FR1040717A - Dispositifs semi-conducteurs à amplification élevée du courant - Google Patents

Dispositifs semi-conducteurs à amplification élevée du courant

Info

Publication number
FR1040717A
FR1040717A FR1040717DA FR1040717A FR 1040717 A FR1040717 A FR 1040717A FR 1040717D A FR1040717D A FR 1040717DA FR 1040717 A FR1040717 A FR 1040717A
Authority
FR
France
Prior art keywords
semiconductor devices
high current
current amplification
amplification semiconductor
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Radio Corporation of America
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp, Radio Corporation of America filed Critical RCA Corp
Application granted granted Critical
Publication of FR1040717A publication Critical patent/FR1040717A/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901Structure
    • H01L2924/1904Component type
    • H01L2924/19041Component type being a capacitor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)
FR1040717D 1950-04-21 1951-04-19 Dispositifs semi-conducteurs à amplification élevée du courant Expired FR1040717A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US301198XA 1950-04-21 1950-04-21

Publications (1)

Publication Number Publication Date
FR1040717A true FR1040717A (fr) 1953-10-19

Family

ID=21852611

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1040717D Expired FR1040717A (fr) 1950-04-21 1951-04-19 Dispositifs semi-conducteurs à amplification élevée du courant

Country Status (5)

Country Link
BE (1) BE502674A (enrdf_load_stackoverflow)
CH (1) CH301198A (enrdf_load_stackoverflow)
FR (1) FR1040717A (enrdf_load_stackoverflow)
GB (1) GB693726A (enrdf_load_stackoverflow)
NL (2) NL160604B (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL187425A (enrdf_load_stackoverflow) * 1953-05-14
US2913704A (en) * 1954-07-06 1959-11-17 Sylvania Electric Prod Multiple emitter matrices

Also Published As

Publication number Publication date
NL160604B (nl) 1900-01-01
BE502674A (enrdf_load_stackoverflow) 1900-01-01
CH301198A (de) 1954-08-31
NL89628C (enrdf_load_stackoverflow) 1900-01-01
GB693726A (en) 1953-07-08

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