NL247901A - - Google Patents

Info

Publication number
NL247901A
NL247901A NL247901DA NL247901A NL 247901 A NL247901 A NL 247901A NL 247901D A NL247901D A NL 247901DA NL 247901 A NL247901 A NL 247901A
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL247901A publication Critical patent/NL247901A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
NL247901D 1960-01-29 NL247901A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL247901 1960-01-29

Publications (1)

Publication Number Publication Date
NL247901A true NL247901A (fr)

Family

ID=19752145

Family Applications (1)

Application Number Title Priority Date Filing Date
NL247901D NL247901A (fr) 1960-01-29

Country Status (5)

Country Link
US (1) US3119013A (fr)
CH (1) CH396461A (fr)
DE (1) DE1268410B (fr)
GB (1) GB966717A (fr)
NL (1) NL247901A (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1814321B2 (de) * 1968-12-12 1971-04-29 Einrichtung fuer die kompensation einer beugungswinkelab haengigen amplitudenaenderung von in einem detektor fuer roentgenquanten erzeugten spannungsimpulsen
JPS4834587A (fr) * 1971-09-07 1973-05-19
JPS5121358B2 (fr) * 1971-09-10 1976-07-01
NL8201342A (nl) * 1982-03-31 1983-10-17 Philips Nv Roentgen analyse apparaat met pulsschiftcorrectie.
GB2295454B (en) * 1994-11-25 1997-01-08 Hitachi Ltd Energy dispersive x-ray analyzer
US5903004A (en) * 1994-11-25 1999-05-11 Hitachi, Ltd. Energy dispersive X-ray analyzer
RU2180439C2 (ru) 2000-02-11 2002-03-10 Кумахов Мурадин Абубекирович Способ получения изображения внутренней структуры объекта с использованием рентгеновского излучения и устройство для его осуществления
US20070230664A1 (en) * 2006-04-04 2007-10-04 Oxford Instruments Analytical Oy Collimator for x-ray spectrometry, and an x-ray spectrometric apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2837655A (en) * 1953-08-28 1958-06-03 Philips Corp X-ray fluorescent analysis apparatus

Also Published As

Publication number Publication date
DE1268410B (de) 1968-05-16
CH396461A (de) 1965-07-31
US3119013A (en) 1964-01-21
GB966717A (en) 1964-08-12

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