FI982237A0 - Method for testing the reliability of integrated circuits - Google Patents

Method for testing the reliability of integrated circuits

Info

Publication number
FI982237A0
FI982237A0 FI982237A FI982237A FI982237A0 FI 982237 A0 FI982237 A0 FI 982237A0 FI 982237 A FI982237 A FI 982237A FI 982237 A FI982237 A FI 982237A FI 982237 A0 FI982237 A0 FI 982237A0
Authority
FI
Finland
Prior art keywords
reliability
testing
integrated circuits
circuits
integrated
Prior art date
Application number
FI982237A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI104290B1 (en
FI104290B (en
Inventor
Altti Perttula
Aulis Tuominen
Original Assignee
Nokia Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nokia Oyj filed Critical Nokia Oyj
Priority to FI982237A priority Critical patent/FI104290B/en
Publication of FI982237A0 publication Critical patent/FI982237A0/en
Application granted granted Critical
Publication of FI104290B1 publication Critical patent/FI104290B1/en
Publication of FI104290B publication Critical patent/FI104290B/en

Links

FI982237A 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits FI104290B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits
FI982237 1998-10-15

Publications (3)

Publication Number Publication Date
FI982237A0 true FI982237A0 (en) 1998-10-15
FI104290B1 FI104290B1 (en) 1999-12-15
FI104290B FI104290B (en) 1999-12-15

Family

ID=8552713

Family Applications (1)

Application Number Title Priority Date Filing Date
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits

Country Status (1)

Country Link
FI (1) FI104290B (en)

Also Published As

Publication number Publication date
FI104290B1 (en) 1999-12-15
FI104290B (en) 1999-12-15

Similar Documents

Publication Publication Date Title
DE69904320D1 (en) ON-CHIP CIRCUIT AND METHOD FOR CHECKING THE MEMORY CIRCUIT
DE69912328D1 (en) Socket for integrated circuits
DE69734379D1 (en) Device for testing integrated circuits
DE60004799D1 (en) DELAY-STABILIZING SYSTEM FOR AN INTEGRATED CIRCUIT
NO994610L (en) Processing instrument for test devices
ID27422A (en) METHOD OF DETERMINING THE RIGIDITY OF DRILL CIRCUITS
DE69940029D1 (en) SEMICONDUCTOR COMPONENT
DE19981380D2 (en) Ultrasonic test facility
KR960015836A (en) Integrated Circuit Tester
DE69519056T2 (en) Reliability test procedure for semiconductor groove arrangements
DE19980453T1 (en) Semiconductor device test device
DE69839906D1 (en) Manufacturing method for an integrated circuit
DE69319273T2 (en) Test procedure for integrated semiconductor circuit
DE69937280D1 (en) Tester for electronic components
DE69836625D1 (en) INSPECT THE FUNCTIONAL BLOCKS IN AN INTEGRATED SEMICONDUCTOR CIRCUIT
DE69800343T2 (en) Authentication method for integrated circuits
DE59905612D1 (en) Integrated circuit and method for testing it
DE69941322D1 (en) RELATED TEST PROCEDURE
DE69720725D1 (en) Improved output circuit for integrated circuits
FR2780792B1 (en) ELECTRONIC CHIP TESTING APPARATUS
DE59611168D1 (en) Noise-ray reducing connection configuration for an integrated circuit
DE69811469D1 (en) Procedure for evaluating the performance of VLSI circuits
DE69804161D1 (en) Component for semiconductor equipment
GB9825959D0 (en) Method of testing integrated circuits
SG92654A1 (en) Method and system for testing integrated circuit devices at the wafer level