FR2212621A1 - - Google Patents
Info
- Publication number
- FR2212621A1 FR2212621A1 FR7341688A FR7341688A FR2212621A1 FR 2212621 A1 FR2212621 A1 FR 2212621A1 FR 7341688 A FR7341688 A FR 7341688A FR 7341688 A FR7341688 A FR 7341688A FR 2212621 A1 FR2212621 A1 FR 2212621A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/037—Diffusion-deposition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/085—Isolated-integrated
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/117—Oxidation, selective
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/145—Shaped junctions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/151—Simultaneous diffusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/162—Testing steps
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Automation & Control Theory (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US31912072A | 1972-12-29 | 1972-12-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2212621A1 true FR2212621A1 (US08118993-20120221-C00002.png) | 1974-07-26 |
| FR2212621B1 FR2212621B1 (US08118993-20120221-C00002.png) | 1977-09-30 |
Family
ID=23240934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7341688A Expired FR2212621B1 (US08118993-20120221-C00002.png) | 1972-12-29 | 1973-11-14 |
Country Status (6)
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2280203A1 (fr) * | 1974-07-26 | 1976-02-20 | Thomson Csf | Procede d'ajustement de tension de seuil de transistors a effet de champ |
| US4078243A (en) * | 1975-12-12 | 1978-03-07 | International Business Machines Corporation | Phototransistor array having uniform current response and method of manufacture |
| US4079408A (en) * | 1975-12-31 | 1978-03-14 | International Business Machines Corporation | Semiconductor structure with annular collector/subcollector region |
| US4064527A (en) * | 1976-09-20 | 1977-12-20 | Intersil, Inc. | Integrated circuit having a buried load device |
| JPS5793542A (en) * | 1980-12-03 | 1982-06-10 | Hitachi Ltd | Semiconductor integrated circuit device |
| JPS5799907A (en) * | 1980-12-12 | 1982-06-21 | Hitachi Ltd | Electromotive brush |
| US4413271A (en) * | 1981-03-30 | 1983-11-01 | Sprague Electric Company | Integrated circuit including test portion and method for making |
| JPS59123242A (ja) * | 1982-12-29 | 1984-07-17 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | テスト・デバイスを有する半導体基板 |
| US4542340A (en) * | 1982-12-30 | 1985-09-17 | Ibm Corporation | Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells |
| JPS61105028U (US08118993-20120221-C00002.png) * | 1984-12-14 | 1986-07-03 | ||
| JPS63115330U (US08118993-20120221-C00002.png) * | 1987-01-22 | 1988-07-25 | ||
| US5101152A (en) * | 1990-01-31 | 1992-03-31 | Hewlett-Packard Company | Integrated circuit transfer test device system utilizing lateral transistors |
| JP2530722Y2 (ja) * | 1990-07-18 | 1997-03-26 | 日本電気株式会社 | 半導体装置 |
| US5214657A (en) * | 1990-09-21 | 1993-05-25 | Micron Technology, Inc. | Method for fabricating wafer-scale integration wafers and method for utilizing defective wafer-scale integration wafers |
| US5217907A (en) * | 1992-01-28 | 1993-06-08 | National Semiconductor Corporation | Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction |
| KR100375177B1 (ko) * | 1995-05-19 | 2003-05-09 | 마츠시타 덴끼 산교 가부시키가이샤 | 반도체 장치의 검사방법 |
| IT1296624B1 (it) * | 1997-12-10 | 1999-07-14 | Sgs Thomson Microelectronics | Struttura e metodo per la valutazione di un dispositivo elettronico integrato. |
| DE10014914C2 (de) * | 2000-03-17 | 2003-07-24 | Infineon Technologies Ag | Verfahren zur Herstellung und Überprüfung von Strukturen elektronischer Schaltungen in einem Halbleitersubstrat |
| RU174463U1 (ru) * | 2017-03-17 | 2017-10-16 | Федеральное государственное унитарное предприятие "Ростовский-на-Дону научно-исследовательский институт радиосвязи" (ФГУП "РНИИРС") | Тестовый полевой транзистор Шоттки |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3335340A (en) * | 1964-02-24 | 1967-08-08 | Ibm | Combined transistor and testing structures and fabrication thereof |
| FR1064185A (fr) * | 1967-05-23 | 1954-05-11 | Philips Nv | Procédé de fabrication d'un système d'électrodes |
-
1972
- 1972-12-29 US US00319120A patent/US3774088A/en not_active Expired - Lifetime
-
1973
- 1973-10-17 IT IT30202/73A patent/IT1001593B/it active
- 1973-11-05 CA CA185,033A patent/CA996280A/en not_active Expired
- 1973-11-14 FR FR7341688A patent/FR2212621B1/fr not_active Expired
- 1973-11-27 JP JP48132261A patent/JPS5132959B2/ja not_active Expired
- 1973-12-05 GB GB5636173A patent/GB1441800A/en not_active Expired
Non-Patent Citations (2)
| Title |
|---|
| 'DUMBBELL RESISTOR TEST STRUCTURA', I. MAGDO ET S. MAGDO PAGES 1330-1331.) * |
| REVUE US 'IBM TECHNICAL DISCLOSURE BULLETIN', VOLUME 15, N 4, SEPTEMBRE 1972, * |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1441800A (en) | 1976-07-07 |
| IT1001593B (it) | 1976-04-30 |
| FR2212621B1 (US08118993-20120221-C00002.png) | 1977-09-30 |
| JPS5132959B2 (US08118993-20120221-C00002.png) | 1976-09-16 |
| JPS4998982A (US08118993-20120221-C00002.png) | 1974-09-19 |
| US3774088A (en) | 1973-11-20 |
| CA996280A (en) | 1976-08-31 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |