FR2125896A5 - - Google Patents
Info
- Publication number
- FR2125896A5 FR2125896A5 FR7204841A FR7204841A FR2125896A5 FR 2125896 A5 FR2125896 A5 FR 2125896A5 FR 7204841 A FR7204841 A FR 7204841A FR 7204841 A FR7204841 A FR 7204841A FR 2125896 A5 FR2125896 A5 FR 2125896A5
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH231471A CH535430A (de) | 1971-02-17 | 1971-02-17 | Verfahren und Vorrichtung zur Detektierung von staubförmigen Partikeln |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR2125896A5 true FR2125896A5 (OSRAM) | 1972-09-29 |
Family
ID=4230893
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7204841A Expired FR2125896A5 (OSRAM) | 1971-02-17 | 1972-02-14 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3767306A (OSRAM) |
| CA (1) | CA954717A (OSRAM) |
| CH (1) | CH535430A (OSRAM) |
| DE (1) | DE2206597A1 (OSRAM) |
| FR (1) | FR2125896A5 (OSRAM) |
| GB (1) | GB1376017A (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2466767A1 (fr) * | 1979-08-10 | 1981-04-10 | Bosch Gmbh Robert | Procede pour tester la qualite de l'ensemble constitue par un balai d'essuie-glace et la surface de la glace |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4121247A (en) * | 1977-04-21 | 1978-10-17 | Eastman Kodak Company | Population and profile display of transparent bodies in a transparent mass |
| US4215939A (en) * | 1977-12-22 | 1980-08-05 | Owens-Illinois, Inc. | Glue drop detector |
| US4402607A (en) * | 1980-05-16 | 1983-09-06 | Gca Corporation | Automatic detector for microscopic dust on large-area, optically unpolished surfaces |
| US4441124A (en) * | 1981-11-05 | 1984-04-03 | Western Electric Company, Inc. | Technique for inspecting semiconductor wafers for particulate contamination |
| US4863268A (en) * | 1984-02-14 | 1989-09-05 | Diffracto Ltd. | Diffractosight improvements |
| US4636073A (en) * | 1984-10-31 | 1987-01-13 | International Business Machines Corporation | Universal calibration standard for surface inspection systems |
| US5206700A (en) * | 1985-03-14 | 1993-04-27 | Diffracto, Ltd. | Methods and apparatus for retroreflective surface inspection and distortion measurement |
| US5061068A (en) * | 1990-02-22 | 1991-10-29 | Research Triangle Institute | Process for detection of sub-micron particulate contamination on a bare (planar) substrate |
| US5168322A (en) * | 1991-08-19 | 1992-12-01 | Diffracto Ltd. | Surface inspection using retro-reflective light field |
| US5745238A (en) * | 1992-12-22 | 1998-04-28 | International Business Machines Corporation | Apparatus and method for non-destructive inspection and/or measurement |
| JPH06349916A (ja) * | 1993-04-30 | 1994-12-22 | Applied Materials Inc | 基板上の粒子検出方法及び装置 |
| JP3168961B2 (ja) * | 1997-10-06 | 2001-05-21 | 住友電気工業株式会社 | ダイヤモンド基板及びダイヤモンド基板の評価方法並びにダイヤモンド表面弾性波フィルタ |
| JP3919149B2 (ja) * | 2000-03-24 | 2007-05-23 | パイオニア株式会社 | 光ヘッド装置 |
| DE10221945C1 (de) * | 2002-05-13 | 2003-07-31 | Schott Glas | Verfahren und Vorrichtung zur Ermittlung von Fehlstellen in einem kontinuierlich fortbewegten Band aus transparentem Material |
| FR2993372B1 (fr) * | 2012-07-13 | 2015-04-10 | Commissariat Energie Atomique | Procede et systeme de reconstruction de proprietes optiques d'objets diffractants baignant dans un milieu liquide |
| CN103604731A (zh) * | 2013-11-25 | 2014-02-26 | 中煤科工集团重庆研究院有限公司 | 抗污染的粉尘检测机构 |
| JP7309640B2 (ja) * | 2020-03-18 | 2023-07-18 | 株式会社東芝 | 光学検査装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2604809A (en) * | 1948-06-01 | 1952-07-29 | Mitchell Reginald Fawn | Optical means for evaluating surface finish by measurement of differential light scattering in a schlieren type optical system |
| US2850239A (en) * | 1952-08-16 | 1958-09-02 | American Optical Corp | Counting device |
| US2950648A (en) * | 1954-03-03 | 1960-08-30 | Georgia Tech Res Inst | Microscope for viewing substantially transparent objects |
| US2918216A (en) * | 1956-08-31 | 1959-12-22 | Rca Corp | Particle counting apparatus |
| US2977847A (en) * | 1957-04-29 | 1961-04-04 | Univ Ohio State Res Found | Optical system for microscopes or similar instruments |
| US3335413A (en) * | 1963-12-19 | 1967-08-08 | Gen Electric | Wide band optical recording and narrow band reproduction on a thermo-plastic medium |
| SE315760B (OSRAM) * | 1966-04-27 | 1969-10-06 | Saab Ab |
-
1971
- 1971-02-17 CH CH231471A patent/CH535430A/de not_active IP Right Cessation
-
1972
- 1972-02-09 US US00224721A patent/US3767306A/en not_active Expired - Lifetime
- 1972-02-10 CA CA134,404A patent/CA954717A/en not_active Expired
- 1972-02-11 DE DE19722206597 patent/DE2206597A1/de active Pending
- 1972-02-14 FR FR7204841A patent/FR2125896A5/fr not_active Expired
- 1972-02-14 GB GB682172A patent/GB1376017A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2466767A1 (fr) * | 1979-08-10 | 1981-04-10 | Bosch Gmbh Robert | Procede pour tester la qualite de l'ensemble constitue par un balai d'essuie-glace et la surface de la glace |
Also Published As
| Publication number | Publication date |
|---|---|
| US3767306A (en) | 1973-10-23 |
| DE2206597A1 (de) | 1972-08-31 |
| GB1376017A (en) | 1974-12-04 |
| CA954717A (en) | 1974-09-17 |
| CH535430A (de) | 1973-03-31 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |