director Of National Security Agency Authenticator circuit
US4317206A (en) * 1980-05-12 1982-02-23 Rca Corporation On line quality monitoring
JPS59327A (ja) * 1982-06-26 1984-01-05 Denki Kagaku Kogyo Kk 高温反応物質の製法
US4592044A (en) * 1984-05-22 1986-05-27 At&T Information Systems Inc. Apparatus and method for checking time slot integrity of a switching system
US5673279A (en) * 1995-11-06 1997-09-30 Sun Microsystems, Inc. Verification of network transporter in networking environments
US5978424A (en) * 1996-11-18 1999-11-02 Zenith Electronics Corporation Frame identification system
US6453431B1 (en) 1999-07-01 2002-09-17 International Business Machines Corporation System technique for detecting soft errors in statically coupled CMOS logic
FR2824915A1 (fr) * 2001-05-15 2002-11-22 Koninkl Philips Electronics Nv Dispositif de test de la conformite d'une connexion
US7627029B2 (en) 2003-05-20 2009-12-01 Rambus Inc. Margin test methods and circuits
US7336749B2 (en) * 2004-05-18 2008-02-26 Rambus Inc. Statistical margin test methods and circuits

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3315228A (en) * 1963-08-19 1967-04-18 Futerfas Jack System for digital communication error measurements including shift registers with identical feedback connections
US3475724A (en) * 1965-10-08 1969-10-28 Bell Telephone Labor Inc Error control system

Also Published As

Publication number Publication date
GB1431218A (en) 1976-04-07
FR2233762A1 (fr) 1975-01-10
DE2420440A1 (de) 1975-01-09
US3895349A (en) 1975-07-15
DE2420440B2 (de) 1978-03-02

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Legal Events

Date Code Title Description
ST Notification of lapse