FI104290B1 - Method for testing the reliability of integrated circuits - Google Patents

Method for testing the reliability of integrated circuits

Info

Publication number
FI104290B1
FI104290B1 FI982237A FI982237A FI104290B1 FI 104290 B1 FI104290 B1 FI 104290B1 FI 982237 A FI982237 A FI 982237A FI 982237 A FI982237 A FI 982237A FI 104290 B1 FI104290 B1 FI 104290B1
Authority
FI
Finland
Prior art keywords
circuit
voltage
tested
circuits
broken
Prior art date
Application number
FI982237A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI104290B (en
FI982237A0 (en
Inventor
Altti Perttula
Aulis Tuominen
Original Assignee
Nokia Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nokia Oyj filed Critical Nokia Oyj
Priority to FI982237A priority Critical patent/FI104290B/en
Publication of FI982237A0 publication Critical patent/FI982237A0/en
Application granted granted Critical
Publication of FI104290B1 publication Critical patent/FI104290B1/en
Publication of FI104290B publication Critical patent/FI104290B/en

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention concerns a method for testing the reliability of integrated circuits, where the connections 1 in each circuit C1-C4 which is to be tested are connected together in the required way in order to achieve a suitable resistance in the circuit for the purposes of the test and where the circuits which are to be tested are connected in series with a power source 3 for simultaneous feeding of a test current I through all the circuits which are to be tested, in which the measurement is carried out as voltage measurement 4 across each circuit. A different number of on-state voltage-connected diodes D in relation to the test current are connected across each circuit C1-C4 which is to be tested. When the voltage across a circuit changes on account of circuit connections being broken or due to some other fault, in which the power interruption or increase in the internal resistance caused by the broken circuit causes the diodes connected across this to be changed into a conductive state, the threshold voltages of the diodes form a characteristic voltage for the broken circuit which makes possible identification of the broken circuit by measurement of the voltage across all the circuits. <IMAGE>
FI982237A 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits FI104290B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits
FI982237 1998-10-15

Publications (3)

Publication Number Publication Date
FI982237A0 FI982237A0 (en) 1998-10-15
FI104290B1 true FI104290B1 (en) 1999-12-15
FI104290B FI104290B (en) 1999-12-15

Family

ID=8552713

Family Applications (1)

Application Number Title Priority Date Filing Date
FI982237A FI104290B (en) 1998-10-15 1998-10-15 Method for testing the reliability of integrated circuits

Country Status (1)

Country Link
FI (1) FI104290B (en)

Also Published As

Publication number Publication date
FI104290B (en) 1999-12-15
FI982237A0 (en) 1998-10-15

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