FR1106909A - Dispositif pour l'analyse de fluorescence à l'aide de rayons chi - Google Patents

Dispositif pour l'analyse de fluorescence à l'aide de rayons chi

Info

Publication number
FR1106909A
FR1106909A FR1106909DA FR1106909A FR 1106909 A FR1106909 A FR 1106909A FR 1106909D A FR1106909D A FR 1106909DA FR 1106909 A FR1106909 A FR 1106909A
Authority
FR
France
Prior art keywords
chi
rays
fluorescence analysis
fluorescence
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of FR1106909A publication Critical patent/FR1106909A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1106909D 1953-08-28 1954-08-26 Dispositif pour l'analyse de fluorescence à l'aide de rayons chi Expired FR1106909A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US377098A US2837655A (en) 1953-08-28 1953-08-28 X-ray fluorescent analysis apparatus

Publications (1)

Publication Number Publication Date
FR1106909A true FR1106909A (fr) 1955-12-27

Family

ID=23487761

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1106909D Expired FR1106909A (fr) 1953-08-28 1954-08-26 Dispositif pour l'analyse de fluorescence à l'aide de rayons chi

Country Status (4)

Country Link
US (1) US2837655A (fr)
DE (1) DE1023246B (fr)
FR (1) FR1106909A (fr)
GB (1) GB760448A (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3079499A (en) * 1959-06-19 1963-02-26 Hilger & Watts Ltd X-ray beam intensity responsive sequential spectrometer
US3102196A (en) * 1959-11-23 1963-08-27 Philips Corp X-ray spectrograph
US3110804A (en) * 1959-12-10 1963-11-12 Philips Corp X-ray spectrograph with movable detector constrained to rotate at a constant rate of change
NL247901A (fr) * 1960-01-29
NL121624C (fr) * 1960-02-25
NL252217A (fr) * 1960-06-01
US3260845A (en) * 1962-07-10 1966-07-12 Ti Group Services Ltd Method for the analysis of x-rays from an electron probe device
US3286098A (en) * 1963-02-28 1966-11-15 Mobil Oil Corp Methods and apparatus for determining factors related to sonic velocity in a gas
US3207894A (en) * 1963-10-02 1965-09-21 Standard Oil Co Regulated power supply for mass spectrometers
US3375369A (en) * 1965-07-13 1968-03-26 Atomic Energy Commission Usa Matrix corrected x-ray fluorometric analysis method
US3507987A (en) * 1966-03-04 1970-04-21 Francois J G Van Den Bosch High resolution ultra-violet microscope systems utilizing a video display
US3566111A (en) * 1967-06-19 1971-02-23 Siemens Ag Apparatus for varying the detector slit width in fully focusing x-ray spectrometers
US3688109A (en) * 1970-07-14 1972-08-29 Synvar Ass X-ray diffraction grating crystals
JPS4834587A (fr) * 1971-09-07 1973-05-19
JPS5121358B2 (fr) * 1971-09-10 1976-07-01
NL8201342A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met pulsschiftcorrectie.
US4959848A (en) * 1987-12-16 1990-09-25 Axic Inc. Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
EP1978354A1 (fr) 2007-04-05 2008-10-08 Panalytical B.V. Appareil de fluorescence par rayons X dispersive en longueur d'onde avec un détecteur dispersif en énergie sous forme d'un détecteur "silicon drift" pour améliorer la supression du fond

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL74667C (fr) * 1949-04-19
US2711483A (en) * 1950-02-24 1955-06-21 Texas Co Discriminator for proportional counters
US2619600A (en) * 1950-07-13 1952-11-25 Philips Lab Inc X-ray spectrometry
US2659011A (en) * 1951-05-23 1953-11-10 Well Surveys Inc Method and apparatus for compensation for the effects of temperature and voltage fluctuations on scintillation counters
US2683221A (en) * 1951-06-12 1954-07-06 Atomic Energy Commission Particle and gamma-ray energy spectrometer

Also Published As

Publication number Publication date
GB760448A (en) 1956-10-31
US2837655A (en) 1958-06-03
DE1023246B (de) 1958-01-23

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