FR2000732A1 - - Google Patents

Info

Publication number
FR2000732A1
FR2000732A1 FR6901324A FR6901324A FR2000732A1 FR 2000732 A1 FR2000732 A1 FR 2000732A1 FR 6901324 A FR6901324 A FR 6901324A FR 6901324 A FR6901324 A FR 6901324A FR 2000732 A1 FR2000732 A1 FR 2000732A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR6901324A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Incentive Res
Incentive Research and Development AB
Original Assignee
Incentive Res
Incentive Research and Development AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Incentive Res, Incentive Research and Development AB filed Critical Incentive Res
Publication of FR2000732A1 publication Critical patent/FR2000732A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR6901324A 1968-01-25 1969-01-24 Withdrawn FR2000732A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE1021/68A SE322066B (fr) 1968-01-25 1968-01-25

Publications (1)

Publication Number Publication Date
FR2000732A1 true FR2000732A1 (fr) 1969-09-12

Family

ID=20257460

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6901324A Withdrawn FR2000732A1 (fr) 1968-01-25 1969-01-24

Country Status (6)

Country Link
US (1) US3576993A (fr)
DE (1) DE1902628C3 (fr)
FR (1) FR2000732A1 (fr)
GB (1) GB1255358A (fr)
NL (1) NL167518C (fr)
SE (1) SE322066B (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3714426A (en) * 1970-08-18 1973-01-30 Stoe & Cie Gmbh Method of x-ray analysis of crystal structure an x-ray goniometer for carrying out said method
IL41592A (en) * 1973-02-20 1976-02-29 Tech Res & Dev Found Ltd X-ray spectrodiffractometer
DE2907160C2 (de) * 1979-02-23 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer
US8488740B2 (en) * 2010-11-18 2013-07-16 Panalytical B.V. Diffractometer
CN108387259B (zh) * 2018-03-22 2024-05-17 厦门攸信信息技术有限公司 视觉检测机构及视觉检测系统

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3379876A (en) * 1965-05-12 1968-04-23 Atomic Energy Commission Usa X-ray diffraction camera employing two curved crystal transmission type monochromators

Also Published As

Publication number Publication date
GB1255358A (en) 1971-12-01
US3576993A (en) 1971-05-04
NL6901136A (fr) 1969-07-29
DE1902628C3 (de) 1980-02-28
NL167518B (nl) 1981-07-16
SE322066B (fr) 1970-03-23
NL167518C (nl) 1981-12-16
DE1902628B2 (de) 1979-06-28
DE1902628A1 (de) 1970-08-13

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse