FR2063832A5 - - Google Patents

Info

Publication number
FR2063832A5
FR2063832A5 FR7006647A FR7006647A FR2063832A5 FR 2063832 A5 FR2063832 A5 FR 2063832A5 FR 7006647 A FR7006647 A FR 7006647A FR 7006647 A FR7006647 A FR 7006647A FR 2063832 A5 FR2063832 A5 FR 2063832A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7006647A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Licentia Patent Verwaltungs GmbH
Original Assignee
Licentia Patent Verwaltungs GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19691910314 external-priority patent/DE1910314C3/de
Application filed by Licentia Patent Verwaltungs GmbH filed Critical Licentia Patent Verwaltungs GmbH
Application granted granted Critical
Publication of FR2063832A5 publication Critical patent/FR2063832A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR7006647A 1969-02-28 1970-02-24 Expired FR2063832A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691910314 DE1910314C3 (de) 1969-02-28 Kontaktvorrichtung für eine Meßanordnung zur dynamischen Messung von Halbleiterparametern

Publications (1)

Publication Number Publication Date
FR2063832A5 true FR2063832A5 (fr) 1971-07-09

Family

ID=5726726

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7006647A Expired FR2063832A5 (fr) 1969-02-28 1970-02-24

Country Status (2)

Country Link
FR (1) FR2063832A5 (fr)
GB (1) GB1299241A (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2130383B (en) * 1982-09-14 1986-06-04 Risho Kogyo Kk Test board for semiconductor packages

Also Published As

Publication number Publication date
GB1299241A (en) 1972-12-13
DE1910314B2 (de) 1977-03-17
DE1910314A1 (de) 1970-10-08

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Legal Events

Date Code Title Description
ST Notification of lapse