FR1457408A - Support pour l'essai des composants électroniques - Google Patents

Support pour l'essai des composants électroniques

Info

Publication number
FR1457408A
FR1457408A FR25445A FR25445A FR1457408A FR 1457408 A FR1457408 A FR 1457408A FR 25445 A FR25445 A FR 25445A FR 25445 A FR25445 A FR 25445A FR 1457408 A FR1457408 A FR 1457408A
Authority
FR
France
Prior art keywords
support
electronic components
testing electronic
testing
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR25445A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Application granted granted Critical
Publication of FR1457408A publication Critical patent/FR1457408A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/1023—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by abutting, e.g. flat pack
FR25445A 1964-07-21 1965-07-21 Support pour l'essai des composants électroniques Expired FR1457408A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US384081A US3319166A (en) 1964-07-21 1964-07-21 Fixture for securing and electrically testing an electronic component in flat package with coplanar leads

Publications (1)

Publication Number Publication Date
FR1457408A true FR1457408A (fr) 1966-01-24

Family

ID=23515961

Family Applications (1)

Application Number Title Priority Date Filing Date
FR25445A Expired FR1457408A (fr) 1964-07-21 1965-07-21 Support pour l'essai des composants électroniques

Country Status (5)

Country Link
US (1) US3319166A (fr)
JP (1) JPS4318222Y1 (fr)
DE (1) DE1254725B (fr)
FR (1) FR1457408A (fr)
GB (1) GB1073854A (fr)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3405361A (en) * 1964-01-08 1968-10-08 Signetics Corp Fluid actuable multi-point microprobe for semiconductors
US3381221A (en) * 1965-08-02 1968-04-30 Bendix Corp Test socket for transistors and the like
US3377514A (en) * 1965-10-22 1968-04-09 Elco Corp Microelectronic circuit carrier
US3445770A (en) * 1965-12-27 1969-05-20 Philco Ford Corp Microelectronic test probe with defect marker access
US3493858A (en) * 1966-01-14 1970-02-03 Ibm Inflatable probe apparatus for uniformly contacting and testing microcircuits
US3391382A (en) * 1966-03-10 1968-07-02 Gen Micro Electronics Inc Connector
US3575638A (en) * 1969-06-20 1971-04-20 Nasa Storage container for electronic devices
US3671813A (en) * 1970-12-10 1972-06-20 Texas Instruments Inc Panel board system and components thereof with connector and integrated circuit device
US3671919A (en) * 1971-02-09 1972-06-20 Burroughs Corp Protective clip and electronic assembly using the same
GB1411220A (en) * 1971-10-09 1975-10-22 Lucas Industries Ltd Method of securing electrical components to members
US3747046A (en) * 1971-10-22 1973-07-17 Us Navy Receptacle for large scale integrated circuit (l.s.i) package
GB1379262A (en) * 1971-11-01 1975-01-02 Cannon Electric Great Britain Electrical fusing arrangement for flat strip wiring
US3988648A (en) * 1975-07-18 1976-10-26 The United States Of America As Represented By The United States Research And Development Administration Protective carrier for microcircuit devices
JPS56612Y2 (fr) * 1975-08-01 1981-01-09
JPS56613Y2 (fr) * 1975-08-04 1981-01-09
US4329642A (en) * 1979-03-09 1982-05-11 Siliconix, Incorporated Carrier and test socket for leadless integrated circuit
JPS58191575U (ja) * 1982-06-16 1983-12-20 松下電子工業株式会社 半導体装置の検査治具
GB2130383B (en) * 1982-09-14 1986-06-04 Risho Kogyo Kk Test board for semiconductor packages
US4780670A (en) * 1985-03-04 1988-10-25 Xerox Corporation Active probe card for high resolution/low noise wafer level testing
US8037371B1 (en) 2007-05-14 2011-10-11 National Semiconductor Corporation Apparatus and method for testing high-speed serial transmitters and other devices
US7809517B1 (en) * 2007-09-07 2010-10-05 National Semiconductor Corporation Apparatus and method for measuring phase noise/jitter in devices under test

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2063110A (en) * 1934-09-07 1936-12-08 Chicago Flexible Shaft Co Electrical appliance and plug therefor
US2524939A (en) * 1948-09-09 1950-10-10 Philco Corp Integral socket and printed circuit panel
US2974275A (en) * 1952-03-05 1961-03-07 Thomas J Haviland Tube holder and contactor for electrical and vibration tests of sub-miniature radio tubes
US2858515A (en) * 1954-08-12 1958-10-28 Westinghouse Electric Corp Electrical connector with resilient gripping means
US2824291A (en) * 1955-05-16 1958-02-18 Mark L Mclean Adapter for electron discharge tube
NL255273A (fr) * 1955-07-15
US3011379A (en) * 1957-02-05 1961-12-05 Baldwin Piano Co Electronic musical instrument with photoelectric switching
US2952810A (en) * 1958-11-28 1960-09-13 James A Helton Test adapter for electronic equipment
US3191100A (en) * 1963-03-07 1965-06-22 Sorvillo Eugene Laminated electric circuit mounting boards
US3184699A (en) * 1963-04-02 1965-05-18 Philco Corp Mounting means for electrical components
US3192307A (en) * 1964-05-29 1965-06-29 Burndy Corp Connector for component and printed circuit board

Also Published As

Publication number Publication date
DE1254725B (de) 1967-11-23
GB1073854A (en) 1967-06-28
JPS4318222Y1 (fr) 1968-07-27
US3319166A (en) 1967-05-09

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