FR1576916A - - Google Patents

Info

Publication number
FR1576916A
FR1576916A FR1576916DA FR1576916A FR 1576916 A FR1576916 A FR 1576916A FR 1576916D A FR1576916D A FR 1576916DA FR 1576916 A FR1576916 A FR 1576916A
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of FR1576916A publication Critical patent/FR1576916A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Radiation Pyrometers (AREA)
FR1576916D 1967-08-16 1968-08-19 Expired FR1576916A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US66102267A 1967-08-16 1967-08-16

Publications (1)

Publication Number Publication Date
FR1576916A true FR1576916A (fr) 1969-08-01

Family

ID=24651877

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1576916D Expired FR1576916A (fr) 1967-08-16 1968-08-19

Country Status (4)

Country Link
US (1) US3462602A (fr)
DE (1) DE1798028C3 (fr)
FR (1) FR1576916A (fr)
GB (1) GB1191540A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0058452A1 (fr) * 1981-02-12 1982-08-25 CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif Procédé et dispositif pour la détection des défauts de surface des profilés et des demi-produits

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3603952A (en) * 1969-05-12 1971-09-07 Millard F Smith Spill sensors
JPS5129431B1 (fr) * 1970-06-10 1976-08-25
JPS5039546B1 (fr) * 1970-08-07 1975-12-17
US3854336A (en) * 1972-01-26 1974-12-17 Monsanto Co Method for detecting thermal changes on a surface
JPS4922178A (fr) * 1972-05-22 1974-02-27
NL171381C (nl) * 1972-06-02 1983-03-16 Shell Int Research Werkwijze voor het opsporen van onvolkomenheden in een warmte-isolerende bekleding.
JPS4924488A (fr) * 1972-06-28 1974-03-04
JPS5746021B2 (fr) * 1972-07-05 1982-09-30
US3940624A (en) * 1972-11-29 1976-02-24 P. R. Mallory & Co., Inc. Apparatus and a method for testing the integrity of a weld
DE3170966D1 (en) * 1981-01-12 1985-07-25 Mannesmann Ag Method and apparatus for inspecting cast strips in a continuous casting machine
US4752140A (en) * 1983-12-02 1988-06-21 Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee Pulsed dilatometric method and device for the detection of delaminations
US4636088A (en) * 1984-05-21 1987-01-13 Therma-Wave, Inc. Method and apparatus for evaluating surface conditions of a sample
US4579463A (en) * 1984-05-21 1986-04-01 Therma-Wave Partners Detecting thermal waves to evaluate thermal parameters
US4679946A (en) * 1984-05-21 1987-07-14 Therma-Wave, Inc. Evaluating both thickness and compositional variables in a thin film sample
US4996426A (en) * 1989-09-11 1991-02-26 National Research Council Of Canada Device for subsurface flaw detection in reflective materials by thermal transfer imaging
US5111048A (en) * 1990-09-27 1992-05-05 General Electric Company Apparatus and method for detecting fatigue cracks using infrared thermography
DE19623159C2 (de) * 1996-06-10 2001-03-15 Fraunhofer Ges Forschung Verfahren und Einrichtung zur Beurteilung eines Körpers unter Erfassung eines Temperaturfeldes des Körpers
US6013915A (en) * 1998-02-10 2000-01-11 Philip Morris Incorporated Process control by transient thermography
US6885444B2 (en) 1998-06-10 2005-04-26 Boxer Cross Inc Evaluating a multi-layered structure for voids
US6049220A (en) 1998-06-10 2000-04-11 Boxer Cross Incorporated Apparatus and method for evaluating a wafer of semiconductor material
US6812047B1 (en) 2000-03-08 2004-11-02 Boxer Cross, Inc. Evaluating a geometric or material property of a multilayered structure
US6911349B2 (en) * 2001-02-16 2005-06-28 Boxer Cross Inc. Evaluating sidewall coverage in a semiconductor wafer
US6958814B2 (en) * 2002-03-01 2005-10-25 Applied Materials, Inc. Apparatus and method for measuring a property of a layer in a multilayered structure
US6971791B2 (en) * 2002-03-01 2005-12-06 Boxer Cross, Inc Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough
DE10217586A1 (de) * 2002-04-19 2003-11-20 Giesecke & Devrient Gmbh Verfahren und Vorrichtung zur Erkennung von Fremdmaterial auf Banknoten
US6963393B2 (en) * 2002-09-23 2005-11-08 Applied Materials, Inc. Measurement of lateral diffusion of diffused layers
US6878559B2 (en) * 2002-09-23 2005-04-12 Applied Materials, Inc. Measurement of lateral diffusion of diffused layers
US7213968B2 (en) * 2002-09-25 2007-05-08 Illinois Tool Works Inc. Hot melt adhesive detection methods and systems
US7026175B2 (en) * 2004-03-29 2006-04-11 Applied Materials, Inc. High throughput measurement of via defects in interconnects
US7379185B2 (en) 2004-11-01 2008-05-27 Applied Materials, Inc. Evaluation of openings in a dielectric layer
US7553070B2 (en) * 2006-11-06 2009-06-30 The Boeing Company Infrared NDI for detecting shallow irregularities
DE102008024394A1 (de) * 2008-05-15 2009-12-03 V&M Deutschland Gmbh Verfahren zur zerstörungsfreien Prüfung von Rohren
CN111443108A (zh) * 2020-03-12 2020-07-24 南京钢铁股份有限公司 一种红外喷标替代磁粉人工查找缺陷定位的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3216241A (en) * 1960-06-23 1965-11-09 Lab For Electronics Inc Moisture gauging system
US3044297A (en) * 1960-09-15 1962-07-17 Industrial Nucleonics Corp Measuring system
US3295842A (en) * 1961-03-15 1967-01-03 Faustel Inc Web temperature control apparatus
US3188256A (en) * 1961-06-22 1965-06-08 Western Electric Co Thermal radiation method of measuring coating thickness
GB960173A (en) * 1961-11-07 1964-06-10 Ici Ltd Improvements in or relating to plastic film manufacture
US3206603A (en) * 1962-08-16 1965-09-14 Gen Electric Infrared flaw detector method and apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0058452A1 (fr) * 1981-02-12 1982-08-25 CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif Procédé et dispositif pour la détection des défauts de surface des profilés et des demi-produits

Also Published As

Publication number Publication date
DE1798028B2 (de) 1973-04-19
US3462602A (en) 1969-08-19
DE1798028C3 (de) 1973-11-08
DE1798028A1 (de) 1972-01-05
GB1191540A (en) 1970-05-13

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Legal Events

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ST Notification of lapse