FR2026374A1 - - Google Patents

Info

Publication number
FR2026374A1
FR2026374A1 FR6943775A FR6943775A FR2026374A1 FR 2026374 A1 FR2026374 A1 FR 2026374A1 FR 6943775 A FR6943775 A FR 6943775A FR 6943775 A FR6943775 A FR 6943775A FR 2026374 A1 FR2026374 A1 FR 2026374A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR6943775A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Publication of FR2026374A1 publication Critical patent/FR2026374A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
FR6943775A 1968-12-17 1969-12-17 Withdrawn FR2026374A1 (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5994068 1968-12-17

Publications (1)

Publication Number Publication Date
FR2026374A1 true FR2026374A1 (enrdf_load_stackoverflow) 1970-09-18

Family

ID=10484703

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6943775A Withdrawn FR2026374A1 (enrdf_load_stackoverflow) 1968-12-17 1969-12-17

Country Status (6)

Country Link
US (1) US3849656A (enrdf_load_stackoverflow)
DE (1) DE1962617A1 (enrdf_load_stackoverflow)
FR (1) FR2026374A1 (enrdf_load_stackoverflow)
GB (1) GB1252569A (enrdf_load_stackoverflow)
NL (1) NL6918712A (enrdf_load_stackoverflow)
SE (1) SE356396B (enrdf_load_stackoverflow)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3924134A (en) * 1974-11-29 1975-12-02 Ibm Double chamber ion source
JPS5522741B2 (enrdf_load_stackoverflow) * 1975-01-16 1980-06-18
US4016421A (en) * 1975-02-13 1977-04-05 E. I. Du Pont De Nemours And Company Analytical apparatus with variable energy ion beam source
US4066894A (en) * 1976-01-20 1978-01-03 University Of Virginia Positive and negative ion recording system for mass spectrometer
JPS5812982B2 (ja) * 1976-10-01 1983-03-11 株式会社日立製作所 化学イオン化イオン源
US4164654A (en) * 1978-02-14 1979-08-14 The South African Inventions Development Corporation Device for generating an atomic cloud
US4314180A (en) * 1979-10-16 1982-02-02 Occidental Research Corporation High density ion source
JPS59113175A (ja) * 1982-12-20 1984-06-29 Nisshin Haiboruteeji Kk 負イオン源
US4855602A (en) * 1986-06-20 1989-08-08 Sharma Devendra N Beam deflector
US5331158A (en) * 1992-12-07 1994-07-19 Hewlett-Packard Company Method and arrangement for time of flight spectrometry
US5808308A (en) * 1996-05-03 1998-09-15 Leybold Inficon Inc. Dual ion source
US6759807B2 (en) 2002-04-04 2004-07-06 Veeco Instruments, Inc. Multi-grid ion beam source for generating a highly collimated ion beam
WO2006070744A1 (ja) * 2004-12-28 2006-07-06 Kyoto Institute Of Technology 荷電粒子発生装置及び加速器
US7402799B2 (en) * 2005-10-28 2008-07-22 Northrop Grumman Corporation MEMS mass spectrometer
WO2013059724A1 (en) 2011-10-21 2013-04-25 California Institute Of Technology System and method for determining the isotopic anatomy of organic and volatile molecules
JP5680008B2 (ja) * 2012-03-08 2015-03-04 株式会社東芝 イオン源、重粒子線照射装置、イオン源の駆動方法、および、重粒子線照射方法
GB2521579B (en) * 2012-10-10 2018-12-19 California Inst Of Techn Mass spectrometer, system and use of the mass spectrometer for determining isotopic anatomy of compounds
JP2020535622A (ja) * 2017-09-29 2020-12-03 パーキンエルマー・ヘルス・サイエンシーズ・カナダ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ Ｃａｎａｄａ， Ｉｎｃ． 軸外イオン化デバイスおよびシステム
US11328919B2 (en) * 2018-05-11 2022-05-10 Leco Corporation Two-stage ion source comprising closed and open ion volumes

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3355587A (en) * 1951-01-28 1967-11-28 Jenckel Ludolf Gas analysis apparatus comprising plural ionization chambers with different ionizing electron beam energy levels in the chambers
US2772362A (en) * 1955-04-26 1956-11-27 Gen Electric Ion source for a mass spectrometer
US3405263A (en) * 1966-01-14 1968-10-08 Exxon Research Engineering Co Dual mass spectrometer ion source comprising field ionization and electron bombardment sources and the method of use

Also Published As

Publication number Publication date
SE356396B (enrdf_load_stackoverflow) 1973-05-21
US3849656A (en) 1974-11-19
GB1252569A (enrdf_load_stackoverflow) 1971-11-10
NL6918712A (enrdf_load_stackoverflow) 1970-06-19
DE1962617A1 (de) 1970-07-16

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